• Title/Summary/Keyword: Multi-level cell

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Performance of the Maximum-Likelihood Detector by Estimation of the Trellis Targets on the Sixteen-Level Cell NAND Flash Memory (16레벨셀 낸드 플래시 메모리에서 트렐리스 정답 추정 기법을 이용한 최대 유사도 검출기의 성능)

  • Park, Dong-Hyuk;Lee, Jae-Jin
    • Journal of the Institute of Electronics Engineers of Korea TC
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    • v.47 no.7
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    • pp.1-7
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    • 2010
  • In this paper, we use the maximum-likelihood detection by the estimation of trellis targets on the 16-level cell NAND flash memory. This mechanism has a performance gain by using a maximum-likelihood detector. The NAND flash memory channel is a memory channel because of the coupling effect. Thus, we use the known data arrays to finding the targets of trellis. The maximum-likelihood detection by proposed scheme performs better than the threshold detection on the 16-level cell NAND flash memory channel.

Multi-Level Study for Adaptation Service of 3D Graphics Contents in Ubiquitous Environment (유비쿼터스 환경에서 다중레벨 3D 그래픽 콘텐츠의 적응 서비스를 위한 미들웨어 연구)

  • Kim, Hak-Ran;Park, Hwa-Jin;Yoon, Yong-Ik
    • Journal of Digital Contents Society
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    • v.8 no.2
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    • pp.245-253
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    • 2007
  • Recently, the use and application of computer graphics in the mobile and ubiquitous environment are growing. Real-time rendering and modeling for computer graphics are due to system performance, there're lots of limitation in lower system such as PDA and cell phone etc. Therefore, we suggested the intelligent Serving Rendering Middleware which is to provide adaptation service of computer graphics contents fit to user's environment real-time whatever environment the users are in. The Service Rendering Middleware needs multi-level configurations and applications, so, in this paper we propose multi-level algorithm to decide adaptation levels are deal with separately according to device performance.

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A study on a digital load cell for the removal of load cell noise (Load Cell Noise 제거를 위한 Digital Load Cell 에 대한 연구)

  • Lee, Young-Jin;Lee, Heung-Ho
    • Proceedings of the KIEE Conference
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    • 2002.11c
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    • pp.562-564
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    • 2002
  • Noise reduction and a simplification of a precision measurement system has been performed by changing analog output mode of a load cell into digital output mode. Usually, analog output signal of a few $\mu V$ from a load cell are amplified by amp and acquired by A/D converter. If the distance from a load cell to a DAS(Data Acquisition System) increases, more noise signals are mixed. So, a microprocessor has been integrated into a load cell so that the amplification and A/D conversion of output signals could be done in close proximity to the lode cell for the reduction in mixing of noise. Obtained data from the load cell like this manner are transferred to a computer with digital values(of TTL level). To simplify the configuration of a multi-channel DAS, RS-485 communication system has used for data transfer.

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An Empirical Study on Linux I/O stack for the Lifetime of SSD Perspective (SSD 수명 관점에서 리눅스 I/O 스택에 대한 실험적 분석)

  • Jeong, Nam Ki;Han, Tae Hee
    • Journal of the Institute of Electronics and Information Engineers
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    • v.52 no.9
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    • pp.54-62
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    • 2015
  • Although NAND flash-based SSD (Solid-State Drive) provides superior performance in comparison to HDD (Hard Disk Drive), it has a major drawback in write endurance. As a result, the lifetime of SSD is determined by the workload and thus it becomes a big challenge in current technology trend of such as the shifting from SLC (Single Level Cell) to MLC (Multi Level cell) and even TLC (Triple Level Cell). Most previous studies have dealt with wear-leveling or improving SSD lifetime regarding hardware architecture. In this paper, we propose the optimal configuration of host I/O stack focusing on file system, I/O scheduler, and link power management using JEDEC enterprise workloads in terms of WAF (Write Amplification Factor) which represents the efficiency perspective of SSD life time especially for host write processing into flash memory. Experimental analysis shows that the optimum configuration of I/O stack for the perspective of SSD lifetime is MinPower-Dead-XFS which prolongs the lifetime of SSD approximately 2.6 times in comparison with MaxPower-Cfq-Ext4, the best performance combination. Though the performance was reduced by 13%, this contributions demonstrates a considerable aspect of SSD lifetime in relation to I/O stack optimization.

A Hierarchical Preamble Design Technique for Efficient Handover in OFDM-based Multi-hop Relay Systems (OFDM 기반 다중 홉 릴레이시스템에서 효율적인 핸드오버를 위한 계층적 프리앰블 설계 기법)

  • Yoo, Hyun-Il;Kim, Yeong-Jun;Woo, Kyung-Soo;Kim, Jae-Kwon;Yun, Sang-Boh;Cho, Yong-Soo
    • The Journal of Korean Institute of Communications and Information Sciences
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    • v.33 no.4A
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    • pp.342-351
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    • 2008
  • In this paper, a new handover procedure for OFDM-based multi-hop relay systems is proposed to reduce the handover overhead by distinguishing inter-cell handover event from intra-cell handover event at the level of physical layer using a hierarchical design concept of preamble. A Subcell ID concept for identifying RS in a cell is proposed in the design of hierarchical manner, in addition to the existing Cell ID for identifying BS. The decision on either inter-cell handover or intra-cell handover is made by the signal quality measure of CBINR(Carrier of BS to Interference and Noise Ratio) and CRINR(Carrier of RS to Interference and Noise Ratio), provided by the hierarchical preamble. The proposed handover procedure can simplify scanning procedure and skip/simplify network re-entry procedure (capability negotiation, authorization, registration), resulting in a significant reduction of handover overhead.

A Scheme for Reuse of Residual Energy in a Multi-cell Battery System (다중전지 시스템에서 잔류 에너지의 재활용 방법)

  • Yun, Woong-Jin;Baek, Je-In
    • Journal of the Institute of Electronics Engineers of Korea SC
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    • v.46 no.6
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    • pp.21-27
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    • 2009
  • As portable electronic systems being used more often, it becomes a more important issue to lengthen the lifetime of the power battery of the system, for instance, by developing batteries of a higher efficiency. A simple as well as practical method to lengthen the lifetime is to use multiple batteries that are connected in parallel. But in this paper we present a new idea in using multiple batteries, with which the residual energy of the battery can be used in the sense of recycling. The idea is based on a usual phenomenon that a battery cell that has been used until its voltage has dropped below a reference level may still have some residual energy, due to which the voltage can recover when the cell takes a rest for a while. As a practical realization scheme of this idea, a multi-cell configuration method with a cell selection switch is introduced, and its feasibility has been examined by performing experimental observations on the behavior of battery discharge. It has been found that the lifetime of an Alkaline primary battery cell can be lengthened approximately by one or two hours with the proposed method.

Flow analysis of the Hydrogen Recirculation System for Fuel Cells (연료전지 수소 재순환 시스템의 유동해석)

  • Kim, Jae-Choon;Lee, Yong-Taek;Chung, Jin-Taek;Kim, Yong-Chan;Hwang, In-Chul
    • 유체기계공업학회:학술대회논문집
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    • 2005.12a
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    • pp.759-764
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    • 2005
  • In this paper, numerical analysis of hydrogen recycle system has been conducted in order to enhance the efficiency of automotive fuel cell. Generally, the excess hydrogen is provided in the automotive fuel cell. Since the non-reaction hydrogen reduces automotive fuel cell efficiency, reuse of the non-reaction hydrogen can be helpful to improve the fuel cell performance. In case of PEM FC, the water vapor is provided to hydrogen from the cathode so that the mixture experiences phase change depending on the changes of pressure and temperature. The internal flow of the mixture in the hydrogen recirculation system of fuel cell was investigated for real flow conditions. The variation of performance, properties and mass fractions of mixture, hydrogen and water-vapor were investigated. This study was performed based on 80KW level automotive fuel cell's recycling system.

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An Efficient Resource Optimization Method for Provisioning on Flash Memory-Based Storage (플래시 메모리 기반 저장장치에서 프로비저닝을 위한 효율적인 자원 최적화 기법)

  • Hyun-Seob Lee
    • Journal of Internet of Things and Convergence
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    • v.9 no.4
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    • pp.9-14
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    • 2023
  • Recently, resource optimization research has been actively conducted in enterprises and data centers to manage the rapid growth of big data. In particular, thin provisioning, which allocates a large number of resources compared to fixedly allocated storage resources, has the effect of reducing initial costs, but as the number of resources actually used increases, the cost effectiveness decreases and the management cost for allocating resources increases. In this paper, we propose a technique that divides the physical blocks of flash memory into single-bit cells and multi-bit cells, formats them with a hybrid technique, and manages them by dividing frequently used hot data and infrequently used cold data. The proposed technique has the advantage that the physical and allocated resources are the same, such as thick provisioning, and can be used without additional cost increase, and the underutilized resources can be managed in multi-bit cell blocks, such as thin provisioning, which can allocate more resources than typical storage devices. Finally, we estimated the resource optimization effectiveness of the proposed technique through experiments based on simulations.

New Wafer Burn-in Method of SRAM in Multi Chip Package (MCP)

  • Kim, Hoo-Sung;Kim, Hwa-Young;Park, Sang-Won;Sung, Man-Young
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2004.11a
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    • pp.53-56
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    • 2004
  • This paper presents the improved burn-in method for the reliability of SRAM in MCP Semiconductor reliability is commonly improved through the burn-in process. Reliability problem is more significant in the Multi Chip Package, because of including over two devices in a package. In the SRAM-based Multi Chip Package, the failure of SRAM has a large effect on the yield and quality of the other chips - Flash Memory, DRAM, etc. So, the quality of SRAM must be guaranteed. To improve the quality of SRAM, we applied the improved wafer level burn-in process using multi cell selection method in addition to the current used methods. That method is effective in detecting special failure. Finally, with the composition of some kinds of methods, we could achieve the high qualify of SRAM in Multi Chip Package.

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Wafer Burn-in Method for SRAM in Multi Chip Package (Multi Chip Package의 SRAM을 위한 웨이퍼 Burn-in 방법)

  • Yoon, Jee-Young;Ryu, Jang-Woo;Kim, Hoo-Sung;Sung, Man-Young
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.18 no.6
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    • pp.506-509
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    • 2005
  • This paper presents the improved burn-in method for the reliability of SRAM in Multi Chip Package (MCP). Semiconductor reliability is commonly improved by the burn-in process. Reliability Problem is very significant in the MCP which includes over two chips in a package because the failure of one SRAM chip has a large influence on the yield and quality of the other chips such as Flash Memory, DRAM, etc. Therefore the quality of SRAM must be guaranteed. To improve the qualify of SRAM, we applied the improved wafer level burn-in process using multi cell selection method in addition to the previously used methods and it is found to be effective in detecting particular failures. Finally, with the composition of some kinds of methods, we achieved the high quality of SRAM in MCP.