• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.15 no.1
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• pp.1-6
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• 2002

The hot carried degradation in a metal oxide semiconductor device has been one of the most serious concerns for MOS-ULSI. In this paper, three types of LDD(lightly doped drain) structure for suppression of hot carried degradation, such as decreasing of performance due to spacer-induced degradation and increase of series resistance will be investigated. in this study, LDD-nMOSFETs used had three different drain structure, (1) conventional surface type LDD(SL), (2) Buried type LDD(BL), (3) Surface implantation type LDD(SI). As experimental results, the surface implantation the LDD structure showed that improved hot carrier lifetime to comparison with conventional surface and buried type LDD structures.

• Electrical & Electronic Materials
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• v.1 no.1
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• pp.62-69
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• 1988

Te-thin films were highly proper material for optical recording media, but has the demerit of short archival life time due to the unstability to humidity. In order to restrain the degradation, Te$_{100-x}$Se$_{x}$ alloys adding Se stable for the humidity were fabricated. Primarily, to measure the degradation rate with varing the composition of Se to x=5, 10, 14, 25 at.% at Te$_{100-x}$ Se$_{x}$, the change of light transmittance was used in various temperature-humidity environments. As the results, it was showed that Se$_{86}$Te$_{14}$ thin was the most proper composition for the improvement of degradation restraint.int.int.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.15 no.5
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• pp.398-405
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• 2002

The degradation characteristics of MgO additive for the ZnO ceramic devices fabricated by the standard ceramic techniques are investigated in this study. These devices were made from basic Matsuoka's composition. Especially, MgO was added to analyze the degradation characteristics and devices were sintered in air at $1200^{\circ}C$. The conditions of DC degradation test were $115\pm2^{\circ}C$ for 12h. Using XRD and SEM, the phase and microstructure of samples were analyzed, respectively. The elemental analysis in the microstructures was performed by EDS, E-J analysis was used to determine $\alpha$. Frequency analysis was accomplished to understand the relationship between $R_G$ and $R_B$ with the electric stress at the equivalent circuit.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.6
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• pp.586-591
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• 2004

We studied the dependence of hot-tarrier-induced degradation characteristics on nitrogen concentration in NO(Nitrided-Oxide) gate of nMOS, under ac and dc stresses. The $\Delta$V$_{t}$ and $\Delta$G$_{m}$ dependence of nitrogen concentration were observed, We observed that device degradation was suppressed significantly when the nitrogen concentration in the gate was increased. Compared to $N_2$O oxynitride, NO oxynitride gate devices show a smaller sensitivity to ac stress frequency. Results suggest that the improved at-hot carrier immunity of the device with NO gate may be due to the significantly suppressed interface state generation and neutral trap generation during stress.ess.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.05a
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• pp.59-63
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• 2000

The conventional tracking testing as IEC-60587 is widely used in surface aging measurement of outside insulator because those testing can carry out very short time in Lab testing. Also IEC-60587 testing is able to offer the standard judgement of relative degradation level of outside HV machine. Therefore it is very useful method compare to previous conventional tracking testing method and effective Lab testing method. But surface discharges(SD) have very complex characteristics of discharge pattern so it is required estimation research to development of precise analysis method. In recent, the study of IIR-camera is carrying out discover of temperature of power equipment through condition diagnosis and system development of degradation diagnosis. In this study, SD occurred from IEC-60587 is measured with partial temperature distribution in real time, the degradation grade of SD is analyzed through produced patterns in IEC-60587 according to applied time.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.07a
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• pp.763-766
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• 2000

In this paper, stator form-winding sample coils based on silicone resin and polyimide were made for fault prediction and reliability estimation on the 200 Class insulation system of traction motors. The complex accelerative degradation was performed by periods during 10 cycles, which was composed of thermal stress, fast rising surge voltage, vibration, water immersion and overvoltage applying. After aging of 10 cycles, condition diagnosis test such as insulation resistance & polarization index, capacitance & dielectric loss and partial discharge properties were investigated in the temperature range of 20∼160$^{\circ}C$. Relationship among condition diagnosis test was analyzed to find an dominative degradation factor and an insulation state at end-life point.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.26 no.7
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• pp.1241-1249
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• 2002

The extent of materials deterioration can be evaluated accurately by mechanical test such as impact test or creep test. But it is almost impossible to extract a large test specimen from in-service components. Thus material degradation evaluation by non-destructive method is earnestly required. In this paper, the material degradation for virgin and several aged materials of a Cr-Mo-V steel, which is an candidated as structural material of the turbine casing components for electric power plant, is nondestructively evaluated by reactivation polarization testing method. And, the results obtained from the test are compared with those in small punch(SP) tests recommended as a semi-nondestructive testing method using miniaturized specimen. In contrast to the aged materials up to 1,000hrs which exhibit the degradation behaviors with increased ${\Delta}[DBTT]_{SP}$, the improvement of mechanical property can be observed on the 2,000hrs and 3,000hrs aged materials. This is because of the softening of material due to the carbide precipitation, the increase of ferritic structures and the recovery of dislocation microstructure by long-time heat treatment. The reactivation rates($I_R/I_{Crit},\;Q_R/Q_{Crit}$) calculated by reactivation current densityt ($I_R$) and charge($Q_R$) in the polarization curves exhibit a good correlation with ${\Delta}[DBTT]_{SP}$ behaviors.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 1999.05a
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• pp.712-715
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• 1999

Treeing has a profit to observe processing electrical breakdown because it gives degradation steps of insulation material by optical method. But, reappearance properly of treeing is not so good and precise quantization of tree growth is not so easy because tree Patterns are very complicate. The study on tree growth using image processing is predicted to precision of tree degradation and possible to quality measurement of tree pattern. In this paper, degradation steps are analyzed by image processing, therefore precision and realiability of tree growth are increased. Also, processing of tree degradation is quantized by fractal.

• Current Photovoltaic Research
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• v.11 no.4
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• pp.108-113
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• 2023

Pressure to reduce costs in the current solar market is driving the development and implementation of new module designs and prompting the use of new materials and components. In order to utilize the variability of each material that makes up the module, it is essential to understand the basic characteristics of the material. In this article, we evaluate light degradation after UV irradiation as an encapsulation material. Measure and analyze the results of various characteristic tests for discoloration, optical and electrical property degradation before and after UV accelerated testing. To evaluate weathering stability, UV tests were performed comparing existing EVA and UVT-EVA, POE and improved low-cost POE. Even in the weather resistance test with a total UV exposure of 60 kW/m², the properties of the encapsulants were mostly stable. EVA and POE-based encapsulants showed slight differences, and these slight differences are believed to pose a threat to long-term stability. This study is a basic analysis of encapsulation research for PV modules and will be helpful in understanding future development and encapsulant properties.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.30 no.10
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• pp.631-636
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• 2017

The degradation mechanism of $Mo_xW_{1-x}Si_2$ ultrahigh-temperature heating elements fabricated by self-propagating high-temperature synthesiswas investigated. The $Mo_xW_{1-x}Si_2$ specimens (with and without post-annealing) were subjected to ADTs (accelerated degradation tests) at temperatures up to $1,700^{\circ}C$ at heating rates of 3, 4, 5, 7, and $14^{\circ}C/min$. The surface loads of all the specimen heaters were increased with the increase in the target temperature. For the $Mo_xW_{1-x}Si_2$ specimens without annealing, many pores and secondary-phase particles were observed in the microstructure; the surface load increased to $23.9W/cm^2$ at $1,700^{\circ}C$, while the bending strength drastically reduced to 242 MPa. In contrast, the $Mo_xW_{1-x}Si_2$ specimens after post-annealing retained $single-Mo_xW_{1-x}Si_2$ phases and showed superior durability after the ADT. Consequently, it is thought that the formation of microcracks and coarse secondary phases during the ADT are the main causes for the degraded performance of the $Mo_xW_{1-x}Si_2$ heating elements without post-annealing.