• Proceedings of the Korean Society for Technology of Plasticity Conference
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• 2003.10a
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• pp.339-346
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• 2003

Molecular dynamic simulations of nano indentation on single-crystal silicon (100) surface were performed using diamond indentor. Silicon substrate and diamond indentor were modeled diamond structure with Tersoff potential model. Phase transformation of silicon, incipient plastic deformation, change of incident temperature distribution are investigated through the change of potential energy distribution, displacement-load diagram, the change of kinetic energy distribution and displacements of silicon atoms. Phase transformation is highly localized and consists of a high-density region surrounding the tip. Axial load linearly increased according to the indenting depth. Number of atoms with high kinetic energy increased at the interface between substrate and indentor tip.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.8
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• pp.812-822
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• 2004

This paper shows that carbon nanotubes can be applied to a nanopipette. Nano space in atomic force microscope multi-wall carbon nanotube tips is filled with molecules and atoms with charges and then, the tips can be applied to nanopipette when the encapsulated media flow off under applying electrostatic forces. Since the nano space inside the tips can be refilled, the tips can be permanently used in ideal conditions of no chemical reaction and no mechanical deformation. Molecular dynamics simulations for nanopipette applications demonstrated the possibility of nano-lithography or single-metallofullerene-transistor array fabrication.

• Journal of the Korean Society for Precision Engineering
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• v.21 no.3
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• pp.139-146
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• 2004

In this study, to achieve the optimal conditions for mechanical hyper-fine pattern fabrication process, deformation behavior of the materials during indentation scratch test was studied with numerical method by ABAQUS S/W. Brittle materials (Si, Pyrex glass 7740) were used as specimens, and forming conditions to reduce the elastic recovery and pile-up were proposed. The indenter was modeled as a rigid surface. Minimum mesh sizes of specimens are 1-l0nm. Variables of the nanoindentation scratch test analysis are scratching speed, scratching load, tip radius and tip geometry. The nano-indentation scratch tests were performed by using the Berkovich pyramidal diamond indenter. Comparison between the experimental data and numerical result demonstrated that the FEM approach can be a good model of the nanoindentation scratch test. The result of the investigation will be applied to the fabrication of the hyper-fine pattern.

• Bulletin of the Korean Chemical Society
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• v.35 no.3
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• pp.891-894
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• 2014

The ultrashort electron pulse, laser-emitted from the metal tip apex has been characterized and used as a probing source for a new electron microscope to visualize the morphology of the gold-mesh in the nanometric resolution. As the gap between the tungsten tip and Au-surface is approached within a few nm, the large electromagnetic field enhancement for the incident P-polarized laser pulse with respect to the tip-sample axis is strongly observed. Here, we demonstrate that the time-resolved tip-enhanced electron emission microscope (TEEM) can be implemented on the laboratory table top to give the two-dimensional image, opening lots of challenges and opportunities in the near future.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.11a
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• pp.54-54
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• 2009

AFM anodic oxidation has the capability of patterning complex nano-patterns under relatively high speeds and low voltage. We report the fabrication using a atomic force microscopy (AFM) of silicon nano-ribbon and nano-field effect transistors (FETs). The fabricated nano-patterns have great potential characteristics in various fields due to their interesting electronic, optical and other profiles. The results shows that oxide width and the separation between the oxide patterns can be optimally controlled. The subsequently fabricated silicon nano-ribbon and nano-FET working devices were controled by various tip-sample bias-voltages and scan speed of AFM anodic oxidation. The results may be applied for highly integration circuits and sensitive optical sensor applications.

• Proceedings of the Korean Vacuum Society Conference
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• 2008.02a
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• pp.75-75
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• 2008

• Journal of the Korean Society for Precision Engineering
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• v.21 no.6
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• pp.145-152
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• 2004

Depth-sensing indentation is wifely used for evaluation of mechanical properties of thin films. It is generally accepted that the most significant source of uncertainty in nanoindentation measurement is the geometry of the indenter tip. Therefore the successful application of the technique requires accurate calibration of the indenter tip geometry. The direct measurement of geometry of a Berkovich indenter was determined using a atomic force microscope. The indentation geometrical calibration of contact area was performed by analyzing the indenter tip profile. The equations of area functions were proposed for nanoscale thin films..

• Resources Recycling
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• v.25 no.6
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• pp.41-49
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• 2016

The present study was intended to prepare cobalt oxide ($Co_3O_4$) powder of average particle size 50 nm or less by spray pyrolysis reaction using the raw cobalt chloride ($CoCl_2$) solution, in order to identify the change in the nature of the particles according to the change in the nozzle tip size. When the nozzle tip was 1 mm, it turned out that most of the droplets were spherical and the surface showed very tight structure. The average particle size of the finally formed particles was 20-30 nm. When the nozzle tip size was 2 mm, some of the droplets formed were spherical, but a considerable part of them showed severely disrupted form. particles formed showed an average particle size of 30 - 40 nm. For the nozzle tip size of 5 mm, spherical droplets were almost non-existent and most were in badly fragmented state. The tightness of surface structure of the droplets has greatly been reduced compared with other nozzle tip sizes. Average size of the formed particles was about 25 nm. As the nozzle tip size increased from 1 mm to 2 mm and 3 mm, the intensities of the XRD peaks have changed little, but significantly been reduced when the nozzle tip size increased to 5mm. As the nozzle tip size increased from 1 mm to 2 mm, the specific surface area of the particles decreased, but the nozzle tip size increased to 5mm, the specific surface area remarkably increased.

• Proceedings of the KSME Conference
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• 2008.11a
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• pp.260-263
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• 2008

The bending test of an individual ZnO nanorod was performed with a nano-manipulator and a force sensor inside the scanning electron microscope (SEM), and the bending properties of ZnO nanorod were also discussed. The ZnO nanorod used in this experiment was fabricated by means of solution base process. The force sensor used for bending test of ZnO nanorod was typed with cantilever. The force sensor was mounted on the nano-manipulator. The nano-manipulator was controlled and manipulated by a personal computer. The each end of an individual ZnO nanorod was attached on the rigid support and the tip of the force sensor with an electron beam exposure, and then the bending test was carried out by controlling of the nano-manipulator. The bending modulus of a ZnO nanorod was calculated at 69.35GPa after the bending test.

• Resources Recycling
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• v.13 no.6
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• pp.16-25
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• 2004

In this study, nano-sized indium oxide powder with the average particle size below 100 nm is prepared from the indium chloride solution by the spray pyrolysis process. The effects of the concentration of raw material solution, the nozzle tip size and the air pressure on the properties of powder were studied. As the indium concentration of the raw material solution increased from 40 g/l to 350 g/l, the average particle size of the powder gradually increased from 20 nm to 60 nm, yet the particle size distribution appeared more irregular, the intensity of a XRD peak increased and specific surface area decreased. As the nozzle tip size increased from 1 nm to 5 nm, the average particle size of the powder increased from 40 nm to 100 nm, the particle size distribution was much more irregular, the intensity of a XRD peak increased and specific surface area decreased. As the air pressure increased from 0.1 kg/cm$^2$ to 0.5 kg/cm$^2$, the average particle size of the powder varies slightly upto 90~100 nm. As the air pressure increased from 1 kg/cm$^2$ to 3 kg/cm$^2$, the average particle size decreased upto 50~60 nm, the intensity of a XRD peak decreased and the specific surface area increased.