• Tribology and Lubricants
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• v.16 no.5
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• pp.317-323
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• 2000

The film thickness and shape of elastohydrodynamic lubrication is measured by optical interferometer, which is the most precise method for EHL film measurement. However, the interpretation of the image pattern from optical viscometer is not simple for two-dimensional shape. A newly developed method of image processing makes it possible to evaluate the film thickness and shape in every point of contact region with two dimensional aspects. In this study, we captured the film shape of EHL film by the monochromatic incident light and analyzed the film thickness with the image processing method, which uses phase shift method. From the values of intensity in fringes, the qualitative feature of film thickness in the contact area are obtained by using Zernike polynomial

• Current Photovoltaic Research
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• v.10 no.1
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• pp.28-32
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• 2022

We investigated the optical and electrical characteristics of ITO/Ag/ITO (IAI) 3-layer thin films prepared by using RF/DC sputtering. To measure the thickness of all thin film samples, we used scanning electron microscopy. As a function of Ag thickness we characterized the optical transmittance and sheet resistance of the IAI samples by using UV-Visible spectroscopy and Hall measurement system, respectively. While the thickness of both ITO thin films in the 3-layered IAI samples were fixed at 50 nm, we varied Ag layer thickness in the range of 0 nm to 11 nm. The optical transmittance and sheet resistance of the 3-layered IAI thin films were found to vary strongly with the thickness of Ag film in the ITO (50 nm)/Ag(t₀)/ITO (50 nm) thin film. For the best transparent conducting oxide (TCO) electrode, we obtained a 3-layered ITO (50 nm)/Ag (t₀ = 8.5 nm)/ITO (50 nm) that showed an avrage optical transmittance, AVT = 90.12% in the visible light region of 380 nm to 780 nm and the sheet resistance, R_□ = 7.24 Ω/□.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2009.06a
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• pp.249-250
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• 2009

• Transactions of the Korean Society of Mechanical Engineers B
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• v.27 no.1
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• pp.135-140
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• 2003

The convergence of finite volume method (FVM) or discrete ordinate method (DOM) is known to degrade for optical thickness greater than unity and large scattering albedo. The present article presents a convergence acceleration procedure for the FVM based on a full approximation storage (FAS) multigrid method. Among a variety of multigrid cycles, the V-cycle is used and the full multigrid algorithm (FMG) is applied to an analysis of radiation in irregular two-dimensional geometry. Solution convergence is discussed for the several cases of various optical thickness and scattering albedo. At small scattering albedo and optical thickness, there is no advantage to using the multigrid method for calculation CPU time. For large scattering albedo greater than 0.5 and optical thickness greater than unity, however, the multigrid method improves the convergence and the solution is rapidly obtained.

• Journal of the Korean Institute of Telematics and Electronics
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• v.25 no.1
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• pp.88-93
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• 1988

For coherent optical information processing the thickness uniformity of the spatial light modulators(SLMs)is highly demanded. The liquid crystal display(LCD), which is commercialized as a pocket-sized television, is considered as one of the most cheap 2-dimensional SLM. But usually it has lack of thickness uniformity. Thus phase correction to compensate the thickness nonuniformity must be preceded before it is used as an SLM. In this paper relatively easy phase compensation method applicable to binary SLMs is discussed and experimentally verified by using the optical joint transformantion concept.

• 한국전산유체공학회:학술대회논문집
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• 2011.05a
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• pp.96-99
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• 2011

Fiber coatings are essential in optical fiber manufacturing, since they provide the protective layers from the surface damages and the adequate fiber strength. Flow and temperature fields of coating liquid in a fiber coating applicator are numerically investigated by using a commercial CFD software. The main focus of this computational study is on the thermal effects by viscous dissipation and the effects of coating supply temperature on the final fiber coating thickness. The numerical results reveal that the thermal effects play a major role in the high-speed optical fiber coating process and give substantial influences on the determination of coating thickness. Changing the supply temperature of coating liquid is found to relieve the radial variation of coating liquid viscosity in the coating die and it can be an effective way to control the fiber coating thickness.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.440-440
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• 2012

The optical characteristics of transparent electrode with various kind of materials and thickness to be used for organic photovoltaic cells were studied by simulation methodology. It demonstrated that the transmittance varies with the kinds of materials, the number of layers and change in the thickness of each layer. In the case of the structure composed of dielectric/Ag/dielectric, optimized transmittance was higher than 90% at 550 nm and the thickness of the Ag layer was ~10nm. Top and bottom dielectric materials can be changed with different refractive index and extinction coefficient. The relation between the optical transmittance of device and transparent electrode with different refractive indices was discussed as well. By processing numerical simulations, an optimized optical transmittance can be obtained by tunning the thickness and materials of transparent electrode.

• Journal of the Optical Society of Korea
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• v.13 no.3
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• pp.304-309
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• 2009

We tested the feasibility of measuring fat thickness using a miniaturized chip LED sensor module, testing 12 healthy female subjects. The module consisted of a single detector and four sources at four different source-detector distances (SD). A segmental curve-fitting procedure was applied, using an empirical algorithm obtained by Monte-Carlo simulation, and fat thicknesses were estimated. These thicknesses were compared to computed-tomography (CT) results; the correlation coefficient between CT and optical measurements was 0.932 for bicep sites. The mean percentage error between the two measurements was 13.12%. We conclude that fat thickness can be efficiently measured using the simple sensor module.

• Proceedings of the Korean Vacuum Society Conference
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• 2016.02a
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• pp.196.1-196.1
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• 2016

TCO(Transparent Conducting Oxide) on flat glass is used in thin-film photovoltaic cell, flat-panel display. Nowadays, Corning(R) Willow Glass(R), known as flexible substrate, has attracted much attention due to its many advantages such as reliable roll-to-roll glass processing, high-quality flexible electronic devices, high temperature process. Also, it can be an alternative to flexible polymer substrates which have their poor stability and degradation of electrical and optical qualities. For application on willow glass, the flexibility, electrical, optical properties can be greatly influenced by the TCO thin film thickness due to the inherent characterization of thin film in nanoscale. It can be expected that while thick TCO layer causes poor transparency, its sheet resistance become low. Also, rarely reports were focusing on the influence of flexible properties by varying TCO thickness on flexible glass. Therefore, it is very important to optimize TCO thickness on flexible Willow glass. In this study, Ti-ZnO thin films, with different thickness varied from 0 nm to 50 nm, were deposited on the flexible willow glass by atomic layer deposition (ALD). The flexible, electrical and optical properties were investigated, respectively. Also, these properties of Ti-doped ZnO thin films were compared with un-doped ZnO thin film. Based on the results, when Ti-ZnO thin films thickness increased, resistivity decreased and then saturated; transmittance decreased. The Figure of Merit (FoM) and flexibility was the highest when Ti-ZnO thickness was 40nm. The flexible, electrical and optical properties of Ti-ZnO thin films were better than ZnO thin film at the same thickness.

• Journal of the Microelectronics and Packaging Society
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• v.21 no.2
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• pp.31-35
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• 2014

The thickness dependent electrical, structural, and optical properties of ZnO films grown by atomic layer deposition (ALD) at various growth temperatures were investigated. In order to deposit ZnO films, diethylzinc and deionized water were used as metal precursor and reactant, respectively. ALD process window was found at the growth temperature range from $150^{\circ}C$ to $250^{\circ}C$ with a growth rate of about $1.7{\AA}/cycle$. The electrical properties were studied by using van der Pauw method with Hall effect measurement. The structural and optical properties of ZnO films were analyzed by using X-ray diffraction, field emission scanning electron microscopy, and UV-visible spectrometry as a function of thickness values of ZnO films, which were selected by the lowest electrical resistivity. Finally, the figure of merit of ZnO films could be estimated as a function of the film thickness. As a result, this investigation of thickness dependent electrical, structural, and optical properties of ZnO films can provide proper information when applying to optoelectronic devices, such as organic light-emitting diodes and solar cells.