• Applied Microscopy
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• v.42 no.4
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• pp.218-222
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• 2012

Modern aberration-corrected transmission electron microscope (TEM) with appropriate electron beam energy is able to achieve atomic resolution imaging of single and bilayer graphene sheets. Especially, atomic configuration of bilayer graphene with a rotation angle can be identified from the direct imaging and phase reconstructed imaging since atomic resolution Moir$\acute{e}$ pattern can be obtained successfully at atomic scale using an aberration-corrected TEM. This study boosts a reliable stacking order analysis, which is required for synthesized or artificially prepared multilayer graphene, and lets graphene researchers utilize the information of atomic configuration of stacked graphene layers readily.

• Journal of the Korean Society of Food Science and Nutrition
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• v.36 no.5
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• pp.603-608
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• 2007

Changes in physicochemical quality and antioxidant activity of kiwifruits by the low dose electron beam irradiated(0, 0.3, 0.6 kGy) were investigated. Fruits were stored at $20^{\circ}C$ for 28 days and evaluated after 0, 1, 2, 3, and 4 week storage. Irradiation did not affect 1,1-diphenyl-2-picrylhydrazyl (DPPH) radical scavenging activities, and pH. Vitamin C contents of irradiated fruits were higher than non-irradiated fruits. Irradiation caused no significant change in total sugar contents and reducing sugar contents. Soluble solid contents in irradiated fruits were higher than non-irradiated fruits for the initial storage period but showed lower increment rate during the storage period. Organic acid contents of irradiated fruit did not show significant effect for the initial and during the storage periods, rate of decline in organic acid content of irradiated fruit were not significantly changed. Results indicated that electron beam irradiation of kiwifruit up to 0.6 kGy is effective in was delayed ripening with no significant changes on antioxidant activity and physicochemical qualify of kiwifruit.

• Proceedings of the Korean Society for Technology of Plasticity Conference
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• 2007.05a
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• pp.241-245
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• 2007

The residual stress in axial stress in the axial direction of the steel filaments has been measured by using a method based on the combination of the focused ion beam (FIB) and high resolution strain mapping program (VIC-2D). That is, the residual stress was calculated from the measured displacement field before and after the introduction of a slot along the steel filaments. The displacement was obtained by the digital correlation analysis of high-resolution scanning electron micrographs, while the slot was introduced by FIB milling with low energy beam. The present measurement revealed that the residual stress within 8% of the magnitude was persistent in the steel filaments fabricated.

• 전자공학회논문지 IE
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• v.47 no.2
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• pp.8-12
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• 2010

TEM is a powerful tool for semiconductor material analyses in structure or biological sample in micro structure. TEM observation need to make to coincide specimens for special purpose. in this paper, we have experimented for minimum surface damage on bulk wafer and patterned specimen by various conditions such as accelerating energy, depth of ion beam, ion milling types, and etc. in various specimen preparation methods by FIB (Focus Ion Beam). The optimal qualified specimens are contain low mounts of surface damage(about 5 nm) on patterned specimen.

• Transactions of Materials Processing
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• v.16 no.4 s.94
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• pp.323-328
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• 2007

The residual stress in axial direction of the steel wires has been measured by using a method based on the combination of the focused ion beam(FIB) milling and digital image correlation(DIC) program. The residual stress is calculated from the measured displacement field before and after the introduction of a slot along the steel wires. The displacement is obtained by the digital correlation analysis of high-resolution scanning electron micrographs, while the slot is introduced by FIB milling with low energy beam. The experimental procedures are described and the feasibilities are demonstrated in steel wires fabricated with different conditions. It reveals that the tensile residual stress is formed in all steel wires and this is strongly influenced by the fabrication conditions.

• The Journal of Korean Society for Radiation Therapy
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• v.29 no.2
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• pp.65-73
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• 2017

Purpose: Machine Performance Check (MPC) is a self-checking software based on the Electronic Portal Imaging Device (EPID) to measure daily beam outputs without external installation. The purpose of this study is to verify the usefulness of MPC by comparing and correlating daily beam output of QA Beamchecker PLUS. Materials and Methods: Linear accelerator (Truebeam 2.5) was used to measure 10 energies which are composed of photon beams(6, 10, 15 MV and 6, 10 MV-FFF) and electron beams(6, 9, 12, 16 and 20 MeV). A total of 80 cycles of data was obtained by measuring beam output measurement before treatment over five months period. The Pearson correlation coefficient was used to evaluate the consistency of the beam output between the MPC and the QA Beamchecker PLUS. In this study, if the Pearson correlation coefficient is; (1) 0.8 or higher, the correlation is very strong (2) between 0.6 and 0.79, the correlation is strong (3) between 0.4 and 0.59, the correlation is moderate (4) between 0.2 and 0.39, the correlation is weak (5) lower than 0.2, the correlation is very weak. Results: Output variations observed between MPC and QA Beamchecker PLUS were within 2 % for photons and electrons. The beam outputs variations of MPC were $0.29{\pm}0.26%$ and $0.30{\pm}0.26%$ for photon and electron beams, respectively. QA Beamchecker PLUS beam outputs were $0.31{\pm}0.24%$ and $0.33{\pm}0.24%$ for photon and electron beams, respectively. The Pearson correlation coefficient between MPC and QA Beamchecker PLUS indicated that photon beams were very strong at 15 MV, and strong at 6 MV, 10 MV, 6 MV-FFF and 10 MV-FFF. For electron beams, the Pearson correlation coefficient were strong at 16 MeV and 20 MeV, moderate at 9 MeV and 12 MeV, and very weak at 6 MeV. Conclusion: MPC showed significantly strong correlation with QA Beamchecker PLUS when testing with photon beams and high-energy electron beams in the evaluation of daily beam output, but the correlation when testing with low-energy electron beams (6 MeV) appeared to be low. However, MPC and QA Beamchecker PLUS are considered to be suitable for checking daily beam output, as they performed within 2 % of beam output consistency during the observation. MPC which can perform faster than the conventional daily beam output measurement tool, is considered to be an effective method for users.

• Progress in Medical Physics
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• v.13 no.4
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• pp.195-201
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• 2002

Several investigators have presented the effects of external magnetic fields on the dose distributions for clinical electron and photon beams. We focus the low energy electron beam with more lateral scatter In this study we calculated the beam profiles for an clinical electron beam of 6 MeV with longitudinal magnetic fields of 0.5 T-3.0 T using a Monte Carlo code. The principle of dose enhancements in the penumbra region is to deflect the laterally scattered electrons from its initial direction by the skewness of the laterally scattered electrons along the direction of magnetic field lines due to Lorentz force under longitudinal magnetic field. To discuss the dose enhancement effect on the penumbra area from the calculated results, we introduced the simple term of penumbra reduction ratio (PRR), which is defined as the percentage difference between the penumbra with and without magnetic field at the same depth. We found that the average PRR are 33%, and 49% over the depths of 1.5 cm, 2.0 cm, and 2.4 cm for the magnetic fields of 2.0 T and 3.0 T respectively. For the case of 0.5 T and 1.0 T the effects of magnetic filed were not observed significantly. In order to obtain the dose enhancement effects by the external magnetic field, we think that its strength should be more than 2 T approximately. We expect that the PRR would be saturated to 50-60% with magnetic fields of 3 T-5 T As a result of these calculations we found that the penumbra widths can be reduced with increased magnetic fields. This Penumbra reduction is explained as a result of electron lateral spread outside the geometrical edges of the beam in a longitudinal magnetic field. This means that the electron therapy benefits from the external magnetic fields.

• Journal of the Korean Vacuum Society
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• v.4 no.S2
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• pp.163-169
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• 1995

Ion beam assisted deposition(IBAD) technique was used to synthesize hard coatings including diamond-like carbon(DLC), carbon nitride(CN) and metal-ceramic multilayered films. It was found that DLC films formed at low energy ion bombardment possess more $Sp^3$ bonds and much higher hardness. The films exhibited an excellent wear resistance. Nanometer multialyered Fe/TiC films was deposited by ion beam sputtering. The structure and properties were strongly dependent on the thickness of the individual layers and modulation wave length. It was disclosed that both hardness and toughness of the films could be enhanced by adjusting the deposition parameters. The CN films synthesized by IBAD method consisted of tiny crystallites dispersed in amorphous matrix, which were identified by electron diffraction pattern to be $\beta -C_3N_4$.

• Progress in Medical Physics
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• v.20 no.4
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• pp.317-323
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• 2009

The standard dosimetry systems based on an absorbed dose to water recommend to use a planeparallel chamber for the calibration of such a low-megavoltage electron beam as a nominal energy of 6 MeV. For this energy ranges of an electron beam a cylindrical chamber should not be used for the routinely regular beam calibration, but the feasibility of the temporary use of a cylindrical chamber was studied to give temporary solutions for special situations users meet. The PTW30013 chambers and the electron beam quality of $R_{50}=2.25\;g/cm^2$ were selected for this study. 10 PTW30013 chambers, a cylindrical type of chamber, were calibrated in KFDA, the secondary standards dosimetry laboratories, and given the absorbed dose-to-water calibration factors, respectively. A "temporary" $k_{Q,Q_0}$ for each chamber were calculated using the absorbed dose determined by a cross-calibrated planeparallel chamber, with the result of an average 0.9352 for 10 chambers. This value for PTW30013 chamber was used to determine an absorbed dose to water at the reference depth. The absorbed doses determined by PTW30013 chambers were in an agreement within 2% with that by ROOS chamber. In a certain situation where a cylindrical chamber be used instead of a planeparellel chamber, the value of 0.9352 might be useful to determine an absorbed dose to water in the same beam quality of electron beam as this study.

• 한국정보디스플레이학회:학술대회논문집
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• 2002.08a
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• pp.221-223
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• 2002

We have measured the secondary electron emission yield ${\gamma}_i$ from MgO films deposited on $SiO_2/Si$ for low energy noble ions. A pulsed ion beam technique was employed in order to suppress the surface charging effect during the measurement. From the measurement of the ion - induced secondary electron emission coefficients ${\gamma}_i$ for 5 noble ions with energies ranging from 50 eV to 225 eV, it was shown that, with increasing the kinetic energies of the incident ions, the ${\gamma}_i$ increased