• Title/Summary/Keyword: Micro-pin array

Search Result 16, Processing Time 0.023 seconds

A Study on design of the PZT Cantilever for Micro Switch (Micro Switch용 PZT Cantilever의 설계에 관한 연구)

  • Kim, In-Sung;Song, Jae-Sung;Min, Bok-Ki;Jeong, Soon-Jong;Muller, A.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2005.07a
    • /
    • pp.422-423
    • /
    • 2005
  • RF Micro switches is a miniature device or an array of integration devices and mechanical components and fabricated with Ie batch-processing techniques. RF Micro switches application area are in phased arrays and reconfigurable apertures for defence and telecommunication systems, switching network for satellite communication, and single-pole double throw switches for wireless application. Recently, RF Micro switches have been developed for the application to the milimeter wave system. RF Micro switches offer a substantilly higher performance than PIN diode or FET switches. In this paper, SPDT(single-pole-double-throw) switch are designed to use 10 GHz. Actuation voltage and displacement are simulated by tool.

  • PDF

Implementation of User Interface for DNA Micro Array Printing Technology (DNA 마이크로어레이 프린팅을 위한 사용자 인터페이스 적용기술)

  • Park, Jae-Sam
    • The Journal of the Korea institute of electronic communication sciences
    • /
    • v.8 no.12
    • /
    • pp.1875-1882
    • /
    • 2013
  • Micro-array technology contributes numerous achievements such as ordering of gene network and integration of genomic. This technology is well established as means for investigating patterns of gene expression. DNA micro-arrays utilize Affymetric chips where a large quantity of DNA sequences may be synthesized. There are two general type of conventional DNA array spotter: contact and piezoelectric. The contact technology used spotting pin technology to make contact with the glass slide surface. This may caused damage or scratches to the surface matrix where protein will be contaminated and may not bind specifically. Piezoelectric technology available at this present time on the other hand requires the analyzer to print the result that can only be done within the laboratory despite of mass production. Therefore, in this paper, high-throughput technology is developed for providing greater consistency in feature spot without touching the glass slide surface.

Factors Affecting Discrimination of Surface Property Using an Integrated Tactile Display;Roughness and Vibration

  • Jeong, Young-Ju;Yang, Gi-Hun;Kyung, Ki-Uk;Kwon, Dong-Soo;Kang, Sung-Chul
    • 제어로봇시스템학회:학술대회논문집
    • /
    • 2004.08a
    • /
    • pp.596-601
    • /
    • 2004
  • In this paper, we describe a study on the influence of the frequency variation of normal vibration using an integrated tactile display. It is necessary to consider this study because we want to find a method of displaying finer texture and know that the perception of fine textures is heavily influenced by temporal variation. Our tactile display system used in this experiment can simulate the micro shapes and roughness of surface textures by individual drives of a 6x8 pin array. Two experiments are performed. The first is a psychophysical experiment on the definition and range decision of roughness, and through the experiment, we clear up the meaning of roughness. The second is the main experiment about the frequency variation of normal vibration. We find the correlation between the vibration frequency and the texture and the condition for better display and perception of fine surfaces. The experimental results yielded two pieces of information. One is that lateral movement affects texture discrimination, and another is that normal vibration can make the perceived texture feel finer than real texture. That is, the vibrating stimulus is more effective for displaying a fine surface than static pressure, and it makes possible to display finer texture, exceeding the physical limit of the device.

  • PDF

3D Measurement System of Wire for Automatic Pull Test of Wire Bonding (Wire bonding 자동 전단력 검사를 위한 wire의 3차원 위치 측정 시스템 개발)

  • Ko, Kuk Won;Kim, Dong Hyun;Lee, Jiyeon;Lee, Sangjoon
    • Journal of Institute of Control, Robotics and Systems
    • /
    • v.21 no.12
    • /
    • pp.1130-1135
    • /
    • 2015
  • The bond pull test is the most widely used technique for the evaluation and control of wire bond quality. The wire being tested is pulled upward until the wire or bond to the die or substrate breaks. The inspector test strength of wire by manually and it takes around 3 minutes to perform the test. In this paper, we develop a 3D vision system to measure 3D position of wire. It gives 3D position data of wire to move a hook into wires. The 3D measurement method to use here is a confocal imaging system. The conventional confocal imaging system is a spot scanning method which has a high resolution and good illumination efficiency. However, a conventional confocal systems has a disadvantage to perform XY axis scanning in order to achieve 3D data in given FOV (Field of View) through spot scanning. We propose a method to improve a parallel mode confocal system using a micro-lens and pin-hole array to remove XY scan. 2D imaging system can detect 2D location of wire and it can reduce time to measure 3D position of wire. In the experimental results, the proposed system can measure 3D position of wire with reasonable accuracy.

Serum Periplakin as a Potential Biomarker for Urothelial Carcinoma of the Urinary Bladder

  • Matsumoto, Kazumasa;Ikeda, Masaomi;Matsumoto, Toshihide;Nagashio, Ryo;Nishimori, Takanori;Tomonaga, Takeshi;Nomura, Fumio;Sato, Yuichi;Kitasato, Hidero;Iwamura, Masatsugu
    • Asian Pacific Journal of Cancer Prevention
    • /
    • v.15 no.22
    • /
    • pp.9927-9931
    • /
    • 2014
  • The objectives of this study were to examine serum periplakin expression in patients with urothelial carcinoma of the urinary bladder and in normal controls, and to examine relationships with clinicopathological findings. Detection of serum periplakin was performed in 50 patients and 30 normal controls with anti-periplakin antibodies using the automatic dot blot system, and a micro-dot blot array with a 256 solid-pin system. Levels in patients with urothelial carcinoma of the urinary bladder were significantly lower than those in normal controls (0.31 and 5.68, respectively; p<0.0001). The area under the receiver-operator curve level for urothelial carcinoma of the urinary bladder was 0.845. The sensitivity and specificity, using a cut-off point of 4.045, were 83.7% and 73.3%, respectively. In addition, serum periplakin levels were significantly higher in patients with muscle-invasive cancer than in those with nonmuscle-invasive cancer (P = 0.03). In multivariate Cox proportional hazards regression analysis, none of the clinicopathological factors was associated with an increased risk for progression and cancer-specific survival. Examination of the serum periplakin level may play a role as a non-invasive diagnostic modality to aid urine cytology and cystoscopy.

Fabrication of MEMS Test Socket for BGA IC Packages (MEMS 공정을 이용한 BGA IC 패키지용 테스트 소켓의 제작)

  • Kim, Sang-Won;Cho, Chan-Seob;Nam, Jae-Woo;Kim, Bong-Hwan;Lee, Jong-Hyun
    • Journal of the Institute of Electronics Engineers of Korea SD
    • /
    • v.47 no.11
    • /
    • pp.1-5
    • /
    • 2010
  • We developed a novel micro-electro mechanical systems (MEMS) test socket using silicon on insulator (SOI) substrate with the cantilever array structure. We designed the round shaped cantilevers with the maximum length of $350{\mu}m$, the maximum width of $200{\mu}m$ and the thickness of $10{\mu}m$ for $650{\mu}m$ pitch for 8 mm x 8 mm area and 121 balls square ball grid array (BGA) packages. The MEMS test socket was fabricated by MEMS technology using metal lift off process and deep reactive ion etching (DRIE) silicon etcher and so on. The MEMS test socket has a simple structure, low production cost, fine pitch, high pin count and rapid prototyping. We verified the performances of the MEMS test sockets such as deflection as a function of the applied force, path resistance between the cantilever and the metal pad and the contact resistance. Fabricated cantilever has 1.3 gf (gram force) at $90{\mu}m$ deflection. Total path resistance was less than $17{\Omega}$. The contact resistance was approximately from 0.7 to $0.75{\Omega}$ for all cantilevers. Therefore the test socket is suitable for BGA integrated circuit (IC) packages tests.