• Title/Summary/Keyword: Optical surface scanning

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Surface roughness model of end-milling surface (엔드밀 가공면의 표면거칠기 모델)

  • Chin, Do-Hun;Kim, Jong-Do;Yoon, Moon-Chul
    • Journal of the Korean Society of Manufacturing Process Engineers
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    • v.12 no.2
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    • pp.68-74
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    • 2013
  • In this paper, an average surface roughness, $R_a$, was measured by optical measurement and its mathematical model according to spindle speed and feedrate was obtained by least square method. Also, its result is compared and investigated with real measured average surface roughness. The optical measurement of surface roughness is performed by CLSM(confocal laser scanning microscope) and the captured HEI(height encoded image) data is used as an original data for the generation of average surface roughness and its mathematical plane or contour surface of surface roughness. Using this polynomial model with two independent variables, the behavior of an average surface roughness is investigated and analyzed with an experimental modeling of least square algorithm. And it can be used for the prediction of $R_a$ in different condition of machining.

Investigation of surface texturing to reduce optical losses for multicrystalline silicon solar cells (다결정 실리콘 태양전지의 광학적 손실 감소를 위한 표면 텍스쳐링에 관한 연구)

  • Kim, Ji-Sun;Kim, Bum-Ho;Lee, Soo-Hong
    • 한국신재생에너지학회:학술대회논문집
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    • 2007.11a
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    • pp.264-267
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    • 2007
  • It is important to reduce optical losses from front surface reflection to improve the efficiency of crystalline silicon solar cells. Surface texturing by isotropic etching with acid solution based on HF and $HNO_3$ is one of the promising methods that can reduce surface reflectance. Anisotropic texturing with alkali solution is not suitable for multicrystalline silicon wafers because of its various grain orientations. In this paper, we textured multicrystalline silicon wafers by simple wet chemical etching using acid solution to reduce front surface reflectance. After that, surface morphology of textured wafer was observed by Scanning Electron Microscope(SEM) and Atomic Force Microscope(AFM), surface reflectance was measured in wavelength from 400nm to 1000nm. We obtained 29.29% surface reflectance by isotropic texturing with acid solution in wavelength from 400nm to 1000nm for fabrication of multicrystalline silicon solar cells.

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Development of Multi-Laser Vision System For 3D Surface Scanning (3 차원 곡면 데이터 획득을 위한 멀티 레이져 비젼 시스템 개발)

  • Lee, J.H.;Kwon, K.Y.;Lee, H.C.;Doe, Y.C.;Choi, D.J.;Park, J.H.;Kim, D.K.;Park, Y.J.
    • Proceedings of the KSME Conference
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    • 2008.11a
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    • pp.768-772
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    • 2008
  • Various scanning systems have been studied in many industrial areas to acquire a range data or to reconstruct an explicit 3D model. Currently optical technology has been used widely by virtue of noncontactness and high-accuracy. In this paper, we describe a 3D laser scanning system developped to reconstruct the 3D surface of a large-scale object such as a curved-plate of ship-hull. Our scanning system comprises of 4ch-parallel laser vision modules using a triangulation technique. For multi laser vision, calibration method based on least square technique is applied. In global scanning, an effective method without solving difficulty of matching problem among the scanning results of each camera is presented. Also minimal image processing algorithm and robot-based calibration technique are applied. A prototype had been implemented for testing.

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Implementation of scanning capacitance decimicron microscope (정전용량 주사형 데시미크론 현미경의 구현)

  • 권영도;이주신
    • Journal of the Korean Institute of Telematics and Electronics S
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    • v.35S no.3
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    • pp.120-130
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    • 1998
  • In this study, we implemented a scanning capacitance decimicron micorscope(SCdM) which scans a surface of the object mechanically in two or two point five dimensions with a stylus of size 0.2.mu.m. X-Y stage and stylus driving method are used as the scanning method, and VHD disk plate and IC chip are used as the object. Experimenal resutl of these object show that SCdM obtain 0.1.mu.m resolution power which exceeds that of optical microscope, and this microscope will be used as a powerful tool for inspecting ULSI pattern or biological data as a decimicron mcirocope which zoom a function of optical microscope and guide STM. The experimental system is composed of a VHD video disk method which captures the capacitance changes of the video disk suface and converts it into video signal.

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Analysis of Surface Morphology and Optical Transmission Features in LB Films by SNOAM (SNOAM에 의한 LB막의 표면모폴로지 및 광투과상 해석)

  • Lee, Seung-Jun;Jung, Sang-Burm;Yoo, Seung-Yeop;Sin, Hun-Gyu;Park, Jae-Chul;Kwon, Young-Soo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.04b
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    • pp.108-111
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    • 2000
  • We will illustrate the topographical structure and optical structure of the merocyanine dye LB films obtained by the scanning near-field optical/atomic force microscopy (SNOAM). SNOAM was recognized as a powerful tool to modify the surface as well as to characterize the topography of the surface at atomic resolution, especially for optical reaction materials. SNOAM images showed that the topographical and optical structures of these films were not only depended on the chemical property but also physical property. In the continuous measurement on these dyes, the appearance of near-field optical transmission images showed a certain dependence on the kinds of dyes and the mutual mixing ratios of dyes. These experimental results suggest that there is a certain kind of interaction between these two dyes.

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Characterization of $ZrO_2$ thin films fabricated by glancing angle deposition

  • Sobahan, K.M.A;Park, Yong-Jun;HwangBo, Chang-Kwon
    • Proceedings of the Optical Society of Korea Conference
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    • 2008.02a
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    • pp.281-282
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    • 2008
  • The glancing angle deposition (GLAD) technique was used to fabricate $ZrO_2$ thin films by electron-beam evaporation. The crystal structure, cross-sectional structure, surface morphology and optical properties are characterized by X-ray diffraction meter (XRD, Rigaku, Cu $K{\alpha}$ - radiation), scanning electron microscope (SEM), and spectrophotometer, respectively.

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Development of F-theta lens for Laser Scanning Unit (LSU) (레이저 주사광학계용 F-Theta Lens 개발)

  • Kim, Byeong-Gun;Lee, Gyeong-Sub;Jeong, Shang-Hwa;Kim, Sang-Suk;Kim, Hye-Jeong;Kim, Jeong-Ho
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2005.07a
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    • pp.459-460
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    • 2005
  • The global consumption of aspheric surfaces will expand rapidly on the Electronics and Optical Components, Information and Communications, Aerospace and Defense, and Medical optics markets etc. We must research on market, technology forecast and analysis of aspheric surfaces that is a principle step of ultra precision machine technology with a base one of optical elements. Especially, F-theta lens is one of the important parts in LSU(Laser scanning unit) because it affects on the optical performance of LSU dominantly. The core is most of important to produce plastic F-theta lens by plastic injection molding method, which is necessary to get the ultra-precision aspheric and non-axisymmetric machine processing technology.

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Comb-spacing-swept Source Using Differential Polarization Delay Line for Interferometric 3-dimensional Imaging

  • Park, Sang Min;Park, So Young;Kim, Chang-Seok
    • Current Optics and Photonics
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    • v.3 no.1
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    • pp.16-21
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    • 2019
  • We present a broad-bandwidth comb-spacing-swept source (CSWS) based on a differential polarization delay line (DPDL) for interferometric three-dimensional (3D) imaging. The comb spacing of the CSWS is repeatedly swept by the tunable DPDL in the multiwavelength source to provide depth-scanning optical coherence tomography (OCT). As the polarization differential delay of the DPDL is tuned from 5 to 15 ps, the comb spacing along the wavelength continuously varies from 1.6 to 0.53 nm, respectively. The wavelength range of various semiconductor optical amplifiers and the cavity feedback ratio of the tunable fiber coupler are experimentally selected to obtain optimal conditions for a broader 3-dB bandwidth of the multiwavelength spectrum and thus provide a higher axial resolution of $35{\mu}m$ in interferometric OCT imaging. The proposed CSWS-OCT has a simple imaging interferometer configuration without reference-path scanning and a simple imaging process without the complex Fourier transform. 3D surface images of a via-hole structure on a printed circuit board and the top surface of a coin were acquired.

One-step microwave synthesis of surface functionalized carbon fiber fabric by ZnO nanostructures

  • Ravi S. Rai;Vivek Bajpai
    • Advances in nano research
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    • v.14 no.6
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    • pp.557-573
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    • 2023
  • The rapid growth of zinc-oxide (ZnO) nanostructures (NSs) on woven carbon fiber (WCF) is reported in this study employing a microwave-aided chemical bath deposition process. The effects of different process parameters such as molar concentration, microwave duration and microwave power on morphologies and growth rate of the ZnO on WCF were studied. Furthermore, an attempt has been taken to study influence of different type of growth solutions on ZnO morphologies and growth rates. The surface functionalization of WCF fabrics is achieved by successful growth of crystalline ZnO on fiber surface in a very short duration through one-step microwave synthesis. The morphological, structural and compositional studies of ZnO-modified WCF are evaluated using field-emission scanning electron microscopy, X-ray diffraction and energy dispersive X-ray spectroscopy respectively. Good amount of zinc and oxygen has been seen in the surface of WCF. The presence of the wurtzite phase of ZnO having crystallite size 30-40 nm calculated using the Debye Scherrer method enhances the surface characteristics of WCF fabrics. The UV-VIS spectroscopy is used to investigate optical properties of ZnO-modified WCF samples by absorbance, transmittance and reflectance spectra. The variation of different parameters such as dielectric constants, optical conductivity, refractive index and extinction coefficient are examined that revealed the enhancement of optical characteristics of carbon fiber for wide applications in optoelectronic devices, carbon fiber composites and photonics.

Investigation on HT-AlN Nucleation Layers and AlGaN Epifilms Inserting LT-AlN Nucleation Layer on C-Plane Sapphire Substrate

  • Wang, Dang-Hui;Xu, Tian-Han
    • Journal of the Optical Society of Korea
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    • v.20 no.1
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    • pp.125-129
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    • 2016
  • In this study, we have investigated a high-temperature AlN nucleation layer and AlGaN epilayers on c-plane sapphire substrate by low-pressure metal-organic chemical vapor deposition (LP-MOCVD). High resolution X-ray diffraction (HRXRD), atomic force microscopy (AFM), scanning electron microscope (SEM) and Raman scattering measurements have been exploited to study the crystal quality, surface morphology, and residual strain of the HT-AlN nucleation layer. These analyses reveal that the insertion of an LT-AlN nucleation layer can improve the crystal quality, smooth the surface morphology of the HT-AlN nucleation layer and further reduce the threading dislocation density of AlGaN epifilms. The mechanism of inserting an LT-AlN nucleation layer to enhance the optical properties of HT-AlN nucleation layer and AlGaN epifilm are discussed from the viewpoint of driving force of reaction in this paper.