• Title/Summary/Keyword: Network Modeling

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Modelling and Performance Evaluation of Packet Network by DEVS Simulation (DEVS 시뮬레이션을 이용한 패킷망의 모델링 및 성능분석)

  • 박상희
    • Journal of the Korea Society for Simulation
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    • v.3 no.1
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    • pp.75-88
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    • 1994
  • Discrete event modeling is finding ever more application to anlysis and design of complex manufacturing, communication, computer systems, etc. This paper shows how packet network systems may be advantageously represented as DEVS (Discrete Event System Specification) models by employing System Entity structure / Model base (SES/MB) framework developed by Zeigler. DEVS models and network structure representations support a strong basis for performance analysis of packet network systems. This approach is illustated in a typical packet network example with several routing strategies.

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Estimation of hardening depth using neural network in LASER surface hardening process (레이저 표면경화공정에서 신경회로망을 이용한 경화층깊이의 측정)

  • 박영준;우현구;조형석;한유희
    • 제어로봇시스템학회:학술대회논문집
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    • 1993.10a
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    • pp.212-217
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    • 1993
  • In this paper, the hardening depth in Laser surface hardening process is estimated using a multilayered neural network. Input data of the neural network are surface temperature of five points, power and travelling speed of Laser beam. A FDM(finite difference method) is used for modeling the Laser surface hardening process. This model is used to obtain the network's training data sample and to evaluate the performance of the neural network estimator. The simulational results showed that the proposed scheme can be used to estimate the hardening depth on real time.

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Passive Benign Worm Propagation Modeling with Dynamic Quarantine Defense

  • Toutonji, Ossama;Yoo, Seong-Moo
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.3 no.1
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    • pp.96-107
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    • 2009
  • Worm attacks can greatly distort network performance, and countering infections can exact a heavy toll on economic and technical resources. Worm modeling helps us to better understand the spread and propagation of worms through a network, and combining effective types of mitigation techniques helps prevent and mitigate the effects of worm attacks. In this paper, we propose a mathematical model which combines both dynamic quarantine and passive benign worms. This Passive Worm Dynamic Quarantine (PWDQ) model departs from previous models in that infected hosts will be recovered either by passive benign worms or quarantine measure. Computer simulation shows that the performance of our proposed model is significantly better than existing models, in terms of decreasing the number of infectious hosts and reducing the worm propagation speed.

Real-time modeling prediction for excavation behavior

  • Ni, Li-Feng;Li, Ai-Qun;Liu, Fu-Yi;Yin, Honore;Wu, J.R.
    • Structural Engineering and Mechanics
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    • v.16 no.6
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    • pp.643-654
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    • 2003
  • Two real-time modeling prediction (RMP) schemes are presented in this paper for analyzing the behavior of deep excavations during construction. The first RMP scheme is developed from the traditional AR(p) model. The second is based on the simplified Elman-style recurrent neural networks. An on-line learning algorithm is introduced to describe the dynamic behavior of deep excavations. As a case study, in-situ measurements of an excavation were recorded and the measured data were used to verify the reliability of the two schemes. They proved to be both effective and convenient for predicting the behavior of deep excavations during construction. It is shown through the case study that the RMP scheme based on the neural network is more accurate than that based on the traditional AR(p) model.

Unified Modeling Language based Analysis of Security Attacks in Wireless Sensor Networks: A Survey

  • Hong, Sung-Hyuck;Lim, Sun-Ho;Song, Jae-Ki
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.5 no.4
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    • pp.805-821
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    • 2011
  • Wireless Sensor Networks (WSNs) are rapidly emerging because of their potential applications available in military and civilian environments. Due to unattended and hostile deployment environments, shared wireless links, and inherent resource constraints, providing high level security services is challenging in WSNs. In this paper, we revisit various security attack models and analyze them by using a well-known standard notation, Unified Modeling Language (UML). We provide a set of UML collaboration diagram and sequence diagrams of attack models witnessed in different network layers: physical, data/link, network, and transport. The proposed UML-based analysis not only can facilitate understanding of attack strategies, but can also provide a deep insight into designing/developing countermeasures in WSNs.

New Fuzzy Modeling Method by Fuzzy Equalization (퍼지 균등화에 의한 새로운 퍼지 모델링 방법)

  • Kwak, K.C.;Shin, D.C.;Song, C.K.;Kim, J.S.;Ryu, J.W.
    • Proceedings of the KIEE Conference
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    • 1999.07b
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    • pp.957-959
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    • 1999
  • In this paper we proposed a new fuzzy modeling method by Fuzzy Equalization(FE) based on probability theory. FE concerns a process of building membership function without learning using back-propagation of neural network. Therefore, we compare the proposed method with Adaptive Network-based Inference System based on hybrid learning. Finally, we will show better performance and its usefulness for a new fuzzy modeling to automobile mpg prediction.

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Neural network simulator for semiconductor manufacturing : Case study - photolithography process overlay parameters (신경망을 이용한 반도체 공정 시뮬레이터 : 포토공정 오버레이 사례연구)

  • Park Sanghoon;Seo Sanghyok;Kim Jihyun;Kim Sung-Shick
    • Journal of the Korea Society for Simulation
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    • v.14 no.4
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    • pp.55-68
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    • 2005
  • The advancement in semiconductor technology is leading toward smaller critical dimension designs and larger wafer manufactures. Due to such phenomena, semiconductor industry is in need of an accurate control of the process. Photolithography is one of the key processes where the pattern of each layer is formed. In this process, precise superposition of the current layer to the previous layer is critical. Therefore overlay parameters of the semiconductor photolithography process is targeted for this research. The complex relationship among the input parameters and the output metrologies is difficult to understand and harder yet to model. Because of the superiority in modeling multi-nonlinear relationships, neural networks is used for the simulator modeling. For training the neural networks, conjugate gradient method is employed. An experiment is performed to evaluate the performance among the proposed neural network simulator, stepwise regression model, and the currently practiced prediction model from the test site.

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Application of Neural Inverse Modeling Scheme to Optimal Parameter Tuning of Filter Test Equipment

  • Kim, Sung-Ho;Han, Yun-Jong;Bae, Geum-Dong
    • International Journal of Fuzzy Logic and Intelligent Systems
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    • v.4 no.2
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    • pp.172-175
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    • 2004
  • Generally, the yield rate of semiconductors is the major factor that affects directly the price of semiconductors. For a high yield rate of semiconductors, the air inside clean room is needed to be purified and high efficient filters are used for this. The filter are made of super-fine fiber and certain pinholes can be easily produced on the filter's surface by inadvertent manufacturing. As these pinholes are not easily detected with the bare sight, these pinholes exert a negative impact to filtration performance of the filter. In this research, not only the automatic test equipment for detecting pinholes is proposed, but also inverse modeling scheme based on artificial neural network is applied for tuning of its important parameters.

Precision Position Control of Piezoactuator Using Inverse Hysteresis Model and Neuro-PID Controller (역히스테리시스 모델과 PID-신경회로망 제어기를 이용한 압전구동기의 정밀 위치제어)

  • 김정용;이병룡;양순용;안경관
    • Journal of Institute of Control, Robotics and Systems
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    • v.9 no.1
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    • pp.22-29
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    • 2003
  • A piezoelectric actuator yields hysteresis effect due to its composed ferroelectric. Hysteresis nonlinearty is neglected when a piezoelectric actuator moves with short stroke. However when it moves with long stroke and high frequency, the hysteresis nonlinearty can not be neglected. The hysteresis nonlinearty of piezoelectric actuator degrades the control performance in precision position control. In this paper, in order to improve the control performance of piezoelectric actuator, an inverse modeling scheme is proposed to compensate the hysteresis nonlinearty. And feedforward - feedback controller is proposed to give a good tracking performance. The Feedforward controller is an inverse hysteresis model, base on neural network and the feedback control is implemented with PID control. To show the feasibility of the proposed controller and hysteresis modeling, some experiments have been carried out. It is concluded that the proposed control scheme gives good tracking performance.

Modeling of Indium Tin Oxide(ITO) Film Deposition Process using Neural Network (신경회로망을 이용한 ITO 박막 성장 공정의 모형화)

  • Min, Chul-Hong;Park, Sung-Jin;Yoon, Neung-Goo;Kim, Tae-Seon
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.22 no.9
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    • pp.741-746
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    • 2009
  • Compare to conventional Indium Tin Oxide (ITO) film deposition methods, cesium assisted sputtering method has been shown superior electrical, mechanical, and optical film properties. However, it is not easy to use cesium assisted sputtering method since ITO film properties are very sensitive to Cesium assisted equipment condition but their mechanism is not yet clearly defined physically or mathematically. Therefore, to optimize deposited ITO film characteristics, development of accurate and reliable process model is essential. For this, in this work, we developed ITO film deposition process model using neural networks and design of experiment (DOE). Developed model prediction results are compared with conventional statistical regression model and developed neural process model has been shown superior prediction results on modeling of ITO film thickness, sheet resistance, and transmittance characteristics.