Case study of analysing the manufacturing process of silicon wafers based on a large set of data to identify the causes of nonconformities (대 용량 데이터를 사용한 실리콘 웨이퍼 제조공정의 품질특성 불량원인분석 사례)
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- Proceedings of the Korean Operations and Management Science Society Conference
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- 2006.05a
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- pp.86-91
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- 2006