• Title/Summary/Keyword: Microwave dielectric: $ZrTi0_4$

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Microwave Dielectric Properties and Infrared ReflectivitySpectra of (Zr$_{0.8}$Sn$_{0.2}$)TiO$_4$ Ceramics ((Zr$_{0.8}$Sn$_{0.2}$)TiO$_4$ 세라믹스의 마이크로파 유전특성 및 Infrared Reflectivity Spectra of (Zr0.8Sn0.2)TiO4)

  • 윤기현;안일석;김우섭;김응수
    • Journal of the Korean Ceramic Society
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    • v.36 no.9
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    • pp.915-922
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    • 1999
  • Microwave dielectric properties and far infrared reflectivity spectra of the (Zr0.8Sn0.2)TiO4 ceramics were inves-tigated with the various cooling rate. Dielectric constant was nearly same value while the unloaded Q value was largely affected by cooling rate. The Q.f of 42,140 at 7 GHz was obtained for the specimens with cooling rate of 1$^{\circ}C$/min. The effect of the cooling rate on the change of the ionic the electronic polarization and the intrinsic microwave loss of the specimens were investigated by the infrared reflectivity spectra from 50 to 4000cm-1 which were calculated by Kramers-Kroning analysis and the classical oscillator model. The relative tendency of microwave dielectric properties of the specimens calculated from the relfectivity data were in good agreement with the results by the post resonant method.

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Microstructure and Microwave Dielectric Properties of ZrTiO4 Thin Films Prepared by Metal-organic Decomposition (금속유기분해 법으로 제조한 ZrTiO4 박막의 미세구조 및 고주파 유전특성)

  • Park, Chang-Sun;Sun, Ho-Jung
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.22 no.1
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    • pp.53-60
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    • 2009
  • $ZrTiO_4$ dielectric thin films were coated by metal-organic decomposition, and annealed by rapid thermal processing up to $900^{\circ}C$ for their crytallization. Crystallized single-phase $ZrTiO_4$ thin films were fabricated above the annealing temperature of $800^{\circ}C$, but their grains were randomly oriented without specific textured orientation. Best dielectric properties were presented by the sample annealed at $800^{\circ}C$ which had crystalline structure and flat surface. Dielectric constant of the film was maintained at 32 throughout full frequency range up to 6 GHz, and dielectric loss was varied between 0.01 and 0.04.

Influence of ZnO-Nb2O5 Substitution on Microwave Dielectric Properties of the ZrTi04 System

  • Kim, Woo-Sup;Kim, Joon-Hee;Kim, Jong-Han;Hur, Kang-Heon
    • Journal of the Korean Ceramic Society
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    • v.40 no.4
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    • pp.346-349
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    • 2003
  • Microwave dielectric characteristics and physical properties of the new Zr$_{1-x}$ (Bn$_{1}$3/Nb$_{2/3}$)xTi $O_4$ (0.2$\leq$x$\geq$ 1.0) system have been investigated as a function of the amount of Bn$_{1}$3/Nb$_{2/3}$ $O_2$substitution. With increasing Bn$_{1}$3/Nb$_{2/3}$ $O_2$ content (x), two phase regions were observed: $\alpha$-Pb $O_2$ solid solution (x<0.4), mixture of the rutile type Zn$_{1}$3/Nb$_{2/3}$Ti $O_4$ and the $\alpha$-Pb $O_2$ solid solution (x$\geq$0.4). In the$\alpha$-Pb $O_2$solid solution region below x<0.4, the Q.f$_{0}$ value sharply increased and the Temperature Coefficient of the Resonant Frequency(TCF) decreased with increasing Bn$_{1}$3/Nb$_{2/3}$ $O_2$ contents while dielectric constant (K) showed nearly same value. In the mixture region above x$\geq$4, the dielectric constant and TCF increased with increasing Bn$_{1}$3/Nb$_{2/3}$ $O_2$ content. Zr$_{1-x}$ (Zn$_{1}$3/Nb$_{2/3}$)xTi $O_4$ materials have excellent microwave dielectric properties with K=44.0, Q.f$_{0}$ : 41000 GHz and TCF =-3.0 ppm/$^{\circ}C$ at x=0.35.=0.35. x=0.35.=0.35.

Microwave Dielectric Properties of (Zr, Sn)$TiO_4$ ceramics according to Sn and Additives ((Zr, Sn)$TiO_4$ 세라믹스의 Sn 및 첨가제 양에 따른 고주파 유전 특성)

  • Yun, Jung-Rag;Kim, Kyung-Yong
    • Proceedings of the KIEE Conference
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    • 1993.11a
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    • pp.181-184
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    • 1993
  • Microwave characteristics of the system (Zr, Sn)$TiO_4$, ceramics within composition range X between 0.2 and 0.35 were investigated at 8GHz. For the improvement properties of (Zr, Sn)$TiO_4$, system, $Ta_2O_5$ and $WO_3$ addition in the range of 0.5 to 2.0wt% were investigated.

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Effects of $Mn_2O_3, Y_2O_3$ Additives and Valence State of Mn ion in $Sr(Zr, Ti)O_3$ Microwave Dielectrics ($Sr(Zr, Ti)O_3$ 마이크로파 유전체에 첨가된 $Mn_2O_3, Y_2O_3$ 의 영향과 Mn의 산화상태)

  • 정하균;박도순;박윤창
    • Journal of the Korean Ceramic Society
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    • v.34 no.6
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    • pp.583-590
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    • 1997
  • The effects of Mn2O3 and Y2O3 additives on the microstructure and dielectric properties of Sr(Zr, Ti)O3 have been investigated. Powders with Sr(Zr1-xTix)O3(0$\leq$x$\leq$0.1) composition were prepared by the conventional solid state processing from commercial TiO2 and precipitation-processed ZrO2. The powders containing sintering additives of Mn2O3 and Y2O3 were compacted and then sintered at 1,55$0^{\circ}C$ for 4 h to get>97% relative density. Mn2O3 suppressed the grain growth and Y2O3 enhanced the density of sintered body. The oxidation state of Mn ions were determined by a chemical wet method and EPR spectroscopy. Mn ions were present as Mn2+ and Mn4+ in SrZrO3, while as Mn3+ and Mn4+ in Ti-substituted Sr(Zr, Ti)O3. With the substitution of Ti, the lattice parameters of SrZrO3 decreased and its dielectric constant increased with remarkable decrease in Q value. The dielectric constant of Sr(Zr, Ti)O3 was in the range of 30 to 40, Q values 1,200~5,400 at 6 GHz and temperature coefficient of resonant frequency -67~100 ppm/K.

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Microwave dielectric properties according to the additions of NiO to $(Zr_{0.65}, Sn_{0.35})Ti_{1.04}O_{4.04}$ ceramics ($(Zr_{0.65}, Sn_{0.35})Ti_{1.04}O_{4.04}$세라믹스의 NiO첨가에 따른 고주파 유전 특성)

  • 윤중락;권정열;이헌용;김경용
    • Electrical & Electronic Materials
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    • v.8 no.5
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    • pp.594-600
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    • 1995
  • Dielectric properties at microwave frequencies of ($Zr_{0.65}$, $Sn_{0.35}$) $Ti_{1.04}$ $O_{4.04}$ ceramics with additives, NiO as an agent to improve dielectric properties and $B_{2}$ $O_{3}$ as a firing agent were investigated. When 0.5 - 1.5 wt% of NiO is add, the grain growth is inhibited and the shape of the grain is uniformed, Dielectric constant(Fr) and bulk density are increased with raising amount of NiO at sintering temperature of 1330 - 1360.deg. C, but the temperature coefficient of resonant frquency(.epsilon.$_{r}$) decreased gradually as the NiO content increased. The value of Qx $f_{o}$ was increased as the amount of NiO was increased in the range of 0.5 to 1.0 wt% and the Qx $f_{o}$, was decreased slightly with raising sintering temperature. With NiO of 1.0 wt% and at sintering temperature of 1360.deg. C, this ceramics was found to have excellent microwave properties of .epsilon.$_{r}$=37.8, Qx $f_{o}$ = 48.600 and .tau.$_{f}$ = 7 ppm/.deg. C.C.. C.. C.C.. C.. C.

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Microwave Dielectric Properties of $(Zr_{1-x}Sn_x)TiO_4$ Ceramics in the Response Surface Methodology (반응표면분석법에 의한 $(Zr_{1-x}Sn_x)TiO_4$계 교주파 유전 특성)

  • Kim, Wang-Sup;Choi, Hwan;Moon, Myoung-Lib;Kim, Kyung-Yong
    • Journal of the Korean Ceramic Society
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    • v.32 no.5
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    • pp.535-542
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    • 1995
  • The effect of sintering temperature, sintering time and forming pressure on microwave dielectric properties of (Zr1-xSnx)TiO4 ceramics containing 1.0wt% B2O3, 0.3 wt% La2O3 and 1.0wt% NiTa2O6 was investigated using the response surface methodology. The optimum values of processing variables were determined based on the reproducibility. The optimum values of the dielectric constant of >35. Q.f0 of >55000 and $\tau$f=$\pm$5 ppm/$^{\circ}C$ could be obtained when the sample was pressed at 500~600kg/$\textrm{cm}^2$ and sintered at 1500~155$0^{\circ}C$ for 2~3 hrs.

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Microwave Dielectric Properties of $(Zr_{0.65}Sn_{0.35})Ti_{1.04}O_4$ Ceramics according to Doped NiO and Sintering Temperature ($(Zr_{0.65}Sn_{0.35})Ti_{1.04}O_4$ 세라믹스의 NiO 첨가량 및 소결온도에 따른 고주파 유전특성)

  • Yun, J.R.;Heung, S.Y.;Lee, H.Y.;Kweon, J.Y.;Kim, K.Y.
    • Proceedings of the KIEE Conference
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    • 1994.07b
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    • pp.1487-1489
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    • 1994
  • $(Zr_{0.65}Sn_{0.35})Ti_{1.04}O_4$ system which has a dielectric constant, low dielectric loss and temperature coefficient was investigated. Temperature coefficient varied from positive to negative with increasing of NiO. For the NiO content 1.0wt%. i.e $(Zr_{0.65}Sn_{0.35})Ti_{1.04}O_4$, the ceramic showed very good dielectric properties such as ${\epsilon}$=37.8, $Q{\times}f_o=49.000$ and ${\tau}_r= 4{\pm}1ppm/^{\circ}C$.

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Microstructure and Dielectric Properties of $Ba2(Ti_{8.472}Zr_{0.528})O_{20}$ ($Ba2(Ti_{8.472}Zr_{0.528})O_{20}$의 결정구조와 유전특성)

  • Baik, Nam-Seok;Lee, Hun-Sik;Tho, Nam-Woong;Park, Sung;Lee, Byung-Ha
    • Journal of the Korean Ceramic Society
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    • v.33 no.1
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    • pp.1-6
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    • 1996
  • A single phase Ba2(Ti8,472Zr0.528)O20 was prepared by the oxalate method from aqueous solution of BaCl2 TiCl4 and ZrOCl2. The structure ananlysis has been carried out by Rietveld analysis method at room temperature. Powder X-ray data of Ba2(Ti8,472Zr0.528)O20 was indexed with the triclinic lattice(a=7.4587 $\AA$ b=14.0672 $\AA$, c=13.3327 $\AA$, $\alpha$=89.87, $\beta$=79.45 ${\gamma}$=84.46) The R (Residual) values of structure refinement were in a range between 10.00 and 8.00 This analysis proved that the added Zr occupied Ti sites in th structure of Ba2Ti9O20. Ba2(Ti8,472Zr0.528)O20 has excellent dielectric properties(dielectric constant K=40.49 at 5.42 GHz Q=4621) so that it can be used as good microwave dielectric materials.

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