CHAOTIC ANALYSIS OF PARTIAL DISCHARGE (CAPD) AS A NOVEL APPROACH TO INVESTIGATE INSULATION DEGRADATION CAUSED BY THE VARIOUS DEFECTS (다양한 결함으로부터 발생되는 절연열화를 검출하기 위한 새로운 접근기법으로써의 카오스 분석)
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- Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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- 2001.05c
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- pp.221-224
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- 2001