• Title/Summary/Keyword: LCD inspection

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Development of Automatic Nut Inspection System using Image Processing (이미지 프로세싱을 이용한 자동 너트 검사 장비 개발)

  • Lee, Sang-Hak;Seo, Myong-Ho;Chung, Tae-Choong
    • The KIPS Transactions:PartA
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    • v.11A no.4
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    • pp.235-242
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    • 2004
  • When manufacturing information and communication device that consists of lots of part, it is important to improve the quality of the produced system by inspecting the system accurately and exclude the defected part. In case of LCD which is recently in a great demand, the inspection process of the nut which bonds the back frame to protect the LCD panel has to be done by human labor. It highly required an automatic inspection system which can inspect the nut without wasting human resources. In this paper, we describe the process of developing a system which automatically inspect the status of nuts inserted during the manufacturing of LCD. The nut inspection vision system developed measures the number of nut's spiral, the distance between pitches, the width of a pitch, and the inside diameter of nut. We have adopted lens with high magnifying power and calibration tool and intended to produce automatic lighting for maintaining a stable environment for a high precision system. We also developed the algorithms for analyzing the nut. We apply the system to real factory field and verify that it is better than the man power in terms of error rate.

Segmentation of Defective Regions based on Logical Discernment and Multiple Windows for Inspection of TFT-LCD Panels (TFT-LCD 패널 검사를 위한 지역적 분별에 기반한 결함 영역 분할 알고리즘)

  • Chung, Gun-Hee;Chung, Chang-Do;Yun, Byung-Ju;Lee, Joon-Jae;Park, Kil-Houm
    • Journal of Korea Multimedia Society
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    • v.15 no.2
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    • pp.204-214
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    • 2012
  • This paper proposes an image segmentation for a vision-based automated defect inspection system on surface image of TFT-LCD(Thin Film Transistor Liquid Crystal Display) panels. TFT-LCD images have non-uniform brightness, which is hard to finding defective regions. Although there are several methods or proposed algorithms, it is difficult to divide the defect with high reliability because of non-uniform properties in the image. Kamel and Zhao disclosed a method which based on logical stage algorithm for segmentation of graphics and character. This method is a one of the local segmentation method that has a advantage. It is that characters and graphics are well segmented in an image which has non-uniform property. As TFT-LCD panel image has a same property, so this paper proposes new algorithm to segment regions of defects based on Kamel and Zhao's algorithm. Our algorithm has an advantage that there are a few ghost objects around the defects. We had experiments to prove performance in real TFT-LCD panel images, and comparing with the FFT(Fast Fourier Transform) method which is used a bandpass filter.

In-line Automatic defect inspection and repair method for TFT-LCD production

  • Honoki, Hideyuki;Arai, T.;Edamura, T.;Yoshimura, K.;Nakasu, N.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08a
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    • pp.286-289
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    • 2007
  • We have developed an automated circuit defect inspection and repair method that can be used to improve the yield ratio of TFT-LCD. The method focuses on correcting resist patterns after the development process to ensure shape regularity. We built a prototype system and confirmed that the method is valid.

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Manufacturing of molybdenum pin(CCFL) for electrode - convergency research on design and manufacturing of JIG and Fixture for molybdenum pin manufacturing and inspection (전극용 몰리브덴 핀 제조-몰리브덴 핀 제작 및 검사용 JIG and Fixture 설계 및 제작 융합연구)

  • Lee, Jeong-Ick
    • Journal of the Korea Convergence Society
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    • v.11 no.6
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    • pp.197-201
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    • 2020
  • The molybdenum cup and molybdenum pin, which are the main materials of the molybdenum electrode used for the LCD BLU CCFL electrode, did not been developed in Japan and all of them are imported and used from Japan, is giving a competitive burden. In this research, to develop the manufacturing technology of molybdenum pin used for CCFL electrode of LCD BLU, development of linear processing technology, development of molybdenum wire surface treatment technology, development of wire cutting technology, production of molybdenum pin, design and fabrication of JIG and Fixture for inspection, molybdenum pin prototyping and analysis, and development of 100% molybdenum pin inspection technology. In this paper, especially, research on design and manufacturing of JIG and Fixture for molybdenum pin manufacturing and inspection is treated.

Pattern Elimination Method Based on Perspective Transform for Defect Detection of TFT-LCD (TFT-LCD의 결함 검출을 위한 원근 변환 기반의 패턴 제거 방법)

  • Lee, Joon-Jae;Lee, Kwang-Ho;Chung, Chang-Do;Park, Kil-Houm;Park, Yun-Beom;Lee, Byung-Gook
    • Journal of Korea Multimedia Society
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    • v.15 no.6
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    • pp.784-793
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    • 2012
  • Defects of TFT-LCD is detected by thresholding the difference image between the input image and template one because LCD panel has its inherent patterns. However, the pitch corresponding to pattern period is gradually changed according to the distance from the center of camera due to geometric distortion of camera characteristics. This paper presents a method to detect defects through comparing the pitch area with neighbor pitch areas where the perspective transform is performed with the extracted features to correct the distortion. The experimental results show that the performance of the proposed method is very effective for real data.

Defect Cell Extraction for TFT-LCD Auto-Repair System (TFT-LCD 자동 수선시스템에서 결함이 있는 셀을 자동으로 추출하는 방법)

  • Cho, Jae-Soo;Ha, Gwang-Sung;Lee, Jin-Wook;Kim, Dong-Hyun;Jeon, Edward
    • Journal of Institute of Control, Robotics and Systems
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    • v.14 no.5
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    • pp.432-437
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    • 2008
  • This paper proposes a defect cell extraction algorithm for TFT-LCD auto-repair system. Auto defect search algorithm and automatic defect cell extraction method are very important for TFT-LCD auto repair system. In the previous literature[1], we proposed an automatic visual inspection algorithm of TFT-LCD. Based on the inspected information(defect size and defect axis, if defect exists) by the automatic search algorithm, defect cells should be extracted from the input image for the auto repair system. For automatic extraction of defect cells, we used a novel block matching algorithm and a simple filtering process in order to find a given reference point in the LCD cell. The proposed defect cell extraction algorithm can be used in all kinds of TFT-LCD devices by changing a stored template which includes a given reference point. Various experimental results show the effectiveness of the proposed method.

Fabrication of high brightness multi-lamp backlight system for a large size LCD panel inspection equipment

  • Chun, Young-Tea;Lim, Sung-Kyoo;Lee, Kwang-Kyu;Lee, Hwan-Woong
    • 한국정보디스플레이학회:학술대회논문집
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    • 2004.08a
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    • pp.787-790
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    • 2004
  • The large size and high brightness backlight system for LCD panel inspection equipment was designed, fabricated, and evaluated. The cold cathode fluorescent lamp (CCFL) instead of the hot cathode fluorescent lamp (HCFL) were used as the light source. The inverters for driving multi-lamp CCFL backlight systems were also designed and fabricated. The measured luminance of the fabricated CCFL backlight system was 20,000 cd/$m^2$ and the uniformity of the backlight was 85%. The fabricated backlight system was successfully applied to the LCD panel inspection equipment.

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Adaptive Thresholding Method Using Zone Searching Based on Representative Points for Improving the Performance of LCD Defect Detection (LCD 결함 검출 성능 개선을 위한 대표점 기반의 영역 탐색을 이용한 적응적 이진화 기법)

  • Kim, Jin-Uk;Ko, Yun-Ho;Lee, Si-Woong
    • The Journal of the Korea Contents Association
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    • v.16 no.7
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    • pp.689-699
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    • 2016
  • As the demand for LCD increases, the importance of inspection equipment for improving the efficiency of LCD production is continuously emphasized. The pattern inspection apparatus is one that detects minute defects of pattern quickly using optical equipment such as line scan camera. This pattern inspection apparatus makes a decision on whether a pixel is a defect or not using a single threshold value in order to meet constraint of real time inspection. However, a method that uses an adaptive thresholding scheme with different threshold values according to characteristics of each region in a pattern can greatly improve the performance of defect detection. To apply this adaptive thresholding scheme it has to be known that a certain pixel to be inspected belongs to which region. Therefore, this paper proposes a region matching algorithm that recognizes the region of each pixel to be inspected. The proposed algorithm is based on the pattern matching scheme with the consideration of real time constraint of machine vision and implemented through GPGPU in order to be applied to a practical system. Simulation results show that the proposed method not only satisfies the requirement for processing time of practical system but also improves the performance of defect detection.

Inspection of Point Defects on A LCD panel Using High Resolution Line Cameras (고해상도 라인 스캔 카메라를 이용한 LCD 점 이물 검출)

  • 백승일;곽동민;박길흠
    • Proceedings of the IEEK Conference
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    • 2003.11a
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    • pp.351-354
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    • 2003
  • To inspect point-defect in LCD pannel, calculate period and eliminated pattern. And then find point-defect to compare block image with each period. First processing, Founded over point defects. To reduce wrong point defect. Next, label point-defects and eliminated not surpass fixed limit-size.

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