• Proceedings of the Korean Society of Precision Engineering Conference
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• 2002.05a
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• pp.191-194
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• 2002

In optical pick-up, optical components such as objective lens, collimator, mirror, laser diode and photo diode are mounted on the pick-up base. These components must keep their original position during operation for proper transmittance of information from laser diode to optical disk and back to photo diode. However, micro thermal deformation of pick-up base which is induced by thermal environment during operation can deteriorate the performance of optical pick-up. Therefore, it is important to measure and analyze the thermal deformation behavior of pick-up base under thermal environment. In the present study, a measurement system using holographic interferometry was designed to measure micro thermal deformation of pick up base. The measurement system was verified by using the deformation of cantilever with prescribed motion actuated by PZT with 1 nm resolution. Interferometric measurement was compared quantitatively with that induced by PZT actuator. Finally, micro thermal deformation of pick-up base under actual thermal environment was measured using the present holographic interferometry and the results were analysed.

• International Journal of Aerospace System Engineering
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• v.1 no.1
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• pp.29-33
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• 2014

A displacement measurement system that uses fiber-optical common-path interferometry has been developed. The system includes fiber-optic devices and a collimator attached to a linear translation stage. The interferometry effect was detected with a photodetector whose signal was measured on an oscilloscope. Experiments showed that vibration of the stage disturbed the signal by causing nanoscale interference. Under stable conditions, the measured distance was the almost the same as the value calculated from the linear translation stage parameters.

• Transactions of the Korean Society of Mechanical Engineers
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• v.16 no.8
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• pp.1530-1535
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• 1992

An optical method of phase shifting interferometry is presented for the 3-dimensional profile measurement of mirror surfaces with nanometer resolution. A series of optical interferometric fringes are generated by comparing the surface to be measured with a reference flat. The fringes are captured by a CCD camera and then analyzed to obtain actual surface profile. Detailed principles are described along with necessary image processing algorithms. finally, several measurement examples are discussed which were performed on lapped surfaces, hard discs, and semiconductor wafers.

• Proceedings of the Optical Society of Korea Conference
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• 2000.08a
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• pp.126-127
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• 2000

In this paper, we proposed an optical encryption method based in the concept of visual cryptography and interferometry. In our method a secret binary image was divided into two sub-images and they were encrypted by 'XOR' operation with a random key mask. Finally each encrypted image was changed into phase mask. By interference of these two phase masks the original image was obtained. Compared with general visual encryption method, this optical method had good signal-to-noise ratio due to no need to generate sub-pixels like visual encryption.

• Proceedings of the Optical Society of Korea Conference
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• 2006.02a
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• pp.335-336
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• 2006

We propose a method of encryption and decryption of binary data using 2-step phase-shifting digital interferometry. This technique reduces the number of interferograms in the phase-shifting interferometry. The binary data has been expressed with random code and random phase. We remove the dc-term of the phase-shifting digital interferogram to restore the original binary data. Simulation results shows that the proposed technique can be used for binary data encryption and decryption.

• Current Optics and Photonics
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• v.7 no.4
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• pp.325-336
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• 2023

We review recent research related to shearing interferometry, reported over the last two decades. Shearing interferometry is categorized as azimuthal, radial, or lateral shearing interferometers by its fundamental principle to generate interference. In this review the research trends for each technique are provided, with a summary of experimental results containing theoretical background, the optical configuration, analysis, and perspective on its application fields.

• Journal of the Korean Society for Precision Engineering
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• v.24 no.11
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• pp.37-43
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• 2007

• Proceedings of the Optical Society of Korea Conference
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• 2000.02a
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• pp.182-187
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• 2000

빛은 공간상에서 전파되는 특성상 전자기파(electromagnetic wave)로 규정될 수 있다. 빛의 파동성은 여러 형태의 간섭을 유발한다. 이중 정밀 길이측정에는 광위상간섭(phase measuring interferometry)의 원리가 대표적으로 이용된다. 그림1은 광위상간섭의 기본원리를 Michelson 광학계를 이용하여 설명하고 있다. 하나의 동일한 광원으로부터 출발된 광속(optical beam)은 광분할기(beam splitter)에 의해 두 개로 별도 광속으로 분활 된다. (중략)

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1995.10a
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• pp.397-401
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• 1995

ESPI(Electronic Speckle Pattern Interfermetry) is an optical technique to measure surface deforamtion of engineering components and materials in industrial ares. This optical method is capable of providing full-field results with high spatial resolution, high speed and is the non-contact technique. One of important application aspects using electronic speckle pattern interferometry is to generate contours of a diffuse object in order to provide data for 3-D shape analysis and topography measurement. The contouring method by modified dual-beam speckle pattern interferometry is proposed. We introduce a shift of the illumination beams through optical fiber in order to obtain the contour fringe patterns. The speckle pattern correlation technique is suitable for providing measurement range from millimeters to several centimeters. The complete geometric analysis of the contoretical and experimental results are obtained.

• Journal of the Optical Society of Korea
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• v.10 no.1
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• pp.48-54
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• 2006

White-light scanning interferometry (WLI) and phase shifting interferometry (PSI) are increasingly used for surface topography measurements, particularly for areal measurements. In this paper, we compare surface profiling results obtained from above two optical methods with those obtained from stylus instruments. For moderately rough surfaces ($Ra{\approx}500\;nm$), roughness measurements obtained with WLI and the stylus method seem to provide close agreement on the same roughness samples. For surface roughness measurements in the 50 nm to 300 nm range of Ra, discrepancies between WLI and the stylus method are observed. In some cases the discrepancy is as large as 109% of the value obtained with the stylus method. By contrast, the PSI results are in good agreement with those of the stylus technique.