• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2008.05a
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• pp.734-737
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• 2008

This paper presents a new automatic TFT-LCD image quality optimization system. We also have developed new algorithms using 6-point programmable matching technique with reference gamma curve, and automatic power setting sequence. It optimizes automatically gamma adjustment and power setting registers in mobile TFT-LCD driver IC to reduce gamma correction error, adjusting time, and flicker. Developed algorithms and programs are generally applicable for most of the TFT-LCD modules. The proposed optimization system contains module-under-test (MUT, TFT-LCD module), control program, multimedia display tester for measuring luminance and flicker, and control board for interface between PC and TFT-LCD module. The control board is designed with DSP, and it supports various interfaces such as RGB and CPU. Developed automatic image quality optimization system showed significantly reduced gamma adjusting time, reduced flicker, and much less average gamma error than competing system. We believe that the proposed system is very useful to provide high image quality TFT-LCD and to reduce developing process time using optimized gamma-curve setting and automatic power setting.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2008.10a
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• pp.592-595
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• 2008

This paper presents development of automatic image quality register optimization system using mobile TFT-LCD (Thin Film Transistor-Liquid Crystal Display) driver IC and embedded software. It optimizes automatically gamma adjustment and voltage setting registers in mobile TFT-LCD driver IC to improve gamma correction error, adjusting time, flicker noise and contrast ratio. Developed algorithms and embedded software are generally applicable for most of the TFT-LCD modules. The proposed optimization system contains module-under-test (MUT, TFT-LCD module), control program, multimedia display tester for measuring luminance, flicker noise and contrast ratio, and control board for interface between PC and TFT-LCD module. The control board is designed with DSP and FPGA, and it supports various interfaces such as RGB and CPU.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.06a
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• pp.216-219
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• 2005

In recent, LCD becomes one of the main display devices and expected to have quite good market share during the next couple of years. The demand for low cost and high performance, however, is becoming severe as the competition among other display devices like PDP, OLED increases. To satisfy this demand from market, we need to optimize the parts or modules of the LCD, reduce the number of the assemble and enhance the process for the high brightness and uniformity of the LCD. The LCD consists mainly of LCD panel and Backlight unit(BLU). BLU, which takes big portion of the cost for LCD, consists of light source, light guide panel and many kinds of functional film. Recently light guide panel or film for BLU has micro patterns on its surface and consequently to reduce the number of parts and enhace the brightness and its uniformity. In this study, some methodologies for the fabrication of the master/stamper and molding the light quide panel are introduced for 50um pitch of prizm patterned substrate. Mechanical machining process is adapted and optimized to fabricate micro patterned stamper using the micro cutting tool. Injection molding technology is also developed to obtain uniformly replicated micro patterned products.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2006.05a
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• pp.405-406
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• 2006

Recently, the flat display modules such as plasma or TFT-LCD employ thin crystallized panels which are normally weak to high level transient mechanical energy inputs. As a result, anti-shock performance is one of the most important design specifications for TFT-LCD modules. However, most of large display module designs are generated based on engineers own experiences. Also, a large-scale analysis to evaluate complex material and structural behaviors is one of interesting topic in diverse engineering and scientific fields. The utilization of massively parallel processors has also been a recent trend of high performance computing. The objective of this paper is to introduce a parallel process system which consists of general purpose finite element analysis solver as well as parallelized PC cluster. The parallel processing system is constructed using thirty-two processing elements and the finite element program is developed by adopting hierarchical domain decomposition method. In order to verify the efficiency of the established system, an impact analysis on thin and complex sub-parts of flat display modules is performed. The evaluation results showed a good agreement with the corresponding reference solutions, and thus, the parallel process system seems to be a useful tool fur the complex structural analysis such as IT related products.

• Transactions on Electrical and Electronic Materials
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• v.9 no.3
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• pp.110-115
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• 2008

In this paper, we have designated a 42-inch RGB LED BLU, 80 % above illuminance. A desirable brightness performance was attained, by doing anti-parallel configuration, a fitting of LED's strip distance and a height of the top of LED to the back of the LCD. We get the 85.81 % of the brightness uniformity which has 12.8 mm away from LED's top and LCD's back and 51.41 mm of the same spacing between LED's strip in simulation and 82.24 % in experiment.

• Journal of the Optical Society of Korea
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• v.17 no.5
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• pp.392-398
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• 2013

As the essential techniques for the CD (Critical Dimension) measurement of the LCD pattern, there are various modules such as an optics design, auto-focus [1-4], and precise edge detection. Since the operation of image enhancement to improve the CD measurement repeatability, a ring type of the reflected lighting optics is devised. It has a simpler structure than the transmission light optics, but it delivers the same output. The edge detection is the most essential function of the CD measurements. The CD measurement is a vital inspection for LCDs [5-6] and semiconductors [7-8] to improve the production yield rate, there are numbers of techniques to measure the CD. So in this study, a new subpixel algorithm is developed through facet modeling, which complements the previous sub-pixel edge detection algorithm. Currently this CD measurement system is being used in LCD manufacturing systems for repeatability of less than 30 nm.

• Journal of Biomedical Engineering Research
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• v.13 no.4
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• pp.269-274
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• 1992

In this paper, we describe the design methodology and specifications of the developed module-based bedside monitors for patient monitoring. The bedside monitor consists of a main unit and module cases with various parameter modules. The main unit includes a 12.1" TFT color LCD, a main CPU board, and peripherals such as a module controller, Ethernet LAN card, video card, rotate/push button controller, etc. The main unit can connect at maximum three module cases each of which can accommodate up to 7 parameter modules. They include the modules for electrocardiograph, respiration, invasive blood pressure, noninvasive blood pressure, temperature, and SpO2 with Plethysmograph.raph.

• Journal of Biomedical Engineering Research
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• v.18 no.2
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• pp.133-146
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• 1997

In this paper, we describe the design methodology and specifications of the developed module-based bedside monitors for patient monitoring. The bedside monitor consists of a main unit and module cases with various parameter modules. The main unit includes a 12.1" TFT color LCD, a main CPU board, and peripherals such as a module controller, Ethernet LAN card, video card, rotate/push button controller, etc. The main unit can connect at maximum three module cases, each of which can accommodate up to 7 parameter modules. They include the modules for electrocardiograph, respiration, invasive blood pressure, noninvasive blood pressure, temperature, and SpO with plethysmograph.raph.

• Journal of Korean Institute of Industrial Engineers
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• v.29 no.1
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• pp.1-13
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• 2003

In this paper, LAC(Look-ahead AGV Controller) has been developed for efficient routing of parts in semiconductor and LCD production systems. Several procedures have been developed as sub-modules. LACP(Look-ahead AGV Control Procedure) which controls AGVs using the information on the current and future status of the systems is the main element of the LAC. To support LACP, DSP(Destination Selection Procedure) which determines a destination of a part and AGV call time, SSP(Source Selection Procedure)which selects a part coming next to a buffer when the buffer becomes available. and RTM(Response Time Model) which estimates empty travel time of AGVs and waiting time for an available AGV have been developed. A simulation experiment shows that LAC reduces part's flow time, AGV utilization, average and maximum inventory level of a central buffer, empty travel time of an AGV, and waiting time for an available AGV.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.47 no.1
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• pp.17-28
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• 2010

This paper presents a new automatic TFT-LCD image quality optimization system using DSP for the first time. Since conventional manual method depends on experiences of LCD module developers, it is highly labor-intensive and requires several correction steps providing large gamma correction error. The proposed system optimizes automatically gamma adjustment and power setting registers in mobile TFT-LCD driver IC to reduce gamma correction error, adjusting time, and flicker. It contains module-under-test (MUT, TFT-LCD module), PC installed with program, multimedia display tester for measuring luminance and flicker, and control board for interface between PC and TFT-LCD module. We have developed a new algorithm using 6-point programmable matching technique with reference gamma curve and applying automatic power setting sequence. Developed algorithm and program are generally applicable for most of the TFT-LCD modules. It is realized to calibrate gamma values of 1.8, 2.0, 2.2 and 3.0, and reduce flicker level. The control board is designed with DSP and FPGA, and it supports various interfaces such as RGB and CPU. Developed automatic image quality optimization system showed significantly reduced gamma adjusting time, reduced flicker, and much less average gamma error than conventional manual method. We believe that the proposed system is very useful to provide high-quality TFT-LCD and to improve developing process using optimized gamma-curve setting and automatic power setting.