• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.17 no.9 s.112
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• pp.836-844
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• 2006

In this paper, we designed and fabricated the wideband probe with double ridged waveguide for Near-field Measurement. An exponential taper ridge in the rectangular waveguide was implemented for wideband impedance matching. It has wideband characteristics and its measured impedance bandwidth ratio is approximately 2.2:1 from 8.2 GHz to 18 GHz for $VSWR\leq2.2$. It maintains about the same radiation pattern over the entire bandwidth and has more than 4.5 dBi peak radiation gain. Our designed probe was applied to near-field measurement. A good agreement has been found between simulated and measured results.

• Journal of IKEEE
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• v.22 no.2
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• pp.510-513
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• 2018

Recently, EMC (electromagnetic compatibility) becomes very important, which demands the measurement of EMI (electromagnetic interference) in the chip level. NFS (near-field scanning) systems defined in IEC 61967 and IEC 62508 are typical methods to analyze EMI in the chip level. As chips becomes faster, frequency measurement of NFS system should become wideband, but it degrades SNR (singal-to-noise ratio) of the NFP (near-field probe). This paper surveys SNR enhancement technologies of the NFS while maintaining wideband characteristics.