• 제목/요약/키워드: New technology

검색결과 30,067건 처리시간 0.053초

A NOVEL ZVS-CV PWM AC-DC CONVERTER

  • Yan, Baiping;Chen, Zhiming;Liu, Jian
    • 전력전자학회:학술대회논문집
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    • 전력전자학회 1998년도 Proceedings ICPE 98 1998 International Conference on Power Electronics
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    • pp.709-712
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    • 1998
  • A new ZVS-CV PWM converter with power factor correction (PFC) function is presented in this paper. The new topology is a integration of a boost converter and a ZVS-CV topology in a single power conversion stage. The new converter can be regulated in pulse-width modulation (PWM) by universal integrated control circuits. Some design considerations are given in detail. A laboratory prototype has been implemented to show the feasibility of the approach and the analysis.

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Simulation System of the CRT Deflection Yoke

  • Lee, Min-Soo;Woo, Duck-Kee;Cheun, Jong-Mok
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2002년도 International Meeting on Information Display
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    • pp.392-394
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    • 2002
  • Yoke simulator has been made for understanding beam movements in the deflection fields of the CRT. Consisting of the modeler, solver and post-processor, the simulator makes yoke model (conventional and rectangular yoke) and calculates charge sources and magnetic filed by BEM (boundary element method). This system supports a number of charge elements (line and surface charges) and beam movements can be predicted by the system.

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Internet-based EDI : Its Management and Strategic Implications

  • Cho, Nam-Jae;Park, Sang-Hyuk
    • 한국전자거래학회:학술대회논문집
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    • 한국전자거래학회 1998년도 학술대회지 vol.2
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    • pp.457-466
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    • 1998
  • Internet-based EDI is emerging as a prominent substitute technology for traditional VAN-based EDI technology. The strength of this new technology is based on the explosive growth of Internet community, low "fixed-rate" Internet expense and "globally" open base of its participants. These strengths of Internet-baed EDI bring vast new opportunities for enterprises and thus. have as much implications for IT managers. However, Internet-based EDI technology has, at least by now, several drawbacks too. Most of these drawbacks also comes from the fact that it has its structural base on the Internet. Managers should carefully consider these drawbacks and hidden costs before adopting or switching to this attractive new technology. This presentation attempts to address major trends of Internet-based EDI and its implementation, opportunities and threats of the changes in technology, factors to consider in adopting this technology, and several managerial and strategic tradeoffs and implications of Internet-based EDI for IT managers.

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Formation and Dissociation Processes of Gas Hydrate Composed of Methane and Carbon Dioxide below Freezing

  • Hachikubo, Akihiro;Yamada, Koutarou;Miura, Taku;Hyakutake, Kinji;Abe, Kiyoshi;Shoji, Hitoshi
    • Ocean and Polar Research
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    • 제26권3호
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    • pp.515-521
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    • 2004
  • The processes of formation and dissociation of gas hydrates were investigated by monitoring pressure and temperature variations in a pressure cell in order to understand the kinetic behavior of gas hydrate and the controlling factors fur the phase transition of gas hydrate below freezing. Gas hydrates were made kom guest gases ($CH_4,\;CO_2$, and their mixed-gas) and fine ice powder. We found that formation and dissociation speeds of gas hydrates were not controlled by temperature and pressure conditions alone. The results of this study suggested that pressure levels at the formation of mixed-gas hydrate determine the transient equilibrium pressure itself.

5 nm 급 반도체 배선 공정 기술 개발 (Development of Interconnect Process Technology for 5 nm Technology Nodes)

  • 최은미;표성규
    • 마이크로전자및패키징학회지
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    • 제23권4호
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    • pp.25-29
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    • 2016
  • The semiconductor industry has been developed mainly by micronization process due to many advantages of miniaturization of devices. Mass production of semiconductors of 10 nm class has been started recently, and it is expected that the technology generation of 5 nm & 7 nm technology will come. However, excessive linewidth reduction affects physical limits and device reliability. To solve these problems, new process technology development and new concept devices are being studied. In this review, we introduce the next generation technology and introduce the advanced research for the new concept device.