• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 1993년도 추계학술대회 논문집
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• pp.267-272
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• 1993

This paper presents the performance and problems in analysis method and testing system of Electronic Speckle Pattern Interferometry (ESPI) method, in measuring two-dimensional in-plane displacement. The anyalysis result of measurement by ESPI is quite comparable to that of measurement by strain gauge method. This implieds that the method of ESPI is a very effective tool in non-contact two-dimensional in-planc strain analysis. But there is a controversal point,measurment error. This error is discussed to be affected not by ESPI method itseif, but by its analysis scheme of the interference fringe,where the first-order interpolation has been applied to the points of strain measured. In this case, it is turned out that the more errors would be occured in the large interval of fringe. so, this paper describes a computer method for drawing when the height is available only for some arbitary collection of points, the method is based on a distance-weighted, least-squares approximation technique, with the weight varying with the distance of the data points.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 1996년도 추계학술대회 논문집
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• pp.377-383
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• 1996

Recently, a new technique called Electronic Speckle Pattern Inteferometry(ESPI) has been developed to overcome the drawbacks of existing holography. This technique enable real-time interference fringes to be displayed directly on TV monitor without recourse to any form of photographic processing. This research was carried out for the purpose of applying the vibration analysis method employing Electronic Speckle Pattern Interference technique to the vibration analysis of uniform rectangular cantilever plate, The natural vibration frequencies found by ESPI were in fair agreement with theoretical eigen frequencies acquired using theoretical formula G. B. Warburton proposed.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2003년도 추계학술대회
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• pp.1442-1447
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• 2003

Computer is a very powerful machine which is widely using for data processing, DB construction, peripheral device control, image processing etc. Consequently, many researches and developments have progressed for high performance processing unit, and other devices. Especially, the core units such as semiconductor parts are rapidly growing so that high-integration, high-performance, microminiat turization is possible. The packaging in the semiconductor industry is very important technique to de determine the performance of the system that the semiconductor is used. In this paper, the inspection of the inner defects such as delamination, void, crack, etc. in the semiconductor packages is studied. ESPI which is a non-contact, non-destructive, and full-field inspection method is used for the inner defect inspection and its results are compared with that of C-Scan method.

• 대한기계학회:학술대회논문집
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• 대한기계학회 2004년도 추계학술대회
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• pp.772-776
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• 2004

The paper describes the quantitative determination of out-of-plane displacement from result of Shearogrpahy, which can measure the first-order partial derivative of out-of-plane displacement directly. However, the differential sensitivity of Shearography is related to the amount of shearing, which is manually adjustable in optical interferometer and affects the quantitative determination. The relationship between those is inspected by comparing ESPI with Shearography. From the result, the amount of shearing plays a modulation factor of out-of-plane displacement and small amount of shearing gives good agreement with out-of-plane displacement.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2011년도 춘계학술대회 논문집
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• pp.1095-1096
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• 2011

• 한국신뢰성학회:학술대회논문집
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• 한국신뢰성학회 2002년도 정기학술대회
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• pp.245-251
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• 2002

Electronic Speckle Pattern Interferometry(ESPI) is one of optical technique to measure displacement precisely, uses CCD camera to show result image in real time. General ESPI system measures in-plane or out-of-plane displacement. Shearography is one of electronic speckle pattern interferometric methods which allow full-field observation of surface displacement derivatives and it is robust in vibration. The shearography provides non-contacting technique of evaluating defects nondestructively In this study, the shearography was used to evaluate defects in Carbon Fiber Reinforced Plastic(CFRP). Various sizes of artificial defects were embedded in various depths of woven CFRP plate. Effects due to the variation of size and depth of defects were evaluated in this study.

• 한국복합재료학회:학술대회논문집
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• 한국복합재료학회 2001년도 춘계학술발표대회 논문집
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• pp.211-214
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• 2001

Electronic Speckle Pattern Interferometry(ESPI) is one of optical technique to measure displacement precisely, uses CCD camera to show result image in real time. General ESPI system measures in-plane or out-of-plane displacement. Shearography is one of electronic speckle pattern interferometric methods which allow full-field observation of surface displacement derivatives and it is robust in vibration. The shearography provides non-contacting technique of evaluating defects nondestructively. In this study, the shearography was used to evaluate defects in Carbon Fiber Reinforced Plastic(CFRP). Various sizes of artificial defects were embedded in various depths of woven CFRP plate. Effects due to the variation of size and depth of defects were evaluated in this study.

• 한국정밀공학회지
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• 제18권7호
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• pp.149-154
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• 2001

This study discusses a non-contact optical technique, electronic speckle pattern interferometry(ESPI), that is well suited for a deformation measurement of structure. Phase shifting method and unwrapping method have used to make deformation quantitative widely. In this paper, a previous numerical formula for phase shifting method is reconstructed in addition to least square fitting method to improve sensitivity and phase unwrapping based on vertical-horizontal scanning method is applied to analyze in-plane and out-of-plane deformation quantitatively.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2005년도 추계학술대회 논문집
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• pp.926-929
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• 2005

Recently, laser interferometer is widely used as a measuring system in many fields because of its high resolution and its ability to measure a board area in real-time ail at once. In conventional laser interferometer, for examples Out of plane ESPI, In plane ESPI, Shearography and Holography, it uses PZT or other components as a phase shift instrumentation to extract 3-D deformation data, vibration mode and others. However, in most cases PZT has some disadvantages, which include noli-linear errors and limited time of use. In present study, a new type of laser interferometer using a laser diode(LD) is proposed. Using Laser Diode Sinusoidal Phase Modulating(LD-SPM) interferometer, the phase modulation can be directly modulated by controlling the LD injection current thereby eliminating the need for PZT components.

• Interaction and multiscale mechanics
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• 제1권2호
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• pp.177-190
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• 2008

In this paper, both experimental measurement and theoretical analysis are used to investigate the out-of-plane resonant characteristics of a cantilevered piezoceramic plate in air and three different kinds of fluid. The experimental method, amplitude-fluctuation electronic speckle pattern interferometry (AF-ESPI), is the major technique used in this study to measure the resonant characteristics of the cantilivered piezoceramic plate. Both resonant frequencies and full-field mode shapes are obtained from this experimental technique. Numerical computations based on the finite element analysis are presented for comparison with the experimental results. Good quality of mode shapes for the cantilevered piezoceramic plate in air is obtained from the AF-ESPI technique. However, the quality decreases as the viscosity of fluids increases. From the results provided from experimental measurements and numerical computations, it is indicated that the resonant frequencies of the cantilevered piezoceramic plate in fluid decrease with the increase of the viscosity of fluids. Good agreements between the experimental measured data and the numerical calculated results are found for both resonant frequencies and mode shapes of the cantilevered piezoceramic plate in fluid.