• Proceedings of the Korean Vacuum Society Conference
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• 2011.08a
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• pp.125-125
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• 2011

In this study, we investigated the electrical, optical, structural, and surface properties of indium zinc oxide (IZO)/Ag/IZO multilayer electrode grown by specially designed roll-to-roll sputtering system using the flexible substrate. By the continuous roll-to-roll sputtering of the bottom IZO, Ag, and top IZO layers at room temperature, they were able to fabricate a high quality IZO/Ag/IZO multilayer electrode. At optimized conditions, the bottom IZO layer (40 nm) was deposited on a flexible substrate. After deposition of the Bottom IZO layer, Ag layer was deposited onto the bottom IZO film as a function of DC power (200~500 W). Subsequently, the top IZO layer was deposited onto the Ag layer at identical deposition conditions to the bottom IZO layer (40 nm). We investigated the characteristics of IZO/Ag/IZO multilayer electrode as a function of Ag thickness. It was found that the electrical and optical properties of IZO/Ag/IZO multilayer electrode was mainly affected thickness of the Ag layer at optimized condition. In case of IZO/Ag/IZO multilayer electrode with the Ag power (350W), it exhibited a low sheet resistance of 7.1 ohm/square and a high transparency of 86.4%. Furthermore, we fabricated the touch screen panel using the IZO/Ag/IZO multilayer electrode, which demonstrate the possibility of the IZO/Ag/IZO multilayer electrode grown by roll-to-roll sputtering system as a transparent conducting layer in the touch screen panel.

• Journal of the Korean Society for Precision Engineering
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• v.14 no.11
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• pp.118-125
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• 1997

Non-contacting optical microscopes are increasingly used in recent industrial applications of probes for coordinate measuring machines. They have been found more efficient than conventional touch trigger porbes with ball tips especially in inspecting small-sized objects. There are two major factors affecting measuring accuracy: (1) geometric relations between coordinate systems, (2) magnification ratios of a microscope. In order to determine the magnification ratios exactly, optical imaging of edge was theroretically analyzed and practically adopted to image processing for edge detection. In addition, this paper proposes a geometric calibration method to obtain exact coordinates of measured points from the relations between the machine coordinate system and the image. In the method, the error according to the squareness between the machine axises was also removed. The method was practically adopted to a real coordinate measuring machine. An ultraprecision measurement of 0.2 um uncertainty can be practically achieved.

• Polymer Science and Technology
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• v.26 no.4
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• pp.313-322
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• 2015

• Journal of the Optical Society of Korea
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• v.19 no.5
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• pp.508-513
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• 2015

A capacitive-type touch screen panel (TSP) composed of silver nanowire (AgNW) crossing electrodes and transparent bridge structures was fabricated on a polycarbonate film. The transparent bridge structure was formed with a stack of Al-doped ZnO (AZO) electrodes and SU-8 insulator. The stable and robust continuity of the bridge electrode over the bridge insulator was achieved by making the side-wall slope of the bridge insulator low and depositing the conformal AZO film with atomic layer deposition. With an extended exposure time of photolithography, the lower part of the SU-8 layer around the region uncovered by the photomask can be exposed enough to the UV light scattered from the substrate. This leads to the low side-wall slope of the bridge insulator. The fabricated TSP sample showed a large capacitance change of 22.71% between with and without touching. Our work supplies the technological clue for ensuring long-term reliability to the highly flexible and transparent TSP made by using conventional fabrication processes.

• IEIE Transactions on Smart Processing and Computing
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• v.3 no.4
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• pp.226-233
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• 2014

This paper presents an external light evasion method that rectifies the problem of misrecognition due to external lighting. The fundamental concept underlying the proposed method involves recognition of the differences between two images and elimination of the desynchronized external light by synchronizing the image sensor and inner light source of the optical touch screen. A range of artificial indoor light sources and natural sunlight are assessed. The proposed system synchronizes with a Vertical Synchronization (VSYNC) signal and the light source drive signal of the image sensor. Therefore, it can display synchronized light of the acquired image through the image sensor and remove external light that is not from the light source. A subtraction operation is used to find the differences and the absolute value of the result is utilized; hence, the order is irrelevant. The resulting image, which displays only a touched blob on the touchscreen, was created after image processing for coordination recognition and was then supplied to a coordination extraction algorithm.

• Current Optics and Photonics
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• v.1 no.1
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• pp.45-50
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• 2017

Optical instruments based on polymer-dispersed liquid crystal (PDLC) have been used to inspect transparent electrodes. Generally the operating voltage of an inspection instrument using PDLC is very high, over 300 V, reducing its lifetime and reliability. The operating-voltage issue becomes more serious in the inspection of touch-screen panel (TSP) electrodes, due to the bezel structure protruding over the electrodes. We have theoretically calculated the parameters affecting the operating voltage as a function of the distance between the TSP and the PDLC, the thickness, and the dielectric constant of the sublayers when the inspection module was away from the TSP electrodes. We have experimentally verified the results, and have proposed a way to reduce the operating voltage by substituting a plastic substrate film with a hard coating layer of smaller thickness and higher dielectric constant.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.36 no.2
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• pp.195-201
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• 2012

According to many customers' requests, optical measurement module (OMM) applications using automatic measuring devices to measure the machined part rapidly on a machine tool have increased steeply. Touch trigger probes are being used for job setup and feature inspection as automatic measuring devices, and this makes quality checking and machining compensation possible. Therefore, in this study, the use of touch trigger probes for accurate measurement of the machined part has been studied and a macro program for a hole measuring cycle has been developed. This hole is the most common feature to be measured, but conventional methods are still not free from measuring error. In addition, the eccentricity change of the least square circle was simulated according to the roundness error in a hole measurement. To evaluate the reliability of this study, the developed hole-measuring program was executed to measure the hole plate on the machine and verify the roundness error in the eccentricity simulation result.

• Journal of the Korean institute of surface engineering
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• v.42 no.1
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• pp.21-25
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• 2009

Using an evaporation system, $SiO_2$ was deposited as a buffer layer between a PET substrate and a ITO layer and then ITO/$SiO_2$/PET layers were annealed for 1.5 hours at the temperature of $180^{\circ}C$. Adhesion and electro-optical properties of ITO films were studied with thickness variance of a $SiO_2$ buffer layer. As a result of introduction of the $SiO_2$ buffer layer, sheet resistance and resistivity increased and a ITO film with optimum sheet resistance ($529.3{\Omega}/square$) for an upper ITO film of resistive type touch panel could be obtained when $SiO_2$ of $50{\AA}$ was deposited. And it was found that ITO films with $SiO_2$ buffer layer have higher transmittance of $88{\sim}90%$ at 550 nm wavelength than ITO films with no buffer layers and the transmittance was enhanced as $SiO_2$ thickness increased from $50{\AA}$ to $100{\AA}$. Adhesion property of ITO films with $SiO_2$ buffer layers became better than ITO films with no buffer layers and this property was independent of $SiO_2$ thickness variance ($50{\sim}100{\AA}$). By depositing a $SiO_2$ buffer layer of $50{\AA}$ on the PET substrate and sputtering a ITO thin film on the layer, a ITO film with enhanced adhesion, electro-optical properties could be obtained.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2004.10a
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• pp.201-206
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• 2004

Laser scanner are getting used for inspection and reverse engineering in industry such as motors, electronic products, dies and molds. However, due to the lack of efficient scanning technique, the tasks become limited to the low accuracy purpose. The main reasons for this limitation for usefulness are caused from the optical drawback, such as irregular reflection, scanning direction normal to measuring surface, the influence of surface integrity, and other optical disturbances. To overcome these drawback of laser scanner, this study propose the mechanism to reduce the optical trouble by using the 2 kinds of rotational movement axis and by composing the spherical coordinate to scanning the surface keeping normal direction consistently. So, it could be designed and interfaced the measuring device to realize that mechanism, and then it could acquisite the accurate 3D form cloud data. Also, these data are compared with the standard master ball and the data acquisited from the touch point sensor, to evaluate the accuracy and stability of measurement and to demonstrate the implementation of an dental tooth purpose system

• The Journal of the Korea institute of electronic communication sciences
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• v.17 no.6
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• pp.1069-1074
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• 2022

In this study, we prepared ITO thin films on the Nb₂O₅/SiO₂ double buffer layer and investigated electrical and optical properties according to the change of SiO₂ buffer layer thickness (40~50nm). The ITO thin film fabricated on the Nb₂O₅/SiO₂ double buffer layer exhibited a broad surface roughness with a small value ranging of 0.815 to 1.181nm, and the sheet resistance was 99.3 to 134.0Ω/sq. It seems that there is no problem in applying the ITO thin film to a capacitive touch screen panel. In particular, the average transmittance in the short-wavelength (400~500nm) region and the chromaticity (b^*) of the ITO thin film deposited on the Nb₂O₅(10nm)/SiO₂(40nm) double buffer layer showed significantly improved results as 83.58% and 0.05, respectively, compared to 74.46% and 4.28 of ITO thin film without double buffer layer. As a result, it was confirmed that optical properties such as transmittance in the short-wavelength region and chromaticity were remarkably improved due to the index matching effect in the ITO thin film with the Nb₂O₅/SiO₂ double buffer layer.