• Journal of the Korean Society for Precision Engineering
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• v.18 no.2
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• pp.90-95
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• 2001

f-$\theta$len is one of the important parts in Laser Scanning Unit because it affects on the optical performance of Laser Scanning Unit dominantly. It is necessary to find out the relationship between the surface profile error of f-$\theta$lens and the beam profile focusing on the Organic Photo Conductive drum in order to analysis the beam profile problems such as appearance of side lobe and expansion of center lobe. In this research, a simulation process which relates the surface profile characteristics to the beam profile has been developed by CODE V. The simulated beam profile also have been compared with the measurement results.

• Journal of the Korean Society for Precision Engineering
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• v.31 no.7
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• pp.605-613
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• 2014

Scanning white-light interferometry is an important measurement option for many surfaces. However, serious profile measurement errors can be present when measuring free-form surfaces being highly curved or tilted. When the object surface slope is not zero, the object and reference rays are no longer common path and optical aberrations impact the measurement. Aberrations mainly occur at the beam splitter in the interference objective and from misalignment in the optical system. Both effects distort the white-light interference signal when the surface slope is not zero. In this paper, we describe a modified version of white-light interferometry for eliminating these measurement errors and improving the accuracy of white-light interferometry. Moreover, we report systematic errors that are caused by optical aberrations when the object is not flat, and compare our proposed method with the conventional processing algorithm using the random ball test.

• Conservation Science in Museum
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• v.22
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• pp.15-26
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• 2019

This study was focused on the three-dimensional convergence modeling that can multilaterally analyze internal and external shapes of the Sam-Chongtong Hand Canon by optical precision scanning optimized for acquiring the surface shape and X-ray CT scanning used for obtaining the internal shape. First, the scanning results were converted by compatible extension, after which three-dimensional deviation analysis was conducted to verify mutual conformities. Accordingly, most (56.98%) deviations between the two scanning models was found be ±0.1mm. This result did not influence registration and merging based on the ICP algorithm. The merged data exhibited the external surface color, detailed shapes, internal width, and structure of the hand canon. The three-dimensional model based on optical surface scanning and X-ray CT scanning can be used for traditional technique interpretation as well as digital documentation of cultural heritage. In the future, it will contribute to deliver accessible scientific information of exhibits for visitors.

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.24 no.1
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• pp.23-30
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• 2015

The scanning quality can be influenced by reflective abilities of a surface. Transparency and glossiness of a surface can highly limit the scanning results. Various techniques have been developed to solve problems of reflective and transparent surfaces. As one of the most feasible and convenient solutions, a thin layer of coating with proper specifications is sprayed on surface for eliminating the problems of the surfaces. As the main goal is to keep the object geometry unchanged, then it is important to coat the surface with layers less than one micrometer in thickness. For this purpose, a newly designed atomization-based spray system has been developed and tested in sets of experiments to study its efficiency on scanning results while objects with the surface are in use. This paper presents the spray design process and then studies and compares the 3D scanning results of the surfaces coated with atomization-based and aerosol sprays.

• Transactions of the Korean Society of Mechanical Engineers B
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• v.34 no.1
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• pp.73-76
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• 2010

The issue of inspection and characterization of microstructures has emerged as a major consideration in design, fabrication, and detection of MEMS devices. However, the conventional measurement techniques, including scanning electron microscopy (SEM) imaging, atomic force microscopy (AFM) scanning, and mechanical surface profiler, require often destructive process or may be difficult to measure with a wafer scale. In this paper, we characterize the surface profiles of microstructures using an optical scanner based on a DVD pick-up module. Scanning images of the microstructures are successfully generated using the intensity of reflected light from different depths of the surface profiles, based on the focus error signal (FES) from photodiodes. It is shown that the proposed optical scanner can be used as an alternative measurement system with high performance and low cost, compared to conventional measurement techniques.

• Transactions of the Korean Society of Mechanical Engineers
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• v.17 no.5
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• pp.1202-1207
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• 1993

An optical method of slit beam scanning topography is presented for the 3-dimensional profile measurement of free-formed surfaces. A slit beam of laser is projected in a scanning mode and its illuminated trajectory on the object is captured by using a CCD camera. The 3-dimensional coordinates of the trajectory is then computed by using the given geometry between the slit beam and the camera, so that the whole surface profile of the object can be obtained in a successive manner. Detailed optical principles are described with special emphasis to lateral are discussed to demonstrate the measuring performances of the slit beam scanning topography proposed in this study.

• Journal of Information Technology Services
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• v.11 no.sup
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• pp.103-111
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• 2012

In epigraph field to study ancient scripts, alternative readability improvement technologies have been developed to replace existing rubbing method which has low resolution and causes surface pollution of heritages from the viewpoints of extraction process and used materials. Recently many methods which are based on analysis of pixel data for extracting outlines of the specific image have been developed with advancement of image processing techniques. But these methods are not applicable and the results are not satisfied in the damaged inscriptions which are weathered by wind and rain for a long time and in the narrowed one. In this paper laser scanning techniques which uses optical triangulation measurement principle are developed to minimize scanning error. The proposed techniques are consisted of 3 parts：(1) the understanding of optical triangulation measurement principle to find scanning guideline (2) determinations of points interval, scanning distance and scanning angle to guarantee scanning data quality (3) identification of valid point data area which will be used in registration process. The proposed character identification method contributed in decoding an ancient inscription on SeukBingGo in Kyungju.

• Proceedings of the Optical Society of Korea Conference
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• 2009.02a
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• pp.459-460
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• 2009

In this study, surface structure and near-field distribution of a surface acoustic wave filter were measured with both reflection mode and collection mode near-field scanning optical microscopes, and there results were compared with each other.

• Journal of the Optical Society of Korea
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• v.18 no.3
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• pp.236-243
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• 2014

Surface profiling and film thickness measurement play an important role for inspection. White light interferometry is widely used for engineering surfaces profiling, but its applications are limited primarily to opaque surfaces with relatively simple optical reflection behavior. The conventional bucket algorithm had given inaccurate surface profiles because of the phase error that occurs when a thin-film exists on the top of the surface. Recently, reflectometry and white light scanning interferometry were combined to measure the film thickness and surface profile. These techniques, however, have found that many local minima exist, so it is necessary to make proper initial guesses to reach the global minimum quickly. In this paper we propose combing reflectometry and white light scanning interferometry to measure the thin-film thickness and surface profile. The key idea is to divide the measurement into two states; reflectometry mode and interferometry mode to obtain the thickness and profile separately. Interferogram modeling, which considers transparent thin-film, was proposed to determine parameters such as height and thickness. With the proposed method, the ambiguity in determining the thickness and the surface has been eliminated. Standard thickness specimens were measured using the proposed method. Multi-layered film measurement results were compared with AFM measurement results. The comparison showed that surface profile and thin-film thickness can be measured successfully through the proposed method.

• Proceedings of the Optical Society of Korea Conference
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• 2006.02a
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• pp.91-92
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• 2006