• Journal of the Korean Society for Precision Engineering
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• v.32 no.10
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• pp.911-916
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• 2015

In the nano/micro scale, material properties are dependent on the size-scale of a structure. However, conventional micro-scale tensile tests have limitations to obtain reliable values of nano-scale material properties owing to residual stress and elastic slippage in the gripping/aligning process. The indenter-driven nano-scale tensile test provides prominent advantages simple testing device, high-quality nano-scale metallic specimen with negligible residual stress. In this paper, two-types of specimens (a specimen with multi-testing parts and a specimen with a single-testing part) are discussed. Focused ion beam (FIB) is employed to fabricate a nano-scale specimen from a thin nickel film. Using the specimen with a single-testing part, we obtained a nano-scale stress-strain curve of electroplated nickel film.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.08a
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• pp.216.1-216.1
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• 2013

PZT 박막은 강유전 특성과 압전소자 특성을 나타내는 물질로 DRAM (dynamic random acess memory)과 FRAM (ferroelectric RAM) 등의 기억소자용 capacitor와 MEMS (micro electro mechanical system) 소자의 압전 물질로 사용하기 위한 연구가 진행중에 있다. 하지만 이러한 연구에서는 PZT 박막의 전기적 특성 향상을 주목적으로 연구가 진행되어 왔다. 특히, 박막 공정중 발생하는 plasma에 의한 PZT의 전기적 특성 변화가 박막 표면의 물리적 변화에 기인할 것으로 추정하고 있지만 이에 대한 구체적인 연구는 미비하다. 이 연구에서는 plasma에 의한 PZT 박막 표면의 물리적 특성 변화를 연구하기 위하여 PZT 박막을 sol-gel을 이용하여 Si 기판위에 약 100 nm의 두께로 증착하였으며, 이후 최대 300 W의 Ar plasma로 plasma power을 증가시켜 각각 10분간 plasma처리를 실시하였다. PZT 박막 표면의 nano-mechanics 특성을 분석하기 위하여 Nano-indenter와 Kelvin Probe Force Microscopy (KPFM)을 사용하여 surface hardness, surface morphology를 확인하였고 특히, surface potential 분석을 통하여 PZT 박막 표면의 plasma에 의한 박막 극 표면의 전기적 특성 변화를 연구하였다. 이 연구로 plasma에 의한 PZT 박막은 표면으로부터 최대 43 nm 깊이에서의 hardness는 최대 5.1 GPa에서 최소 4.3 GPa의 분포로 plasma power 변화에 의한 특성은 측정 불가능하였다. 이는 plasma에 의한 영향이 시료 극 표면에 국한되어 나타나기 때문으로 추정되며 이를 보완하기 위하여 surface potential을 분석하였다. 결과에 의하면 plasma power가 0 W에서 300 W로 증가함에 따라 potential이 30 mV에서 -20 mV로 감소하였으나 potential의 분산은 100 W에서 최대인 17 mV로 측정되었으며, 이때 RMS roughness역시 가장 높은 20.145 nm로 측정되었다. 특히, 100 W에서 potential에서는 물결 모양과 같은 일정한 패턴의 potential 무늬가 확인되었다.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.38 no.9
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• pp.943-951
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• 2014

The tip geometries of the pyramidal and conical indenters used for micro/nano-indentation tests are not sharp. They are inevitably rounded because of their manufacturability and wear. In many indentation studies, the tip geometries of the pyramidal indenters are simply assumed to be spherical, and the theoretical solution for spherical indentation is simply applied to the geometry at a shallow indentation depth. This assumption, however, has two problems. First, the accuracy of the theoretical solution depends on the material properties and indenter shape. Second, the actual shapes of pyramidal indenter tips are not perfectly spherical. Hence, we consider the effects of these two problems on indentation tests via finite element analysis. We first show the relationship between the Poisson's ratio and load-displacement curve for spherical indentation, and suggest improved solutions. Then, using a possible geometry for a Berkovich indenter tip, we analyze the characteristics of the load-displacement curve with respect to the indentation depth.

• Proceedings of the KSME Conference
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• 2003.04a
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• pp.1104-1110
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• 2003

There are many applications of nanostructures, have been suggested by lots of researchers. It is highly required to measure the properties of nano-sized materials for design and fabrication of the nanostructures. In this paper, several techniques for measuring the mechanical properties of nano-structures are presented laying emphasis on the activity of Nano Property Measurement Team in KIMM. Some advanced applications of nano-indenter are described for measuring elastic, visco-elastic, frictional and adhesive properties as well as the standard methods of it. Micro-tensile test technique with accurate in-plane strain measurement method is also presented and its role in the property measurement of nanostructures is discussed.

• Proceedings of the Korean Society for Technology of Plasticity Conference
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• 2004.05a
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• pp.148-151
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• 2004

Mechanical properties such as Young's modulus and hardness of thin film in coated steel are difficult to determine by nano-indentation from the conventional analysis using the load-displacement curve. Therefore, an analysis of the nano-indentation loading curve was used to determine the Young's modulus, hardness and strain hardening exponent. A new method is recently being developed for plasticity properties of materials from nano-indentation. Elastic modulus of the thin films shows relatively small influence whereas yield strength and strain hardening are found to have significant effect on measured data. The load-displacement behavior of material tested with a Berkovich indenter and nano-indentation continuous stiffness method is used to measure the modulus and hardness through thin films.

• Transactions of Materials Processing
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• v.13 no.8
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• pp.731-737
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• 2004

Mechanical properties such as Young's modulus and hardness of thin film in coated steel are difficult to determine by nano-indentation from the conventional analysis using the load-displacement curve. Therefore, an analysis of the nano-indentation loading-unloading curve was used to determine the Young's modulus, hardness. A new method is recently being developed for elastic-plastic properties of materials from nano-indentation. Elastic modulus of the thin films shows relatively small influence whereas yield strength is found to have significant effect on measured data. The load-displacement curves of material tested with a Berkovich indenter and nano-indentation continuous stiffness method is used to measure the modulus and hardness through thin films, and then these are computed using the analysis procedure. The developed neural networks apply also to obtain reliable mechanical properties.

• Proceedings of the KSME Conference
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• 2004.04a
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• pp.246-251
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• 2004

Nano-indentation is used for measuring mechanical properties of thin films such as elastic modulus and hardness. For ductile materials, pile-up around the indenter causes the calculation of inaccurate projected contact area. This phenomenon was found by measurement of indentation shape using an atomic force microscope. In present study finite element analysis of nano-indentation was performed to compensate the effects of pile-up on the contact area. The result of finite element analysis was compared with that of nano-indentation for a ductile material. The analysis has demonstrated that the true contact area is greater than that calculated by nano-indentation. It is verified that the consideration of the effects of pile-up in nanoindentation for ductile materials using the finite element method is reasonable.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.08a
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• pp.224-224
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• 2011

OLED (Organic Light-Emitting Diode) 디스플레이에서는 반사율이 가장 높은 silver (Ag)가 쓰이고 있지만, 소자에서 요구되는 일함수의 불일치 때문에 전극과 유기물간에 에너지 장벽이 발생하여 발광효율을 낮추는 요인이 되고 있다. 본 논문에서는 Ag 전극의 work function을 조절하기 위한 연구를 진행하였다. Ag를 rf magnetron sputter를 이용해 glass위에 증착한 후 furnace에서 300$^{\circ}C$, 30분간 공기중에서 열처리 하였고. 또 다른 샘플은 산소분위기에서 표면에 상압플라즈마로 처리 시간(30, 60, 90, 120 sec)을 각기 다르게 하여 샘플을 제조하였다. Ag전극은 Nanoindentation을 통해 국부 영역에 대한 물리적 특성의 변화를 측정하였고 Kelvin Probe Force Microscopy (KPFM)을 이용해 샘플의 포텐셜을 측정했다. 그 결과 열처리한 샘플은 포텐셜값은 가장 커졌지만 균일도가 낮아졌다. 30 sec, 120 sec 플라즈마 처리한 샘플은 탄성계수, 경도값, 및 Weibull modulus를 극히 낮게 만들었지만 60s, 90s 플라즈마 처리는 샘플의 경도값 균일도를 증가시켰다.

• Journal of the Korean Vacuum Society
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• v.17 no.6
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• pp.544-548
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• 2008

At the semiconductor industry, Photoresist(PR) strip progress has high cost and time consuming process. Accordingly, many research group have been focused on the shortening of the PR strip progress. But the replacements of newly developed materials rather than normally used strip have accompanied by cost consumption. Therefore, we suggested the Plasma Liquid-Vapor Activation (PLVA) method of general PR strip solution for saving the PR strip time and the high strip rate of PR residue. The PLVA method was very effective for PR strip progress. Also, the ion damaged PR(high dose implanted photoresist: HDI-PR) was almost impossible to strip. However, it was very difficult to characterize the change of chemical composition of HDI-PR between with and without PLVA method. Thus, physical properties of HDI-PR surface with and without PLVA method were measured by using the nano-indenter system.

• Journal of the Korean Society for Precision Engineering
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• v.22 no.10 s.175
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• pp.167-173
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• 2005

The Berkovich nano-indentation is an indentation test method analyzing mechanical properties of materials such as hardness and elastic modulus. The length scale of the penetration is measured in nanometers. Therefore, this method becomes widely useful for analyzing the mechanical property of thin film which can not be measured before. In this paper, comparing two results of the load-displacement curve obtained by the Berkovich nano-indentation and the 3-D finite element analysis, it was confirmed that the 3-D finite element analysis is useful. The phenomenon of pile-up and sink-in due to material properties was discussed by the finite element analysis.