• Title/Summary/Keyword: MoS$_2$ electrode

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Effects of Propofol on Electroencephalogram in Dogs (Propofol이 개의 뇌파에 미치는 영향)

  • 장환수;장광호;채형규;권은주;김정은
    • Journal of Veterinary Clinics
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    • v.17 no.2
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    • pp.359-367
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    • 2000
  • The aim of this study was to evaluate the effects of propofol on cortical electroencephalogram (EEG) in seven dogs. Propofol infusion was accomplished from low concentration to high concentration in series, and each concentration was infused for 20 minutes (M0: 0, M0.5: 0.5, M1.0:1.0, and M1.5: 1.5 mg/kg/min of infusion rate). EEG was recorded via needle electrode placed at Cz, which was applied to International 10-20 system. Arterial blood pressure. blood gas analysis and ECG were also measured. Hoemodynamics, Pa$CO_2$, PaO$_2$, heart rate and respiratory rate were variable, but were net significant(p>0.05). The power spectra of EEG in every concentration was compared wish those of control (MO). The powers at a1l frequencies at M1.0 and Ml.5 were decreased. Especially, the powers of the frequencies over 20 Hz were significantly decreased (p<0.O5). Powers at frequencies between 8 and 15Hz at MO.S were significantly increased (p<0.05) in response to the painful stimuli. It was inferred that they may reflect activity of the brain which is consciously processing the external Stimuli. Like the Power spectra, al1 the band powers of He EEG ($\delta$ 1-4, $\theta$4-8, $\alpha$ 8-13, $\beta$L13-21. $\beta$H 21-30, \ulcorner 30-50, and total 1-5OHz) were decreased in proportion to the increase of infusion rate at M1 .0 and M1.5. Especially, decrease of $\beta$H and ${\gamma}$ were significant(p<0.01). At M0.5, $\alpha$ band was significantly increased(p<0.05) among all the bands. Seizure activities which were concide with occurrence of spike wave were shown in all dogs at Ml .0 and M1.5.

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Analysis on the Effect of Driving Condition in PEM Fuel Cell Durability (자동차용 연료전지의 운전환경에 따른 내구성 분석)

  • Yoo, Seung-Eul;Goo, Young-Mo;Kim, Myoung-Hwan;Son, Ik-Jae;Yoon, Jong-Jin;Oh, Seung-Chan
    • 한국신재생에너지학회:학술대회논문집
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    • 2007.11a
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    • pp.161-164
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    • 2007
  • 연료전지의 상용화 시점에 이르러 내구성에 대한 기술 확보가 점점 더 부각되고 있다. 현재 연료전지의 내구성을 감소시키는 1차적인 요인은 핵심부품인 촉매, 전해질막, MEA(Membrane & Electrode Assembly) 등에 의한 것이며 2차적인 요인은 운전 시스템 및 환경 등에 의해 결정되어진다. 특히, 연료전지자동차는 이동용, 가정용, 발전용에 비하여 부하변동이 극심한 조건에서 운전되기 때문에 연료전지 시스템의 내구성 확보에 많은 제어기술이 요구된다. 본 연구에서는 연료전지자동차 운전조건(Driving mode)을 부하변동 기준에 의한 고전류, 중전류, 저전류의 3가지 모드로 분류하였다. 각각의 운전조건에서 일정 cycle마다 성능곡선을 측정하여 10만 cycle 이상의 반복운전을 수행하였으며 측정된 성능곡선을 empirical equation에 적용하여 시간에 따른 overvoltage 인자에 대한 분석을 하였다. 운전시간이 증가함에 따라 고전류 모드의 경우 activation overvoltage 인자 중 current density loss가 증가하여 OCV가 급격히 감소하였으나 내구성은 저전류 모드에 비하여 높게 나타났다. 저전류 모드의 경우 고전류 모드와 상반된 결과를 보였으며 성능감소요인은 activation 및 ohmic overvoltage의 점차적인 증가에 의한 것으로 분석되었다.

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Infinitely high selectivity etching of SnO2 binary mask in the new absorber material for EUVL using inductively coupled plasma

  • Lee, S.J.;Jung, C.Y.;Lee, N.E.
    • Proceedings of the Korean Vacuum Society Conference
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    • 2011.02a
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    • pp.285-285
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    • 2011
  • EUVL (Extreme Ultra Violet Lithography) is one of competitive lithographic technologies for sub-30nm fabrication of nano-scale Si devices that can possibly replace the conventional photolithography used to make today's microcircuits. Among the core EUVL technologies, mask fabrication is of considerable importance since the use of new reflective optics having a completely different configuration compared to those of conventional photolithography. Therefore new materials and new mask fabrication process are required for high performance EUVL mask fabrication. This study investigated the etching properties of SnO2 (Tin Oxide) as a new absorber material for EUVL binary mask. The EUVL mask structure used for etching is SnO2 (absorber layer) / Ru (capping / etch stop layer) / Mo-Si multilayer (reflective layer) / Si (substrate). Since the Ru etch stop layer should not be etched, infinitely high selectivity of SnO2 layer to Ru ESL is required. To obtain infinitely high etch selectivity and very low LER (line edge roughness) values, etch parameters of gas flow ratio, top electrode power, dc self - bias voltage (Vdc), and etch time were varied in inductively coupled Cl2/Ar plasmas. For certain process window, infinitely high etch selectivity of SnO2 to Ru ESL could be obtained by optimizing the process parameters. Etch characteristics were measured by on scanning electron microscopy (SEM) and X-ray photoelectron spectroscopy (XPS) analyses. Detailed mechanisms for ultra-high etch selectivity will be discussed.

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Structural, Electrical and Optical Properties of $HfO_2$ Films for Gate Dielectric Material of TTFTs

  • Lee, Won-Yong;Kim, Ji-Hong;Roh, Ji-Hyoung;Moon, Byung-Moo;Koo, Sang-Mo
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.06a
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    • pp.331-331
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    • 2009
  • Hafnium oxide ($HfO_2$) attracted by one of the potential candidates for the replacement of si-based oxides. For applications of the high-k gate dielectric material, high thermodynamic stability and low interface-trap density are required. Furthermore, the amorphous film structure would be more effective to reduce the leakage current. To search the gate oxide materials, metal-insulator-metal (MIM) capacitors was fabricated by pulsed laser deposition (PLD) on indium tin oxide (ITO) coated glass with different oxygen pressures (30 and 50 mTorr) at room temperature, and they were deposited by Au/Ti metal as the top electrode patterned by conventional photolithography with an area of $3.14\times10^{-4}\;cm^2$. The results of XRD patterns indicate that all films have amorphous phase. Field emission scanning electron microscopy (FE-SEM) images show that the thickness of the $HfO_2$ films is typical 50 nm, and the grain size of the $HfO_2$ films increases as the oxygen pressure increases. The capacitance and leakage current of films were measured by a Agilent 4284A LCR meter and Keithley 4200 semiconductor parameter analyzer, respectively. Capacitance-voltage characteristics show that the capacitance at 1 MHz are 150 and 58 nF, and leakage current density of films indicate $7.8\times10^{-4}$ and $1.6\times10^{-3}\;A/cm^2$ grown at 30 and 50 mTorr, respectively. The optical properties of the $HfO_2$ films were demonstrated by UV-VIS spectrophotometer (Scinco, S-3100) having the wavelength from 190 to 900 nm. Because films show high transmittance (around 85 %), they are suitable as transparent devices.

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Development of a New Hybrid Silicon Thin-Film Transistor Fabrication Process

  • Cho, Sung-Haeng;Choi, Yong-Mo;Kim, Hyung-Jun;Jeong, Yu-Gwang;Jeong, Chang-Oh;Kim, Shi-Yul
    • Journal of Information Display
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    • v.10 no.1
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    • pp.33-36
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    • 2009
  • A new hybrid silicon thin-film transistor (TFT) fabrication process using the DPSS laser crystallization technique was developed in this study to realize low-temperature poly-Si (LTPS) and a-Si:H TFTs on the same substrate as a backplane of the active-matrix liquid crystal flat-panel display (AMLCD). LTPS TFTs were integrated into the peripheral area of the activematrix LCD panel for the gate driver circuit, and a-Si:H TFTs were used as a switching device of the pixel electrode in the active area. The technology was developed based on the current a-Si:H TFT fabrication process in the bottom-gate, back-channel etch-type configuration. The ion-doping and activation processes, which are required in the conventional LTPS technology, were thus not introduced, and the field effect mobility values of $4\sim5cm^2/V{\cdot}s$ and $0.5cm^2/V{\cdot}s$ for the LTPS and a-Si:H TFTs, respectively, were obtained. The application of this technology was demonstrated on the 14.1" WXGA+(1440$\times$900) AMLCD panel, and a smaller area, lower power consumption, higher reliability, and lower photosensitivity were realized in the gate driver circuit that was fabricated in this process compared with the a-Si:H TFT gate driver integration circuit

Effects of reversible metastable defect induced by illumination on Cu(In,Ga)Se2 solar cell with CBD-ZnS buffer layer

  • Lee, Woo-Jung;Yu, Hye-Jung;Cho, Dae-Hyung;Wi, Jae-Hyung;Han, Won-Seok;Yoo, Jisu;Yi, Yeonjin;Song, Jung-Hoon;Chung, Yong-Duck
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.431-431
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    • 2016
  • Typical Cu(In,Ga)Se2 (CIGS)-based solar cells have a buffer layer between CIGS absorber layer and transparent ZnO front electrode, which plays an important role in improving the cell performance. Among various buffer materials, chemical bath deposition (CBD)-ZnS is being steadily studied to alternative to conventional CdS and the efficiency of CBD-ZnS/CIGS solar cell shows the comparable values with that of CdS/CIGS solar cell. The intriguing thing is that reversible changes occur after exposure to illumination due to the metastable defect states in completed ZnS/CIGS solar cell, which induces an improvement of solar cell performance. Thus, it implies that the understanding of metastable defects in CBD-ZnS/CIGS solar cell is important issue. In this study, we fabricate the ITO/i-ZnO/CBD-ZnS/CIGS/Mo/SLG solar cells by controlling the NH4OH mole concentration (from 2 M to 3.5 M) of CBD-ZnS buffer layer and observe their conversion efficiency with and without light soaking for 1 hr. From the results, NH4OH mole concentration and light exposure can significantly affect the CBD-ZnS/CIGS solar cell performance. In order to investigate that which layer can contain metastable defect states to influence on solar cell performance, impedance spectroscopy and capacitance profiling technique with exposure to illumination have been applied to CBD-ZnS/CIGS solar cell. These techniques give a very useful information on the density of states within the bandgap of CIGS, free carriers density, and light-induced metastable effects. Here, we present the rearranged charge distribution after exposure to illumination and suggest the origin of the metastable defect states in CBD-ZnS/CIGS solar cell.

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Characteristics of Pr1-xMxMnO3(M=Ca, Sr) as a Cathode Material of Solid Oxide Fuel Cell (고체전해질형 연료전지용 Pr1-xMxMnO3(M-Ca, Sr) 산소극 재료의 특성)

  • Rim, Hyung-Ryul;Jeong, Soon-Ki;Lee, Ju-Seong
    • Applied Chemistry for Engineering
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    • v.7 no.6
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    • pp.1125-1131
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    • 1996
  • Ca or Sr-doped $PrMnO_3$ were prepared for cathode material of solid oxide fuel cell. The characteristics such as the electrical conductivity and the cathodic overpotential were investigated as to doping contents. Also the reactivity with yttria stabilized zirconia of electrolyte, and the thermal expansion coefficient were studied. The prepared perovskite powder had the mean particle size of $2{\sim}5{\mu}m$, and the particle size and the surface area was out of relation to the doping content. When Ca doping amount of electrode material was 30mol%, the electrical conductivity was the highest value of $266S{\cdot}cm^{-1}$ at $1000^{\circ}C$, and also the polarization characteristics showed the best property. The reactivity between YSZ and Ca-doped $PrMnO_3$ at $1200^{\circ}C$ for 100hours was lower than that between YSZ and Sr-doped $PrMnO_3$. The thermal expansion coefficient of $Pr_{0.7}Ca_{0.3}MnO_3$ was $1.19{\times}10^{-5}K^{-1}$ in the temperature range of $300{\sim}1000^{\circ}C$, and this value was similar to that of YSZ, $1.15{\times}10^{-5}K^{-1}$.

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