Dielectric functions of $Cd_{1-x}Mg_xTe(0\leqx\leq0.43)$ alloy films studied by ellipsometry
(타원편광분석기를 이용한 $Cd_{1-x}Mg_xTe(0\leqx\leq0.43)$ 박막 화합물의 유전율 함수 연구)
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- Journal of the Korean Vacuum Society
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- v.9 no.3
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- pp.254-257
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- 2000