• Information Systems Review
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• v.20 no.1
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• pp.61-80
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• 2018

Individuals often receive smishing campaigns (mobile phishing messages), which they treat as spam. Thus, firms should understand how their customers distinguish their promotion messages from smishing. However, only a few studies examined this important issue. The present study employs the elaboration likelihood model to develop research hypotheses on the relationship between message cue and message credibility. The message cue in this study is classified as content cue, which is found in the content of promotion messages, and as leakage cue, which is found in peripheral information in the message. Leakage cue includes orthography (inclusion of special characters)and an abbreviated link sent by a faithless sender. We also propose that contextualization has a moderating effect on the relationship between content cue and credibility. We conducted a survey experiment to examine the effect of message cues on message credibility in the context of respondents receiving discount coupons through mobile messages. The result of data analysis based on 166 responses suggests that leakage cue had a negative effect on message credibility. A message with defective content cue has a marginally negative effect on message credibility. In particular, defective content cue in a high-contextual message has a strong negative impact on message credibility. This effect was not observed in low-contextual messages. Moreover, message credibility is significantly low regardless of the degree of contextualization if there is a leakage cue in the message. Our findings suggest that mobile promotion messages should be customized for message receivers and should have no leakage cues.

• Management Science and Financial Engineering
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• v.16 no.2
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• pp.81-97
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• 2010

Trust is one of the most important aspects of the relationship between retailers and consumers in e-commerce. Users may have concerns about transaction security or personal information leakage when they engage in transactions over the Internet. It can be difficult to attract customers if the retailers or service providers cannot establish trust with their customers. There have been many studies of trust-building mechanisms between customers and e-storefronts. However, little work has been done on identifying the relationships between customer satisfaction, purchase intention, and trust. In addition, trust building occurs in the pre- and post-purchase phases of an e-commerce transaction, as well as gradually over repeated transactions. Thus we distinguish between cue-based trust and experience-based trust. The objective of this study was to explain the impact of trust on customer satisfaction and purchase intention in relation to e-commerce sites from the perspective of a multi-dimensional concept of trust. We surveyed 350 undergraduate students and obtained 331 responses for analysis. The result of our analysis showed that cue-based trust has a positive relationship with trust based on experience. Although the two concepts of trust have positive relationships with satisfaction, the path coefficient of trust based on experience was higher than that of cue-based trust. In addition, the purchase intention mediates the relationship between cue-based trust and experience-based trust.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.36D no.10
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• pp.9-16
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• 1999

When the conventional IPD (inter-poly-dielctrics) layer with ONO(oxide-nitride-oxide) structure was used in the Flash EEPROM cell, its data retention characteristics were significanfly degraded because the top oxide of the ONO layer was etched off due to the cleaning process used in the gate oxidation process for the peripheral MOSFETs. When the IPD layer with the ONON(oxide-nitride-oxide-nitride) was used there, however, its data retention characteristics were much improved because the top nitride of the ONON layer protected the top oxide from being etched in the cleaning process. For the modelling of the data retention characteristics of the Flash EEPROM cell with the ONON IPD layer, the decrease of the threshold voltage cue to the charge loss during the bake was here given by the empirical relation ${\Delta}V_t\; = \;{\beta}t^me^{-ea/kT}$ and the values of the ${\beta}$=184.7, m=0.224, Ea=0.31 eV were obtained with the experimental measurements. The activation energy of 0.31eV implies that the decrease of the threshold voltage by the back was dur to the movement of the trapped electrons inside the inter-oxide nitride layer. On the other hand, the results of the computer simulation using the model were found to be well consistent with the results of the electrical measurements when the thermal budget of the bake was not high. However, the latter was larger then the former in the case of the high thermal budger, This seems to be due to the leakage current generated by the extraction of the electrons with the bake which were injected into the inter-oxide niride later and were trapped there during the programming, and played the role to prevent the leakage current. To prevent the generation of the leakage current, it is required that the inter-oxide nitride layer and the top oxide layer be made as thin and as thick as possible, respectively.