• Title/Summary/Keyword: Mura

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Adaptive Multi-threshold Based Mura Detection on A LCD Panel (적응적 임계화법에 기반한 LCD 얼룩 검사)

  • 류재승;곽동민;박길흠
    • Proceedings of the IEEK Conference
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    • 2003.11a
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    • pp.347-350
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    • 2003
  • In this paper, a new automated defects detection method for a TFT-LCD panel is presented. An input image is preprocessed to lessen small abnormal noises and non-uniformity of the image. The adaptive multi-thresholds are used to detect Muras, which are the major defects occurred on TFT-LCD panels. Those are determined adaptively depending on the brightness and the brightness distribution of a local block. For the synthetic images and real Mura images, the proposed algorithm can effectively detect Muras in a reasonable time.

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Multi-unit risk assessment of nuclear power plants: Current status and issues

  • Yang, Joon-Eon
    • Nuclear Engineering and Technology
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    • v.50 no.8
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    • pp.1199-1209
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    • 2018
  • After the Fukushima-Daiichi accident in 2011, the multi-unit risk, i.e., the risk due to several nuclear power plants (NPPs) in a site has become an important issue in several countries such as Korea, Canada, and China. However, the multi-unit risk has been discussed for a long time in the nuclear community before the Fukushima-Daiichi nuclear accident occurred. The regulatory authorities around the world and the international organizations had proposed requirements or guidelines to reduce the multi-unit risk. The concerns regarding the multi-unit risk can be summarized in the following three questions: How much the accident of an NPP in a site affects the safety of other NPPs in the same site? What is the total risk of a site with many NPPs? Will the risk of the simultaneous accidents at several NPPs in a site such as the Fukushima Daiichi accident be low enough? The multi-unit risk assessment (MURA) in an integrated framework is a practical approach to obtain the answers for the above questions. Even though there were few studies to assess the multi-unit risk before the Fukushima-Daiichi nuclear accident, there are still several issues to be resolved to perform the complete MURA. This article aims to provide an overview of the multi-unit risk issues and its assessment. We discuss the several critical issues in the current MURA to get useful insights regarding the multi-unit risk with the current state art of probabilistic safety assessment (PSA) technologies. Also, the qualitative answers for the above questions are addressed.

Estimation of 222Rn Concentration in the Lower Troposphere during Precipitation Using Wet Scavenging Model for its Decay Products

  • Takeyasu, Masanori;Takeishi, Minoru
    • Asian Journal of Atmospheric Environment
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    • v.4 no.1
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    • pp.20-25
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    • 2010
  • The gaseous $^{222}Rn$ concentration at the level of clouds was estimated by using the wet scavenging model of its decay products with the observed data of environmental radiation at the ground. And the origin of the $^{222}Rn$ was also discussed. The estimation was done for a precipitation event on Dec. 26-27, 2003, when a large increase of the radiation was observed in Tokai-mura in Ibaraki, Japan. From a backward trajectory analysis, the origin of $^{222}Rn$ atoms for that event was traced back to the northeastern part of China, and it was expected that the large amount of $^{222}Rn$ emitted in the northeastern part of China was transported to Tokai-mura by the Eurasian continental air mass.

The Analysis of Yellowish Gravity-Mura in FFS Mode

  • Park, J.B.;Park, E.J.;Park, S.H.;Park, I.C.;Kim, H.Y.;Lee, K.H.;Lee, J.Y.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.780-783
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    • 2006
  • In this paper, we confirmed the yellowish gravity-mura phenomenon in Fringe-Field Switching (FFS) mode using 2-D simulation. As the cell gap increases, while the LC efficiency of blue wavelength remains almost same, that of red and green wavelength increases continuously. As a result, yellowish phenomenon occurs.

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Regional Revitalization and Settlement Improvement from the point of view of the Local Residents - A Case Study on the Nakathu-Mura of Wakayama Prefecture in Japan - (지역주민의 시각에 의한 정주환경개선과 지역활성화 - 일본 와카야마현 나카츠무라를 중심으로 -)

  • Kim, Young-Joo;Choi, Soo-Myung;TAKAHASHI, Tsuyoshi
    • Journal of Korean Society of Rural Planning
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    • v.10 no.3 s.24
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    • pp.19-26
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    • 2004
  • In this study, a new model for improving the settlement environment and revitalizing hilly and mountainous areas was presented. A case study was conducted in two rural villages of Nakatsu-Mura in Wakayama-Prefecture, Japan. The settlement environment was evaluated from the point of view of the local residents, and the expectation of the local residents about the regional revitalization of their village in the future was assessed. From the analysis, each factor used far the assessment displayed characteristics of the two rural villages well. The type of improvement in rural villages was classified by a combination of the degree of satisfaction over the current settlement environment and expectation about the regional revitalization of the villages in the future. A method for improving and revitalizing settlement environments was clarified.

Color and Luminance Compensation for Large AMOLEDs

  • Park, Kyong-Tae;Arkipov, Alexander;Lee, Baek-Woon;Kim, Seon-Min
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.850-853
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    • 2009
  • Many well-known pixel compensation circuits have been applied to control TFT $V_{th}$ variations on small size AMOLED panels. For large (>30-inch) AMOLEDs, luminance and color uniformity are affected by TFT variations, but also by ELVDD IR drop and cavity non-uniformity which are not easily compensated by in-pixel circuits. AMOLED panels may also suffer from manufacturing-induced mura. An external compensation method based on optical measurements is proposed and applied to large AMOLED panels. It improves luminance uniformity by up to 95% at 200nits and color uniformity by up to 99% (${\Delta}$u'v' <0.004) on large AMOLED panels, and provides-increased margin against processinduced mura.

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NUMERICAL ANALYSIS FOR CONDUCTION HEAT TRANSFER AND APPRAISAL OF PERFORMANCE INDICES IN LED MONITOR FOR LAPTOP COMPUTER (노트북 LED 영상장치 내부의 전도열전달 해석과 성능 지수 평가)

  • Park, I.S.;Sohn, C.H.;Son, D.H.;Baik, S.M.;Park, C.
    • Journal of computational fluids engineering
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    • v.16 no.3
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    • pp.47-51
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    • 2011
  • Dark Mura phenomena which can happen at the region with high temperature gradient in a Notebook LCD Monitor using LED light source has numerically been studied. The calculation was conducted under the nearly realistic conditions by considering the anisotropic thermal properties of materials and the real dimensions of each component. The two performance indices of LED monitor, i.e., the maximum temperature and the spacial gradient of temperature were examined for the various shapes, lengths and thickness of heat sink plate. Calculated results give more reasonable temperature distribution comparing with experimental results.

Comparison of Model Fitting & Least Square Estimator for Detecting Mura (Mura 검출을 위한 Model Fitting 및 Least Square Estimator의 비교)

  • Oh, Chang-Hwan;Joo, Hyo-Nam;Rew, Keun-Ho
    • Journal of Institute of Control, Robotics and Systems
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    • v.14 no.5
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    • pp.415-419
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    • 2008
  • Detecting and correcting defects on LCD glasses early in the manufacturing process becomes important for panel makers to reduce the manufacturing costs and to improve productivity. Many attempts have been made and were successfully applied to detect and identify simple defects such as scratches, dents, and foreign objects on glasses. However, it is still difficult to robustly detect low-contrast defect region, called Mura or blemish area on glasses. Typically, these defect areas are roughly defined as relatively large, several millimeters of diameter, and relatively dark and/or bright region of low Signal-to-Noise Ratio (SNR) against background of low-frequency signal. The aim of this article is to present a robust algorithm to segment these blemish defects. Early 90's, a highly robust estimator, known as the Model-Fitting (MF) estimator was developed by X. Zhuang et. al. and have been successfully used in many computer vision application. Compared to the conventional Least-Square (LS) estimator the MF estimator can successfully estimate model parameters from a dataset of contaminated Gaussian mixture. Such a noise model is defined as a regular white Gaussian noise model with probability $1-\varepsilon$ plus an outlier process with probability $varepsilon$. In the sense of robust estimation, the blemish defect in images can be considered as being a group of outliers in the process of estimating image background model parameters. The algorithm developed in this paper uses a modified MF estimator to robustly estimate the background model and as a by-product to segment the blemish defects, the outliers.

Image Restoration for Detecting Muras in TFT-LCD Panels (TFT-LCD 패널의 불량 검출을 위한 영상 복원)

  • Choi, Kyu-Nam;Yoo, Suk-I.
    • Journal of KIISE:Software and Applications
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    • v.34 no.11
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    • pp.953-960
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    • 2007
  • To correctly detect muras, visual defects in TFT-LCD panels, image distortion occurring on the profess of capturing panels should be corrected. In general vision systems, there are several known methods to restore the observed image. However, the vignetting effect particularly shown only in panel images cannot be easily restored through traditional methods because it is combined with background non-uniformity due to the unique characteristic of panel. To increase the reliability of image restoration, the vignetting effect should be properly corrected after being separated from image background. Therefore, in this paper we present a new method to analyze and correct the vignetting effect of panel images using principal component analysis. Experimental results for a total of 175 test images showed that the average contrast error of the muras in the distorted images was reduced from 37% to 11% and the mura misidentification rate was decreased from 14.8% to 2.2% by image restoration.