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Preceding Instruction Decoding Module(PIDM) for Test Performance Enhancement of JTAG based Systems  

윤연상 (충북대학교 정보통신공학과)
김승열 (충북대학교 정보통신공학)
권순열 (충북대학교 정보통신공학)
박진섭 (충북대학교 정보통신공학)
김용대 (충북대학교 정보통신공학)
유영갑 (충북대학교 정보통신공학과)
Publication Information
Journal of the Institute of Electronics Engineers of Korea SD / v.41, no.8, 2004 , pp. 85-92 More about this Journal
Abstract
A design of a preceding instruction decoding module(PIDM) is proposed aiming at performance enhancement of JTAG-based test complying to the IEEE 1149.1 standard. The PIDM minimizes the number of clocks by performing test access port(TAP) instruction decoding process prior to the execution of TAP-controlled test activities. The scheme allows the generation of signals such as test mode select(TMS) inside of a target system. The design employing PIDM demonstrates 15% performance enhancement with simulation of a CORDIC processor and 48% reduction of the TAP-controller's circuit size with respect to the conventional design of a non-PIDM version.
Keywords
TMS signal generator; JTAG boundary scan test; CORDIC;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
연도 인용수 순위
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