• The Transactions of The Korean Institute of Electrical Engineers
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• v.56 no.5
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• pp.980-986
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• 2007

Boundary scan test structure(JTAG IEEE 1149.1 standard) that supports an internal scan chain is generally being used to test CUT(circuit under test). Since the internal scan chain can only have a single scan-in port and a single scan-out port; however, existing boundary test methods can not be used when multiple scan chains are present in CUT. Those chains must be stitched to form a single scan chain as shown in this paper. We propose an efficient boundary scan test structure that adds a circuit called Clock Group Register(CGR) for multiple clocks testing within the design of multiple scan chains. The proposed CGR has the function of grouping clocks. By adding CGR to a previously existing boundary scan design, the design is modified. This revised scan design overcomes the limitation of supporting a single scan-in port and out port, and it bolsters multiple scan-in ports and out ports. Through our experiments, the effectiveness of CGR is proved. With this, it is possible to test more complicated designs that have high density with a little effort. Furthermore, it will also benefit in designing those complicated circuits.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.27 no.1A
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• pp.66-72
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• 2002

In this paper, we implemented the GenJTAG, a CAD tool, which generates a code of boundary scan circuit supporing a board level testing and d BIST(Built-In Self Test) written in verilog-HDL. A boundary scan circuit code that supports user's own BIST instructions is generated based on the informations from the users. Most CAD tools hardly allow users to add their own BIST instructions because the generated code described in gate-level. But the GenJTAG generates a behavioral boundary scan circuit code so users can easily make a change on the generated code.

• Proceedings of the IEEK Conference
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• 2002.06b
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• pp.329-332
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• 2002

The traditional debug tools for chip tests and software developments need a huge investment and a plenty of time. These problems can be overcome by Embedded Debugger based the JTAG boundary Scan Architecture. Thus, the IEEE 1149.1 standard is adopted by ASIC designers for the testability problems. We designed the RED(Reusable Embedded Debugger) using the JTAG boundary Scan Architecture. The proposed debugger is applicable for not a chip test but also a software debugging. Our debugger has an additional hardware module (EICEM : Embedded ICE Module) for more critical real-time debugging.

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.41 no.8
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• pp.85-92
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• 2004

A design of a preceding instruction decoding module(PIDM) is proposed aiming at performance enhancement of JTAG-based test complying to the IEEE 1149.1 standard. The PIDM minimizes the number of clocks by performing test access port(TAP) instruction decoding process prior to the execution of TAP-controlled test activities. The scheme allows the generation of signals such as test mode select(TMS) inside of a target system. The design employing PIDM demonstrates 15% performance enhancement with simulation of a CORDIC processor and 48% reduction of the TAP-controller's circuit size with respect to the conventional design of a non-PIDM version.

• Proceedings of the KIEE Conference
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• 2004.07d
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• pp.2625-2627
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• 2004

Recently many technology of the T.T.P.(Train Tilting Processor) has been introduced for an efficient real-time operating system. but the problems of testing increasing complex digital integrated system continue to challenge the design and test community. Design main processor part that can be used on railroad synthesis control part by ARM CORE chip.

• Proceedings of the Korea Information Processing Society Conference
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• 2008.11a
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• pp.810-813
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• 2008

본 논문에서 연구하고 구현된 JTAG(Joint Test Action Group) Writer는 하나의 SoC(System On a Chip)만 지원하도록 설계된 기존 제품의 단점을 보완할 수 있도록 각 SoC의 제조 회사에서 제공하는 BSDL(Boundary Scan Description Language)을 이용하여 여러 가지 SoC에 쉽게 사용할 수 있도록 모듈화 했다. 그리고 기존 제품들이 사용하고 있는 직렬 포트나 병렬 포트 대신 안정적이고 편리한 USB(Universal Serial Bus) 접속규격을 지원하도록 개선했다.