• 제목/요약/키워드: Micro Assembly

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인공위성 반작용휠의 미소진동 측정 및 분석

  • 오시환;이승우
    • 항공우주기술
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    • 제3권2호
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    • pp.25-33
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    • 2004
  • 본 논문에서는 인공위성 반작용휠의 미소진동 측정을 위한 테스트 장비와 이를 이용하여 실측한 반작용휠의 미소진동을 측정 및 분석 결과를 소개한다. 위성의 미소진동은 KISTLER dynamic platform 이라는 400Hz 이내의 3축의 힘과 3축의 토크를 동시에 측정할 수 있는 장비에 의해 측정되며 측정된 데이터는 회전 속도에 따라 3차원 주파수 분석, order tracking 등의 방법을 이용하여 분석된다. 반작용휠의 미소진동 분석 결과, 회전 속도와 비례하는 일차 성분 외에 고차 조화 성분, 구조 진동 성분, 회전 속도에 따라 고유진동수가 변하는 rocking 모드 성분 등을 관찰할 수 있었으며, 휠의 정적 및 동적 불균형은 각각 0.79gcm과 17.4gcm²으로 나타났다. 이러한 다양한 진동 성분들은 회전체의 특성, 구조물의 특성 및 베어링의 영향으로 기인한다.

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의탄성 형상기억합금 메쉬 와셔가 적용된 수동형 진동절연기의 수학적 등가모델 도출 (Derivation of Numerical Equivalent Model of Vibration Isolator using Pseudoelastic SMA Mesh Washer)

  • 권성철;전수현;오현웅
    • 항공우주시스템공학회지
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    • 제8권3호
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    • pp.6-13
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    • 2014
  • A passive launch and on-orbit vibration isolator using SMA(Shape Memory Alloy) washer for both the structural safety of the micro-vibration source by attenuating the transmitted force under launch loads and the micro-vibration isolation during their on-orbit operation has been proposed, which does not require the additional launch locking mechanism. To measure the characteristics of SMA mesh washer, we performed compressive loading tests with a single SMA mesh washer and a vibration isolator using SMA mesh washer. The numerical equivalent model of vibration isolator using SMA mesh washer composed of two spring and viscous damping elements has been verified that both stiffness and viscous damping varied with respect to compressed deformations. In addition, the effectiveness of launch loads and micro-vibration reduction has been investigated through the dynamic characteristics measurement test of cooler assembly combined with passive vibration isolator.

과학기술위성 반작용휠의 미소진동 측정 및 분석 (STSAT RWA Micro-Vibration Test and Analysis)

  • 오시환;남명용;박연묵;임조령;금정훈;이승우
    • 한국소음진동공학회:학술대회논문집
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    • 한국소음진동공학회 2004년도 추계학술대회논문집
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    • pp.695-698
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    • 2004
  • STSAT RWA (Reaction Wheel Assembly) micro-vibration is measured using KISTLER dynamic plate that can provide the time signals of three orthogonal forces and torques simultaneously up to 400Hz. In the post-processing, measured data are evaluated with respect to the wheel spin rate in both time and frequency domains, and the static/dynamic unbalances are evaluated from the extracted first harmonic component. Also the friction torque profile at each wheel speed is estimated from the measured data. Several higher order harmonic components are observed, that comes from its rotor shape as well as the wheel bearing characteristics. One of the most peculiar characteristics of this wheel is that the dynamic properties of two radial unbalance components are much different from each other as the RWA mounting configuration on a spacecraft is different from conventional RWA mounting configuration. Rocking mode is not appeared below 400Hz for all operating speed because the wheel size is very small. The post-processed results will be used for jitter analysis of STSAT due to RWA micro-vibration.

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자동 광축 정렬시스템을 이용한 초소형 광통신용 마이크로 OADM 제작 및 Aging effect (Fabrication and Aging effect of Micro OADM using Automatic Alignment System)

  • S. K., Kim;Y. H., Seo;D. S., Choi;T. J., Jae;K. H., Whang
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2004년도 추계학술대회 논문집
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    • pp.644-647
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    • 2004
  • Optical add/drop multiplexers (OADMs), one of the new network elements, will play a key role enabling greater connectivity and flexibility in the dense wavelength-division multiplexing (DWDM) networks. The importance of OADMs is that they allow the optical network to be local transmitting/extraction on a wavelength-by-wavelength basis to optimize traffic, efficient network utilization, network growth, and to enhance network flexibility. Also, the automatic assembly system of micro optical filters and fibers is a key technology in the development of optical modules with high functionality. Recently, one of remarkable tends in the development of optical communication industry is the miniaturization and integration of products. In this research, we have developed a system capable of automatic alignment of a film filter and a lensed fiber in order to improve the speed and losses in the optical fiber to filter alignment of optical modules. Using the developed automatic alignment system and silicon optical benches, we have fabricated the micro OADM and measured the insertion loss and aging effect.

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소형구 속도 증폭을 위한 사보조립체 디자인 최적화 연구 (A Study on the Optimization of Sabot Assembly Design for Micro Ball Velocity Multiplication)

  • 박근휘;진두한;김태연;강형;정동택
    • 한국군사과학기술학회지
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    • 제23권1호
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    • pp.37-42
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    • 2020
  • This study is for a bulletproof experiment through speed acceleration of steel ball(2.385 mm) at the laboratory level. The secondary propulsion method is used for speed acceleration, which uses a sabot assembly consisting of a sabot body, a plunger, water, and a sabot cap. At the core of the secondary drive, it is important that the energy in the water of the private particle is transferred well to the steel ball. The experiment was conducted by selecting a plunger that pushes water and water charged with variables. judging that the longer the contact time, the greater the energy transferred to the steel ball. As a result of experiments with each variable, the amount of water does not affect the speed acceleration efficiency of the steel ball and, when the length of the plunger is increased by 200 %, the speed of the steel ball can be accelerated up to 130 m/s.

BGA to CSP to Flip Chip-Manufacturing Issues

  • Caswell, Greg;Partridge, Julian
    • 마이크로전자및패키징학회지
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    • 제8권2호
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    • pp.37-42
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    • 2001
  • The BGA package has been the area array package of choice for several years. Recently, the transition has been to finer pitch configurations called Chip Scale Packages (CSP). Several of these package types are available at 0.5 mm pitch. requiring surface mount assemblers to evaluate and optimize various elements of the assembly process. This presentation describes the issues associated with making the transition from BGA to CSP assembly. Areas addressed will include the accuracy of pick and place equipment, printed wiring board lines and spaces, PWB vias, in-circuit test issues, solder paste printing, moisture related factors, rework and reliability. The transition to 0.5 mm pitch requires careful evaluation of the board design, solder paste selection, stencil design and component placement accuracy. At this pitch, ball and board pad diameters can be as small as 0.25 mm and 0.20 mm respectively. Drilled interstitial vias are no longer possible and higher ball count packages require micro-via board technology. The transition to CSP requires careful evaluation of these issues. Normal paste registration and BGA component tolerances can no longer achieve the required process levels and higher accuracy pick and place machines need to be implemented. This presentation will examine the optimization of these critical assembly operations, contrast the challenges at 0.5 mm and also look at the continuation of the process to incorporate smaller pitch flip chip devices.

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Two scale modeling of behaviors of granular structure: size effects and displacement fluctuations of discrete particle assembly

  • Chu, Xihua;Yu, Cun;Xiu, Chenxi;Xu, Yuanjie
    • Structural Engineering and Mechanics
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    • 제55권2호
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    • pp.315-334
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    • 2015
  • This study's primary aim is to check the existence of a representative volume element for granular materials and determine the link between the properties (responses) of macro structures and the size of the discrete particle assembly used to represent a constitutive relation in a two-scale model. In our two-scale method the boundary value problem on the macro level was solved using finite element method, based on the Cosserat continuum; the macro stresses and modulus were obtained using a solution of discrete particle assemblies at certain element integration points. Meanwhile, discrete particle assemblies were solved using discrete element method under boundary conditions provided by the macro deformation. Our investigations focused largely on the size effects of the discrete particle assembly and the radius of the particle on macro properties, such as deformation stiffness, bearing capacity and the residual strength of the granular structure. According to the numerical results, we suggest fitting formulas linking the values of different macro properties (responses) and size of discrete particle assemblies. In addition, this study also concerns the configuration and displacement fluctuation of discrete particle assemblies on the micro level, accompanied with the evolution of bearing capacity and deformation on the macro level.

Amino-Functionalized Alkylsilane SAM-Assisted Patterning of Poly(3-hexylthiophene) Nanofilm Robustly Adhered to SiO2 Substrate

  • Pang, Ilsun;Boo, Jin-Hyo;Sohn, Honglae;Kim, Sung-Soo;Lee, Jae-Gab
    • Bulletin of the Korean Chemical Society
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    • 제29권7호
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    • pp.1349-1352
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    • 2008
  • We report a novel patterning method for a homo-polymeric poly(3-hexylthiophene) (P3HT) nanofilm particularly capable of strong adhesion to a $SiO_2$ surface. An oxidized silicon wafer substrate was micro-contact printed with n-octadecyltrichlorosilane (OTS) monolayer, and subsequently its negative pattern was selfassembled with three different amino-functionalized alkylsilanes, (3-aminopropyl)trimethoxysilane (APS), N- (2-aminoethyl)-3-aminopropyltrimethoxy silane (EDAS), and (3-trimethoxysilylpropyl) diethylenetriamine (DETAS). Then, P3HT nanofilms were selectively grown on the aminosilane pre-patterned areas via the vapor phase polymerization method. To evaluate the adhesion, patterning, and the film itself, the PEDOT nanofilms and SAMs were investigated with a $Scotch^{(R)}$ tape test, contact angle analyzer, ATR-FT-IR, and optical and atomic force microscopes. The evaluation showed that the newly developed all bottom-up process can offer a simple and inexpensive patterning method for P3HT nanofilms robustly adhered to an oxidized Si wafer surface by the mediation of $FeCl_3$ and amino-functionalized alkylsilane SAMs.

BGA to CSP to Flip Chip - Manufacturing Issues

  • Caswell, Greg;Partridge, Julian
    • 한국마이크로전자및패키징학회:학술대회논문집
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    • 한국마이크로전자및패키징학회 2001년도 Proceedings of 6th International Joint Symposium on Microeletronics and Packaging
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    • pp.27-34
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    • 2001
  • The BGA Package has been the area array package of choice for several rears. Recently, the transition has been to finer pitch configuration called Chip Scale Packages (CSP). Several of these package types are available at 0.5 mm pitch, requiring surface mount assemblers to evaluate and optimize various elements of the assembly process. This presentation describes the issues associated with making the transition from BGA to CSP assembly. Areas addressed will include the accuracy of pick and piece equipment, printed wiring board lines and spaces, PWB vias, in-circuit test issues, solder paste printing, moisture related factors, rework and reliability. The transition to 0.5 mm pitch requires careful evaluation of the board design, solder paste selection, stencil design and component placement accuracy. At this pitch, ball and board pad diameters can be as small as 0.25 mm and 0.20 mm respectively. Drilled interstitial vias are no longer possible and higher ball count packages require micro-via board technology. The transition to CSP requires careful evaluation of these issues. Normal paste registration and BGA component tolerances can no longer achieve the required process levels and higher accuracy pick and place machines need to be implemented. This presentation will examine the optimization of these critical assembly operations, contrast the challenges at 0.5 mm and also look at the continuation of the process to incorporate smaller pitch flip chip devices.

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코인된 솔더 범프를 형성시킨 PCB 기판을 이용한 플립 칩 접속 (Flip Chip Assembly on PCB Substrates with Coined Solder Bumps)

  • 나재웅;백경욱
    • 한국마이크로전자및패키징학회:학술대회논문집
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    • 한국마이크로전자및패키징학회 2002년도 추계기술심포지움논문집
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    • pp.21-26
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    • 2002
  • Solder flip chip bumping and subsequent coining processes on PCB were investigated to solve the warpage problem of organic substrates for high pin count flip chip assembly by providing good co-planarity. Coining of solder bumps on PCB has been successfully demonstrated using a modified tension/compression tester with height, coining rate and coining temperature variables. It was observed that applied loads as a function of coined height showed three stages as coining deformation : (1) elastic deformation at early stage, (2) linear increase of applied load, and (3) rapid increase of applied load. In order to reduce applied loads for coining solder bumps on PCB, effects of coining process parameters were investigated. Coining loads for solder bump deformation strongly depended on coining rates and coining temperatures. As coining rates decreased and process temperature increased, coining loads decreased. Among the effect of two factors on coining loads, it was found that process temperature had more significant effect to reduce applied coining loads during the coining process. Lower coining loads were needed to prevent substrate damages such as micro-via failure and build-up dielectric layer thickness change during applying loads. For flip chip assembly, 97Pb/Sn flip chip bumped devices were successfully assembled on organic substrates with 37Pb/Sn coined flip chip bumps.

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