• Title/Summary/Keyword: Optical inspection

검색결과 343건 처리시간 0.035초

Novel Telecentric Collimator Design for Mobile Optical Inspection Instruments

  • Hojong Choi;Seongil Cho;Jaemyung Ryu
    • Current Optics and Photonics
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    • 제7권3호
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    • pp.263-272
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    • 2023
  • A collimator refers to an optical system that images a collimated beam at a desired point. A resolution target located at a near distance can be converted into a virtual image located at a long distance. To test the resolution for mobile cameras, a large target is placed at a long distance. If a collimator system is used, the target can be placed at a near distance. The space required for a resolution inspection can thus be drastically reduced. However, to inspect a mobile camera, the exit pupil of the collimator system and the entrance pupil of the mobile camera must match, and the stop of the collimator system must be located on the last surface. Because a collimator system cannot be symmetrical with respect to the stop, the distortion becomes extremely large, which can be corrected by combining the collimator symmetrically with respect to the object plane. A novel system was designed to inspect an optical lens on a mobile phone. After arranging the refractive power, lenses were added using the equivalent lens design method. The distortion was reduced to less than 1%. This optical system satisfies a half-field angle of 45° and an optical performance sufficient for inspection.

광섬유 단심 연결소자의 치수정밀도 자동검사 (Automatic Inspection of Geometric Accuracy of Optical Fiber Single Ferrules)

  • 김기홍;김승우;임쌍근
    • 한국정밀공학회지
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    • 제17권10호
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    • pp.63-68
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    • 2000
  • We present an automatic inspection system which been developed to evaluate the geometric tolerances of the optical fiber connectors with an dimensional accuracy of$\pm0.1\mnm$. The main part of the inspection system comprises a series of machine vision and laser scanning probes to measure the internal and external circle diameters along with concentricity by making the most of advanced edge detection algorithms. Actual experimental results obtained through various repeatability tests demonstrate that the system well satisfies the required industrial demands for in-situ inspection of optical fiber connections in real manufacturing environment.

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Rapid Defect Inspection of Display Device with Optical Spatial Filtering

  • Yoon, Dong-Seon;Kim, Seung-Woo
    • International Journal of Precision Engineering and Manufacturing
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    • 제1권1호
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    • pp.56-61
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    • 2000
  • We present a fast inspection method of machine vision for in-line quality assurance of liquid crystal displays(LCD) and plasma display panels(PDP). The method incorporates an optical spatial filter in the Fourier plane of the imaging optics to block the normal periodic pattern, extracting only defects real time without relying on intensive software image process. Special emphasis is on designing a collimated white light source to provide high degree of spatial coherence for effective real time Fourier transform. At the same time, a low level of temporal coherence is attained to improve defect detection capabilities by avoiding undesirable coherent noises. Experimental results show that the proposed inspection method offers a detection accuracy of 15% tolerance, which is sufficient for industrial applications.

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반도체 패키지 외관 검사 시스템 개발 (Development of Inspection System for the IC package)

  • 이정섭;권오민;주효남;김준식;류근호
    • 제어로봇시스템학회논문지
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    • 제14권5호
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    • pp.453-461
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    • 2008
  • In this paper, new inspection method is proposed for the surfaces of lead frame and IC's. Optimal optical system and the accurate algorithm for the surface inspection are needed in machine vision area. The proposed optical system is composed of rectangular oblique light illumination and coaxial light illumination for the higher contrast and the results shows the better performances through experiments. The markings of IC surface are inspected using the accurate proposed method using the partitioned correlation coefficient, and the result shows reduction of under kill ratio compared to the previous method.

AFVI를 위한 PCB PAD의 자동 광학 검사 (Automatic Optical Inspection of PCB PADs for AFVI)

  • 문순환
    • 한국광학회:학술대회논문집
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    • 한국광학회 2006년도 하계학술발표회 논문집
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    • pp.469-471
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    • 2006
  • This paper describes a efficient insepction method of PCB PADs for AFVI. The methods for PCB inspection have been tried to detect the defects in PCB PADs, but their low detection rate results from pattern variations that are originating from etching, printing and handling processes. The adaptive inspection method has been newly proposed to extract minute defects based on dynamic segments and filters. The vertexes are extracted from CAM master images of PCB and then a lot of segments are constructed in master data. The proposed method moves these segments to optimal directions of a PAD contour and so adaptively matches segments to PAD contours of inspected images, irrespectively of various pattern variations. It makes a fast, accurate and reliable inspection of PCB patterns. Experimental results show that proposed methods are found to be effective for flexible defects detection.

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자동 표면 결함검사 시스템에서 Retro 광학계를 이용한 3D 깊이정보 측정방법 (Linear System Depth Detection using Retro Reflector for Automatic Vision Inspection System)

  • 주영복
    • 반도체디스플레이기술학회지
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    • 제21권4호
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    • pp.77-80
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    • 2022
  • Automatic Vision Inspection (AVI) systems automatically detect defect features and measure their sizes via camera vision. It has been populated because of the accuracy and consistency in terms of QC (Quality Control) of inspection processes. Also, it is important to predict the performance of an AVI to meet customer's specification in advance. AVI are usually suffered from false negative and positives. It can be overcome by providing extra information such as 3D depth information. Stereo vision processing has been popular for depth extraction of the 3D images from 2D images. However, stereo vision methods usually take long time to process. In this paper, retro optical system using reflectors is proposed and experimented to overcome the problem. The optical system extracts the depth without special SW processes. The vision sensor and optical components such as illumination and depth detecting module are integrated as a unit. The depth information can be extracted on real-time basis and utilized and can improve the performance of an AVI system.

Inspection System of Welding Bead and Chamfer by means of Laser Vision

  • Lee, Jun-Ssok;Im, Pil-Ju;Park, Young-Jun;Kim, Jae-Hoon
    • 제어로봇시스템학회:학술대회논문집
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    • 제어로봇시스템학회 2001년도 ICCAS
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    • pp.118.4-118
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    • 2001
  • An Inspection system, composed of sensor head and controller, is presented which is a 3-D laser vision system using principles of optical triangulation for weld quality and chamfer quality. The sensor head id composed of laser diode, micro CCD camera, filter and several optical components. This systems can be used in welding bead and undercut inspection and chamfer quality inspection as well. It is mech more convenient to use and the inspection time is to be greatly shortened compared with conventional inspection method. Furthermore, data saved in controller can be used for statistics afterwards. This system has been begin used in Koje Shipyard of Samsung Heavy Industries and the need is being increased.

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검사지연시간을 고려한 SMT 검사기의 통합적 경로 계획 알고리즘 (Unified Approach to Path Planning Algorithm for SMT Inspection Machines Considering Inspection Delay Time)

  • 이철희;박태형
    • 제어로봇시스템학회논문지
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    • 제21권8호
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    • pp.788-793
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    • 2015
  • This paper proposes a path planning algorithm to reduce the inspection time of AOI (Automatic Optical Inspection) machines for SMT (Surface Mount Technology) in-line system. Since the field-of-view of the camera attached at the machine is much less than the entire inspection region of board, the inspection region should be clustered to many groups. The image acquisition time depends on the number of groups, and camera moving time depends on the sequence of visiting the groups. The acquired image is processed while the camera moves to the next position, but it may be delayed if the group includes many components to be inspected. The inspection delay has influence on the overall job time of the machine. In this paper, we newly considers the inspection delay time for path planning of the inspection machine. The unified approach using genetic algorithm is applied to generates the groups and visiting sequence simultaneously. The chromosome, crossover operator, and mutation operator is proposed to develop the genetic algorithm. The experimental results are presented to verify the usefulness of the proposed method.