• 한국광학회지
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• 제23권5호
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• pp.203-210
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• 2012

사냑간섭계 원리를 이용한 자이로는 연구의 계기가 된 발명 또는 연구시기에 따라서 크게 3세대로 구분되어질 수 있다. 사냑간섭계 원리를 이용한 첫 번째 자이로인 링레이저 자이로는 레이저의 발명에 의해서 1960년대 부터 연구되어 왔으며, 사냑간섭계 원리를 이용한 2세대 자이로인 광섬유 자이로는 통신용 광섬유의 발명에 의해서 1970년대부터 연구되어 왔다. 원자의 파동성이 입증된 1990년대 후반에는 차기세대 자이로 개발을 위한 원자간섭계 연구가 시작되었다. 본 논문은 이러한 세 분류의 사냑간섭계 원리를 이용한 자이로의 동작원리, 응용분야, 그리고 발전전망에 대하여 논의하였다.

• 한국광학회:학술대회논문집
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• 한국광학회 2003년도 제14회 정기총회 및 03년 동계학술발표회
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• pp.128-129
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• 2003

최근 수년간 polarimetry, Raman spectroscopy, near infrared (NIR) absorption spectroscopy, NIR scattering, optoacoustics 등의 방법을 통하여 비침습적으로 Glucose의 농도를 측정하려는 연구가 많이 시도되었다. 일반적으로 이들 방법은 sensitivity 와 signal-to-noise ratio가 매우 낮고 복잡한 알고리즘이 요구되어져 glucose 농도 측정에 한계가 있음이 드러났다. 본 연구에서는 polarization sensitive optical coherence tomography (PS-OCT)에 사용되는 polarization sensitive low coherence inter-ferometer (PS-LCI) 기법을 이용하여 비침습적으로 glucose의 농도 측정을 가능하게 하는 시스템 개발에 중점을 두었다. (중략)

• 한국광학회:학술대회논문집
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• 한국광학회 2003년도 하계학술발표회
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• pp.298-299
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• 2003

초음파는 일반적으로 물질의 내부결함을 측정하거나 결정입경과 같은 물질의 특성을 측정하는데 사용된다. 현재 초음파를 검지하는 방법으로는 탐촉자를 물질에 접촉시켜서 초음파를 측정하는 접촉식 방법이 널리 사용되고 있다. 따라서, 이러한 접촉식 초음파 검출방법은 원격탐사를 하는데에 어려움이 있다. 이런 문제점을 보완하기 위하여 본 연구에서는 패브리-페로 간섭계(Fabry-Perot interferometer)를 이용하여 비접촉식으로 초음파를 검출하는 방법에 대하여 실험하였다. (중략)

• 한국광학회지
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• 제28권2호
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• pp.75-82
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• 2017

초정밀도를 요구하는 반도체 소자 공정에서 웨이퍼의 위치와 반복정밀도를 파장의 수백분의 일로 오차가 거의 없는 상태에서 제어하기 위해 위치변위 레이저 간섭계가 필요하다. 특히 제조공정에서는 생산단가의 인하압박으로 인해 웨이퍼의 대형화가 시도되고 있고 이에 따라 넓은 변위량을 측정하면서 나노미터 급의 위치 정밀도를 지닌 레이저 간섭계가 더욱 절실하게 요구된다. 이런 기술적인 문제를 해결하기 위해서 간섭계에 사용되는 송수신 광학계에도 특별한 광학적인 고안이 필요하게 된다. 본 논문에서는, 송수신 광학부로서 단순하게 콜리메이팅 렌즈만을 사용하는 기존의 방식 대신에, GRIN 렌즈-콜리메이팅 렌즈-무초점 광학계로 구성되는 새로운 형식의 조금 복잡한 형태의 광학구조를 제안하였고 이를 통해 반사된 후 되돌아와 간섭계로 결합되는 광신호의 효율을 약 100배 정도 높일 수 있었다.

• 대한전자공학회:학술대회논문집
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• 대한전자공학회 2002년도 ITC-CSCC -1
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• pp.631-634
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• 2002

In this paper, we propose an improved optical security system using three phase-encoded images and the principle of interference. This optical system based on a Mach-Zehnder interferometer consists of one phase-encoded virtual image to be encrypted and two phase-encoded images, encrypting image and decrypting image, where every pixel in the three images has a phase value of '0' and '$\pi$'. The proposed encryption is performed by the multiplication of an encrypting image and a phase-encoded virtual image which dose not contain any information from the decrypted image. Therefore, even if the unauthorized users steal and analyze the encrypted image, they cannot reconstruct the required image. This virtual image protects the original image from counterfeiting and unauthorized access.. The decryption of the original image is simply performed by interfering between a reference wave and a direct pixel-to-pixel mapping image of the encrypted image with a decrypting image. Both computer simulations and optical experiments confirmed the effectiveness of the proposed optical technique for optical security applications.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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• pp.390-390
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• 2008

In this paper, we have designed and fabricated optical waveguides based on the Mach-Zehnder Interferometer (MZI) for application to sensor. The evanecent-wave sensor based on the MZI principle has sufficiently high sensitivity to measure the change of the refractive index on surface of a waveguide. The waveguides were optimized at a wavelength of 1550 nm and fabricated according to the design rule of 0.45 delta%, which is the difference of refractive index between the core and clad. The fabrication of MZI optical waveguides was performed by a conventional Planar Lightwave Circuit (PLC) fabrication process. The fabricated MZI optical waveguide device was measured. According to the measurement result, the insertion loss of MZI optical waveguide device was below 3.5 dB and the polarization dependent loss (PDL) was within 0.1dB. In addition, we analyzed optical properties of MZI sensor according to the refractive index change of the sensor arm.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2002년도 춘계학술대회 논문집
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• pp.195-198
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• 2002

Demand for high precision measurement of large area is increasing in many industrial fields. White-light Scanning Interferometer(WSI) is a well-known method for 3D profile measurement. However WSI has some limitations in a measurement range because of the sensing mechanism. Therefore, in this paper we use a heterodyne laser interferometer to get over the limitations of a short measurement range in WSI, We suggest a new WSI system combined with heterodyne laser interferometer. This system is aimed at eliminating Abbe error with measuring the focus point directly. With the use of triggering functionality of WSI, we can use this system as a probe of a precision stage such as a probe of CMM. The suggested system gives a repeatability of 87 nm in the absolute distance measurement test under the laboratory environment.

• 한국기계가공학회지
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• 제5권2호
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• pp.22-26
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• 2006

This paper addresses the development of a laser interferometer to measure micro displacement for a micro system. The laser interferometer is able to measure micro displacement during a few micro seconds with non-contact. In order to employ the interferometer, the displacement calibration experiment should be required. For the experiment, a laser probe installed on the optical table with optical devices and a micro stage. The velocity decoding board is also added to calculate doppler shift frequency directly. The output signal is processed by LabView. Finally experiments are found out the relation between displacement and output signal.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2003년도 춘계학술대회 논문집
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• pp.1195-1198
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• 2003

Micro former has been known as a useful tool for machining micro parts. It makes micro holes automatically with punches, a hole-shape die and material by rotation of crank shaft synchronously. Micro displacement in micro forming affects on the performance of machining because micro forming size is similar with its mechanical displacement. Therefore, the measurement of this micro displacement is essential to be guaranteed to obtain high forming precision in the whole machine as well as its devices. This paper addresses the development of a laser interferometer to measure micro displacement for a micro former. The laser interferometer is able to measure micro displacement during a few micro seconds with non-contact. For the experiment, a laser probe is installed on the optical table with optical devices and a micro displacement generating device. The velocity decoding board is also added to calculate doppler shift frequency directly. Finally simple experiments are conducted to confirm its functional operation.

• 한국공작기계학회논문집
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• 제13권6호
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• pp.34-40
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• 2004

This paper presents studies on curvature radius measurement using the laser interferometer. It is a general practice to measure to $10^{-10}$m in length with the recent improvement and innovations in measurement technology and the processor used. The measurement methods can generally be categorized as these two: the contactual method and non-contactual method; and in this study, we will find ways to lower the cost for a CMM, or a coordinate measurement machine, and try to find an alternative. Furthermore, we will discuss some of the ways to improve the non-contactual measurement methods-optical interferometer method and the optical triangulation method. We will measure an object using a laser distance measuring device and Set the Point-contact result with the ball-bearing type and line-contact result with the bearing type, to decide on which probe type will be used.