• Title/Summary/Keyword: Nano Resolution

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Confocal Scanning Microscopy : a High-Resolution Nondestructive Surface Profiler

  • Yoo, Hong-Ki;Lee, Seung-Woo;Kang, Dong-Kyun;Kim, Tae-Joong;Gweon, Dae-Gab;Lee, Suk-Won;Kim, Kwang-Soo
    • International Journal of Precision Engineering and Manufacturing
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    • v.7 no.4
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    • pp.3-7
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    • 2006
  • Confocal scanning microscopy is a measurement technique used to observe micrometer and sub-micrometer features due to its high resolution, nondestructive properties, and 3D surface profiling capabilities. The design, implementation, and performance test of a confocal scanning microscopy system are presented in this paper. A short-wavelength laser (405 nm) and an objective lens with a high numerical aperture (0.95) were used to achieve the desired high resolution, while the x- and y-axis scans were implemented using an acousto-optic deflector and galvanomirror, respectively. An objective lens with a piezo-actuator was used to scan the z-axis. A spatial resolution of less than 138 nm was achieved, along with successful 3D surface reconstructions.

Technology Trend on Innovation of Control System by IT-fusion and Implementation of Nano-level Accuracy for Nano Control Systems (제어 시스템의 IT 융합을 통한 성능 향상과 나노 정밀도 구현 기술 동향)

  • Kim C.B.;Kim K.D.
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2005.06a
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    • pp.240-245
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    • 2005
  • In order to implement nano-level accuracy of precision equipments, a nano control system is one of the key components. The control system consists of a controller, actuators and sensors having nano-level resolution. In this paper, application area and technical trend on the nano control system are introduced. Some required techniques for realizing nano-level resolution of a controller or actuator are presented. Technical innovation of a control system by IT-fusion and its effect are also described. Finally, domestic research activities for development of the IT-based nano control system are introduced.

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Thermal Design and On-Orbit Thermal Analysis of 6U Nano-Satellite High Resolution Video and Image (HiREV) (6U급 초소형 위성 HiREV(High Resolution Video and Image)의 광학 카메라의 열 설계 및 궤도 열 해석)

  • Han-Seop Shin;Hae-Dong Kim
    • Journal of Space Technology and Applications
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    • v.3 no.3
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    • pp.257-279
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    • 2023
  • Korea Aerospace Research Institute has developed 6U Nano-Satellite high resolution video and image (HiREV) for the purpose of developing core technology for deep space exploration. The 6U HiREV Nano-Satellite has a mission of high-resolution image and video for earth observation, and the thermal pointing error between the lens and the camera module can occur due to the high temperature in camera module on mission mode. The thermal pointing error has a large effect on the resolution, so thermal design should solve it because the HiREV optical camera is developed based on commercial products that are the industrial level. So, when it operates in space, the thermal design is needed, because it has the best performance at room temperature. In this paper, three passive thermal designs were performed for the camera mission payload, and the thermal design was proved to be effective by performing on-orbit thermal analysis.

Method for Locating Arc-events by Utilizing Transmission Loss of Plastic Optical Fiber (플라스틱 광섬유의 손실 특성을 활용한 아크플래시 위치추적 방법)

  • Jeong, Hoonil;Kim, Young Ho;Kim, Youngwoong;Rho, Byung Sup;Kim, Myoung Jin
    • Journal of Sensor Science and Technology
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    • v.25 no.4
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    • pp.280-284
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    • 2016
  • For an arc-flash protection system, the selection of arc-flash sensor in implementation is largely dependent on the coverage area and the spatial resolution. Typically, a point sensor is used to accurately measure an arc event within a very narrow region; whereas, a loop or a line sensor can cover several electrical compartment at the same time, but with a poor resolution. In this work, a novel scheme for an arc-flash sensor was developed by making use of the transmission loss of plastic optical fibers (POFs) to cover a broad range with a high spatial resolution. By relating the amplitude ratio of the arc-signals at the ends of the POF with the arc-location, arc events could be located with a resolution of ~5 cm within a spatial range of 10 m, which has not been reported yet.

Lateral Resolution Enhancement in Confocal Self-interference Microscopy with Commercial Calcite Plate

  • Kang DongKyun;Yoo HongKi;Lee SeungWoo;Gweon Dae-Gab
    • Journal of the Optical Society of Korea
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    • v.9 no.1
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    • pp.32-35
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    • 2005
  • In light microscopy, spatial resolution is limited by diffraction effect. Confocal microscopy has improved resolutions in both lateral and axial directions, but these are still limited by diffraction effect. Confocal self-interference microscopy (CSIM) uses interference between two perpendicularly polarized beams to enhance lateral resolution. In previous research, we proposed a calcite plate with its optic-axis perpendicular to the propagation angle and one of the boundary surfaces of the plate. This type of plate is not widely used to our knowledge. In this paper, we change the calcite plate to more common one, which is commercially available. This calcite plate has its optic axis in the plane of incidence. We analyze the characteristics of this calcite plate and numerically compare the performances of CSIM in previous research and CSIM with the commercial calcite plate. Numerical results show improved performance when using the commercial calcite plate

Scanning Nonlinear Dielectric Microscopy : Overview -A High Resolution Tool for Observing Ferroelectric Domains and Nano-domain Engineering-

  • Cho, Yasuo
    • Journal of the Korean Ceramic Society
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    • v.40 no.11
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    • pp.1047-1057
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    • 2003
  • A sub-nanometer resolution Scanning Nonlinear Dielectric Microscope (SNDM) was developed for observing ferroelectric polarization. We also demonstrate that the resolution of SNDM is higher than that of a conventional piezo-response imaging. Secondly, we report new SNDM technique detecting higher nonlinear dielectric constants $\varepsilon$$\_$3333/ and $\varepsilon$$\_$33333/. Higher order nonlinear dielectric imaging provides higher lateral and depth resolution. Finally, the formation of artificial small inverted domain is reported to demonstrate that SNDM system is very useful as a nano-domain engineering tool. The nano-size domain dots were successfully formed in LiTaO$_3$ single crystal. This means that we can obtain a very high density ferroelectric data storage with the density above 1T-bits/inch$^2$.

A High-Lateral Resolution MALDI Microprobe Imaging Mass Spectrometer Utilizing an Aspherical Singlet Lens

  • Han, Sang Yun;Kim, Hwan Jin;Ha, Tae Kyung
    • Bulletin of the Korean Chemical Society
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    • v.34 no.1
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    • pp.207-210
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    • 2013
  • We report the construction of a MALDI imaging mass spectrometer equipped with a specially designed laser focusing lens, a compact aspherical singlet lens, that obtains a high-lateral imaging resolution in the microprobe mode. The lens is specially designed to focus the ionization laser (${\lambda}$ = 355 nm) down to a $1{\mu}m$ diameter with a long working distance of 34.5 mm. With the lens being perpendicular to the sample surface and sharing the optical axis with the ion path, the imaging mass spectrometer achieved an imaging resolution of as good as $5{\mu}m$ along with a high detection sensitivity of 100 fmol for peptides. The mass resolution was about 900 (m/${\Delta}m$) in the linear TOF mode. The high-resolution capability of this instrument will provide a new research opportunity for label-free imaging studies of various samples including tissues and biochips, even for the study at a single cell level in the future.

Development of Ultra-precision Positioning Technology Using High-resolution Interpolation Algorithm (고체배 알고리즘을 이용한 초정밀 위치즉정기술 개발)

  • 이종혁;배준영;이상룡
    • Journal of the Korean Society for Precision Engineering
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    • v.21 no.11
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    • pp.117-124
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    • 2004
  • Recently, nano-methodology is increasingly important as the ruler for measuring nano-technology, and we applied the linear encoder to nano-methodology. The quadrature output in the linear encoder has an effect on increasing the resolution in some techniques. Already, various interpolation techniques based on the quadrature signal have applied to the precision servo system. In this paper, we propose a new interpolation algorithm for ultra-precision positioning in the low speed with simulation by MATLAB SIMULINK. This method modified previous methods and was properly designed for some given control system. To verify, we first fulfilled the encoder signal test to find main parameters fer the signal transformation, then we proved the proposed interpolation algorithm by experiments, which show that the result of the interpolation algorithm corresponds with the measurement of the laser interferometer in 100 nm unit approximately. In addition, we can get more precise measurement by more accurate and noise-free signal. So we need to compensate imperfections in the encoder signal. After that, we will apply this algorithm to nano positioning system.

The Minimization of Residual Layer Thickness by using optimized dispensing method in UVnanoimprint Lithography Process (UV 나노임프린트 리소그래피 공정에서 레지스트 도포의 최적화를 통한 잔류층 두께의 최소화)

  • Kim K.D.;Jeong J.H.;Sim Y.S.;Lee E.S.;Kim J.H.;Cho Y.K.;Hong S.C.
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2005.06a
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    • pp.633-636
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    • 2005
  • Imprint lithography is a promising method for high-resolution and high-throughput lithography using low-cost equipment. As with other nanoimprint methods, ultraviolet-nanoimprint lithography (UV-NIL) resolution appears to be limited only by template resolution, and offers a significant cost of ownership reduction when compared to other next generation lithography (NGL) methods such as EUVL and 157 nm lithography. The purpose of this paper is to suggest optimum values of control parameters of Imprio 100 manufactured by Molecular Imprint, Inc., which is the first commercially available UV-NIL tool, for sound nanoimprint. UV-NIL experiments were performed on Imprio 100 to find dispensing recipe for avoiding air entrapment. Dispensing recipe related to residual layer thickness and uniformity was optimized and 40 nm thick residual layer was achieved.

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