• 제목/요약/키워드: Optical reflectance

검색결과 512건 처리시간 0.03초

Full-HD LCOS Panel의 Cell Gap의 변화에 따른 전기광학적 특성에 대한 연구 (A Study of Electro-optical Characteristics of Full-HD LCOS Panel Depending on Various Cell Gaps)

  • 손홍배;김민석;강정원
    • 대한전자공학회논문지SD
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    • 제46권8호
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    • pp.6-11
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    • 2009
  • VA Mode LC를 사용하는 Full-HD급 LCOS 마이크로디스플레이에서 셀 상하 간격의 변화에 따른 전기광학적 특성의 변화에 관하여 3차원 LC code를 이용하여 연구하였다. 5가지의 다른 셀 상하 간격 (1.4 ${\mu}m$, 1.8 ${\mu}m$, 2.1 ${\mu}m$, 2.4 ${\mu}m$ 그리고 2.8 ${\mu}m$)의 변화에 따라 Reflectance-Voltage 특성, 반사광 및 반사율 분포, Optical Fill Factor 그리고 명암비를 비교하였다. Surface Anchoring 효과에 의해 상하 간격이 증가하면서 반사율은 증가하였으나 Optical Fill Factor와 명암비를 고려할 경우, 중간 수준의 간격인 2.1 ${\mu}m$ 의 특성이 가장 우수함을 확인할 수 있었다. 동일한 구조를 갖고 있는 0.7 인치 LCOS 패널을 제작하여 광학적 측정을 해 본 결과 시뮬레이션 결과와 통일함을 확인할 수 있었다.

열처리 조건에 따른 Ag-In-Sb-Te 상변화 기록 박막의 미세 조직과 반사도의 관계 (Dependence of Microstructure and Optical Properties of Ag-In-Sb-Te Phase-Change Recording Thin Firms on Annealing Heat-Treatments)

  • 서훈;박정우;최우석;김명룡
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1996년도 춘계학술대회 논문집
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    • pp.9-14
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    • 1996
  • The dependence of microstructural and optical properties of Ag-In-Sb-Te thin films on annealing heat-treatments was studied. It was found from the present work that the increase of reflectance after annealing heat-treatment is related with phase change of Ag-In-Sb-Te thin film from amorphous state to crystalline phases which involve Sb crystalline phase and AgInTe$_2$ stoichiometric phase. On the other hand, the reflectance is decreased after high temperature annealing (above 450$^{\circ}C$), due to the morphology .mange of film surface. For the purpose of practical application(erasable optical disk), we fabricated quadrilayered Ag-In-Sb-Te alloy disk, and annealed it with continuous laser beam. As result of this laser\ulcorner annealing treatment, we found that the increment of reflectance is 9.3% at 780nm wavelength. It might be considered that Ag-In-Sb-Te alloy optical disk is the big promising candidate for the erasable optical memory medium.

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VA Mode의 LCOS에서 Cell Gap의 변화에 따른 전기광학적 특성 (Electro-optical Characteristics of VA mode LCOS depending on Cell Gap)

  • 강정원;손홍배
    • 반도체디스플레이기술학회지
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    • 제7권3호
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    • pp.41-43
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    • 2008
  • The electro-optical characteristics of the Liquid Crystal on Silicon (hereinafter "LCOS") micro-display on vertically alignment (VA) mode were studied depending on various cell gaps. 5 different cell gaps, such as $1.4{\mu}m,\;1.8{\mu}m,\;2.1{\mu}m,\;2.4{\mu}m$ and $2.8{\mu}m$, were selected. The reflectance-voltage (R-V) characteristics, distributions of reflected light and reflectance were calculated with 3-dimmensional LC code. At the center of cell, the smallest $1.4{\mu}m$ cell gap showed the lowest reflectance and the largest $2.8{\mu}m$ cell gap showed the highest reflectance due to the surface anchoring effect. In case of $2.1{\mu}m$ cell gap, the sum of reflectance overall cell was the highest value. Considering the reflectance and RV curve characteristic, the optimized cell gap was $2.1{\mu}m$.

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Evaluation of Diffuse Reflectance in Multi-layered Tissue for High Intensity Laser Therapy

  • Lee, Sangkwan;Youn, Jong-In
    • Journal of the Optical Society of Korea
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    • 제17권2호
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    • pp.205-212
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    • 2013
  • Pain is one of the quite common symptoms in clinics and many treatment methods have been applied to relieve pain. Among the treatments, high-intensity light therapy for pain has been introduced, but this therapy has not been fully supported by confirmed efficacy due to the absence of quantitative assessments and treatment feedback data in real time. In this study, the evaluation of light distribution in tissue was performed with current high-intensity light sources quantitatively using light-tissue interaction simulations. The diffuse reflectance in tissue was generated using Monte Carlo simulation that traces photons as they undergo multiple scattering and absorption within each tissue layer (skin, fat, and muscle) and within multi-layered tissue. The results showed that the highest diffuse reflectance and the deepest penetration of tissue were achieved at ${\lambda}$=830 nm when compared with other wavelengths like ${\lambda}$=650 nm, 980 nm and 1064 nm.

토마토 반사광과 투과광 스펙트럼 분석에 의한 경도 예측 성능 비교 (Comparison of Performance of Models to Predict Hardness of Tomato using Spectroscopic Data of Reflectance and Transmittance)

  • 김영태;서상룡
    • Journal of Biosystems Engineering
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    • 제33권1호
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    • pp.63-68
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    • 2008
  • This study was carried out to find a useful method to predict hardness of tomato using optical spectrum data. Optical spectrum of reflectance and transmittance data were collected processed by 9 kind of preprocessing methods-normalizations of mean, maximum and range, SNV (standard normal variate), MSC (multiplicative scatter correction), the first derivative and second derivative of Savitzky-Golay and Norris-Gap. With the preprocessed and non-processed original spectrum data, prediction models of hardness of tomato were developed using analytical tools of PLS (partial least squares) and MLR (multiple linear regression) and tested for their validation. The test of validation resulted that the analytical tools of PLS and MLR output similar performances while the transmittance spectra showed much better result than the reflectance spectra.

Te 을 미세 도핑한 S $b_{85}Ge_{15}$ 상변화 기록 박막의 특성 (The Characteristics of Te-light doped S $b_{85}Ge_{15}$Thin Film as Phase Change Optical Recording Media)

  • 김종기;김홍석;이영종;정홍배
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 1997년도 춘계학술대회 논문집
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    • pp.20-22
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    • 1997
  • In ours study, we investigated the various properties in Te-light doped $Sb_{85}$G $e_{15}$ thin films such as the change of reflectance and transmittance according to phase change from amorphous to crystalline states In all films the transmittance was decreased, but the reflectance was increased by annealing. Particularly, the reflectance between as- deposited state and annealed state showed the largest change in the T $e_{0.5}$($Sb_{85}$G $e_{15}$ )$_{99.5}$ thin film at 780nm, which was about 40% in as-deposited state and about 70% in annealed state. Therefore, it might be considered that the T $e_{0.5}$($Sb_{85}$G $e_{15}$ )$_{99.5}$ thin film is recording medium showing to a good optical properties if it is used to optical recording of the phase change type. change type.ype.

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사과의 분광반사(分光反射) 특성(特性)과 비파괴(非破壞) 품질평가인자(品質評價因子)와의 상관관계(相關關係) 구명(究明) (Correlation between Non-destructive Quality Evaluation Parameters and Spectral Reflectance of Apple)

  • 김용현;김철수;김성봉;김몽섭;신건철
    • Journal of Biosystems Engineering
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    • 제17권4호
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    • pp.370-381
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    • 1992
  • Optical properties of fruits can provide information for nondestructive quality evaluation. An attempt is made here to develop an optical method for quality evaluation of apple using the spectral reflectance of its surface. Optical fiber was used to transmit light conveniently from light source to sample and sample to detector. Spectral reflectances of two types of Fuji variety-one of which was exposed to the sunlight directly (non-bagging) and the other was wrapped with bag (bagging) - were investigated from the wavelength ranging of 400nm to 700nm. The relationships between reflectance characteristics and quality indices such as chlorophyll content, anthocyanin content, and soluble solids were analyzed.

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DEVELOPMENT OF QUALITY EVALUATION SYSTEM FOR PEANUT WITH POD USING OPTICAL METHODS

  • Morta, Kazuo;Taharazako, Shoji;Zhang, Han;Maekaji, Kenji;Ikeda, Hirohiko
    • 한국농업기계학회:학술대회논문집
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    • 한국농업기계학회 1993년도 Proceedings of International Conference for Agricultural Machinery and Process Engineering
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    • pp.1354-1363
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    • 1993
  • Optical methods were developed to examine their feasibility for quality evaluation of peanut with pod. Surface color and internal quality of peanut were measured without contact. The surface color of peanut was measured by light reflectance at a region of visible wavelengths. Its characteristic was high correlated with a visual grading of peanut. A trial machine for the color grading of peanut was developed using an optical sensor and it was considered to compare with the visual grading. The spectral reflectance at a region of near infrared wavelengths from 1,200 to 2,500nm was measured , and the chemical components of peanut were related to spectral reflectance at special wavelengths. The protein, fat and moisture contents of peanut were estimated by the near infrared methods. An infrared imaging method was developed to evaluate the internal quality of peanut with pod. As thermal characteristic of peanut with pod was deeply related to internal quality , the quality of peanut can be evaluated by temperature changes on the surface of peanut. Measurement of surface color, near infrared reflectance and thermal imaging were shown to be very effective in grading of peanut with pod.

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박막의 열물성 측정 및 광학특성 연구 (A Study on Thermal Conductivity Measurement and Optical Characteristics of Thin Films)

  • 권혁록;이성혁
    • 전기학회논문지
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    • 제56권12호
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    • pp.2202-2207
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    • 2007
  • The present article investigates experimentally and theoretically thermal and optical characteristics of thin film structures through measurement of thermal conductivity of Pyrex 7740 and reflectance in silicon thin film. The $3{\omega}$ method is used to measure thermal conductivity of very thin film with high accuracy and the optical characteristics in thin films are studied to examine the influence of incidence angle of light on reflectance by using the CTM(Characteristics Transmission Method) and the 633 nm He-Ne laser reflectance measurement system. It is found that the estimated reflectance of silicon show good agreement with experimental data. In particular, the present study solves the EPRT(Equation of Phonon Radiative Transport) which is based on Boltzmann transport equation for predicting thermal conductivity of nanoscale film structures. From the results, the measured thermal conductivity is in good agreement with the previous published data. Moreover, thermal conductivities are estimated for different film thickness. It indicates that as film thickness decreases, thermal conductivity decreases substantially due to internal scattering.

$Te_x(Sb_{85}Ge_{15})_{100-x}$ 상변화 광기록 박막의 결정화 특성 (Crystallization Properites of $Te_x(Sb_{85}Ge_{15})_{100-x}$ Thin Film as Phase Change Optical Recording Media)

  • 김홍석;이현용;정홍배
    • 한국전기전자재료학회논문지
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    • 제11권4호
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    • pp.314-320
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    • 1998
  • In this study, we have investigated crystallization properties of $Te_x(Sb_{85}Ge_{15})_{100-x}$ (x=0.3, 0.5, 1.0) thin films prepared by thermal evaporation. The change of reflectance according to phase change from amorphous to crystalline phases with annealing and exposure of diode laser is measured b the n&k analyzer and the surface morphology between amorphous and crystalline phase is analyzed by SEM and AFM. The difference in reflectance($\DeltaR$) between amorphous and crystalline phase appears approximately 20% at the diode laser wavelength, 780nm in all prepared films. Especially, the reflectance difference,$\DeltaR$ comes up to about 30% in $Te_{0.5}(Sb_{85}Ge_{15})_{99.5}$ thin film. Also, amorphous-to-crystalline phase change is observed in all prepared films. As a result of the measurement of the reflectance using diode laser, the reflectance is increased in proportion to the laser power and exposure time in all films. As a result of observing each film with the SEM and AFM, the surface morphology of the annealed and the exposed films are evidently increased than those of as-deposited films. The fast crystallization is occurred by increasing in Te content. Therefore, we conclude that the $Te_{0.5}(Sb_{85}Ge_{15})_{99.5}$ and $Te_1(Sb_{85}Ge_{15})_{99}$ thin films can be evaluated as an attractive optical recording medium with high contast ratio and fast erasing time due to crystallization.

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