• Title/Summary/Keyword: Inverse Weibull Distribution

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A Study on Attribute Analysis of Software Development Cost Model about Life Distribution Considering Shape Parameter of Weibull Distribution (수명분포가 와이블 분포의 형상모수를 고려한 소프트웨어 개발 비용모형에 관한 속성분석 연구)

  • Kim, Hee-Cheul
    • The Journal of Korea Institute of Information, Electronics, and Communication Technology
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    • v.11 no.6
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    • pp.645-650
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    • 2018
  • Software stability is the possibility of operating without any malfunction in the operating environment over time. In a finite failure NHPP for software failure analysis, the failure occurrence rate may be constant, monotonically increasing, or monotonically decreasing. In this study, based on the NHPP model and based on the software failure time data, we compared and analyzed the attributes of the software development cost model using the exponential distribution Rayleigh distribution and inverse exponential distribution considering the shape parameter of the Weibull distribution as the life distribution. The results of this study show that the Rayleigh model is the fastest release time and has the economic cost compared to the inverse-exponential model and the Goel-Okumoto model. Using the results of this study, it can be expected that software developers and operators will be able to predict the optimal release time and economic development cost.

Weibull Step-Stress Type-I Model Predict the Lifetime of Device (소자의 수명 예측을 위한 Weibull Step-Stress Type-I Model)

  • 정재성;오영환
    • Journal of the Korean Institute of Telematics and Electronics A
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    • v.32A no.6
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    • pp.67-74
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    • 1995
  • This paper proposes the step-stress type-I censoring model for analyzing the data of accelerated life test and reducing the time of accelerated life test. In order to obtain the data of accelerated life test, the step-stress accelerated life test was run with voltage stress to CMOS Hex Buffer. The Weibull distribution, the Inverse-power-law model and Maximum likelihood method were used. The iterative procedure using modified-quasi-linearization method is applied to solve the nonlinear equation. The proposed Weibull step-stress type-I censoring model exactly estimases the life time of units, while reducting the time of accelerated life test and the equipments of test.

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Analysis of reliability test results of low-pass filter assembly (저역필터 어셈블리에 대한 신뢰성시험 결과의 해석)

  • Baik, Jaiwook
    • Journal of Applied Reliability
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    • v.14 no.1
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    • pp.45-51
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    • 2014
  • Thermal shock tests at two stress levels were performed to see the life (cycles) of LPF ASSY (low pass filter assembly) at normal stress level. In this case Coffin-Manson relationship is generally used to describe the relationship between the temperature difference and the life, together with the Weibull distribution describing the life at each stress level. So for given data Coffin-Manson is fitted to predict the life at normal stress level. However, different types of models are appropriate for this type of test. Hence, a more appropriate model such as General log-linear model which can also incorporate the duration at the highest and lowest temperatures and acceleration time will be introduced.

Breakdown Characteristics and Lifetime Estimation of Rubber Insulating Gloves Using Statistical Models

  • Kim, Doo Hyun;Kang, Dong Kyu
    • International Journal of Safety
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    • v.1 no.1
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    • pp.36-42
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    • 2002
  • This paper is aimed at predicting the life of rubber insulating gloves under normal operating stresses from relatively rapid test performed at higher stresses. Specimens of rubber insulating gloves are subject to multiple stress conditions, i.e. combined electrical and thermal stresses. Two modes of electrical stress, step voltage stress and constant voltage stress are used in specimen aging. There are two types of test for electrical stress in this experiment: the one is Breakdown Voltage (BDV) test under step voltage stress and thermal stress and the other is lifetime test under constant voltage stress and temperature stress. The ac breakdown voltage defined as the break-down point of insulation that leakage current excesses a limit value, l0mA in this experiment, is determined. Because the very high variability of aging data requires the application of statistical model, Weibull distribution is used to represent the failure times as the straight line on Weibull probability paper. Weibull parameters are deter-mined by three statistical methods i.e. maximum likelihood method, graphical method and least squares method, which employ SAS package, Weibull probability paper and FORTRAN, respectively. Two chosen models for predicting the life under simultaneous electrical and thermal stresses are inverse power model and exponential model. And the constants of life equation for multistress aging are calculated using numerical method, such as Gauss Jordan method etc.. The completion of life equation enables to estimate the life at normal stress based on the data collected from accelerated aging test. Also the comparison of the calculated lifetimes between the inverse power model and the exponential model is carried out. And the lifetimes calculated by three statistical methods with lower voltage than test voltage are compared. The results obtained from the suggested experimental method are presented and discussed.

Comparison of Two-time Homogeneous Poisson Processes Using Inverse Type Sapling Plans (역샘플링법을 이용한 포와슨과정의 비교)

  • 장중순;임춘우;정유진
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.11 no.17
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    • pp.67-80
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    • 1988
  • This study is concerned with the comparison of two time homogeneous Poisson processes. Traditionally, the methods of testing equality of Poisson processes were based on the binomial distribution or its normal approximations. The sampling plans used in these methods are to observe the processes concurrently over a predetermined time interval, possibly different for each process. However, when the values of the intensities of the processes are small, inverse type sampling plans are more appropriate since there may be cases where only a few or even no events are observed in the predetermined time interval. This study considers 9 inverse type sampling plans for the comparison of two Poisson processes. For each sampling plans considered, critical regions and the design parameters of the sampling plan are determined to guarantee the significance level and the power at some values of the alternative hypothesis. The Problem of comparing of two Weibull processes are also considered.

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Analytical Approximation Algorithm for the Inverse of the Power of the Incomplete Gamma Function Based on Extreme Value Theory

  • Wu, Shanshan;Hu, Guobing;Yang, Li;Gu, Bin
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.15 no.12
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    • pp.4567-4583
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    • 2021
  • This study proposes an analytical approximation algorithm based on extreme value theory (EVT) for the inverse of the power of the incomplete Gamma function. First, the Gumbel function is used to approximate the power of the incomplete Gamma function, and the corresponding inverse problem is transformed into the inversion of an exponential function. Then, using the tail equivalence theorem, the normalized coefficient of the general Weibull distribution function is employed to replace the normalized coefficient of the random variable following a Gamma distribution, and the approximate closed form solution is obtained. The effects of equation parameters on the algorithm performance are evaluated through simulation analysis under various conditions, and the performance of this algorithm is compared to those of the Newton iterative algorithm and other existing approximate analytical algorithms. The proposed algorithm exhibits good approximation performance under appropriate parameter settings. Finally, the performance of this method is evaluated by calculating the thresholds of space-time block coding and space-frequency block coding pattern recognition in multiple-input and multiple-output orthogonal frequency division multiplexing. The analytical approximation method can be applied to other related situations involving the maximum statistics of independent and identically distributed random variables following Gamma distributions.

Nonparametric Estimation for Ramp Stress Tests with Stress Bound under Intermittent Inspection (단속적 검사에서 스트레스한계를 가지는 램프스트레스시험을 위한 비모수적 추정)

  • Lee Nak-Young;Ahn Ung-Hwan
    • Journal of Korean Society for Quality Management
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    • v.32 no.4
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    • pp.208-219
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    • 2004
  • This paper considers a nonparametric estimation of lifetime distribution for ramp stress tests with stress bound under intermittent inspection. The test items are inspected only at specified time points an⊂1 so the collected observations are grouped data. Under the cumulative exposure model, two nonparametric estimation methods of estimating the lifetime distribution at use condition stress are proposed for the situation which the time transformation function relating stress to lifetime is a type of the inverse power law. Each of items is initially put on test under ramp stress and then survivors are put on test under constant stress, where all failures in the Inspection interval are assumed to occur at the midi)oint or the endpoint of that interval. Two proposed estimators of quantile from grouped data consisting of the number of items failed in each inspection interval are numerically compared with the maximum likelihood estimator(MLE) based on Weibull distribution.

Comparison to Automobile Pilot Lamp by Accelerated Life Test (가속수명시험을 통한 자동차용 파일럿램프의 비교평가)

  • Shin, Min-Gyung;Wei, Shin-Hwan;Kim, Hyung-Min
    • Journal of Applied Reliability
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    • v.8 no.2
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    • pp.75-85
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    • 2008
  • In this paper, we compared domestic with foreign pilot lamps installed on the instrument board or electronic modules (car audio, air-conditional system, etc.) of an automotive vehicle by an accelerated life test in order to estimate the life of domestic pilot lamps. An accelerated life test method was developed and the relation of the life and voltage stress was analyzed. The main results are as follows; i) $B_{10}$ life of pilot lamp is above 5,000 hours, vehicle travel time for 10 years. ii) the life of domestic pilot lamp is longer than that of foreign thing. iii) the life distribution of domestic pilot lamp is wider than that of foreign thing. iv) it is possible to promote import replacement of automobile pilot lamp.

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Stand Structure of the Natural Broadleaved-Korean Pine Forests in Northeast China

  • Li, Fengri;Ma, Zhihai
    • Journal of Korean Society of Forest Science
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    • v.94 no.5 s.162
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    • pp.321-329
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    • 2005
  • Based on the data representing four typical Korean pine forest types, the age structure, DBH distribution, species composition, and forking rule were systemically analyzed for old-growth Korean pine forest in Liangshui Nature Reserve, northeast China. The age structure of Korean pine trees was strongly uneven-aged with one dominated peak following normal distribution, and age of trees varied from 100 to 180 years within a stand. The DBH and height differences in same age class (20 years) varied from 28 cm~64 cm and 5 to 20 m, respectively. Many conifer and hard wood species, such as spruce, fir, costata birch, basswood, oak, and elm, were mixed with dominated trees of Korean pine. The canopy of the old-growth Korean pine forest can be divided into two layers, and differences of mean age and height between Layer I and Layer II were ranged 80~150 years and 7~13 m, respectively. The Weibull function was used to model the diameter distribution and performed well to describe size-class distribution either with a single peak in over-story canopy and inverse J-shape in under-story canopy for old-growth Korean pine stands. The forking height of Korean pine trees ranged from 16m to 24 m (mean 19.4 m) and tree age about 120 to 160 years old. The results will provide a scientific basis to protect and recover the ecosystem of natural old-growth Korean pine and also provide the model in management of Korean pine plantation.

A Study on Accelerated Life Test of Halogen Lamps for Medical Device (의료용 할로겐램프의 가속수명시험에 관한 연구)

  • Jung, Jae Han;Kim, Myung Soo;Lim, Heonsang;Kim, Yong Soo
    • Journal of Korean Society for Quality Management
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    • v.41 no.4
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    • pp.659-672
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    • 2013
  • Purpose: The purpose of this study was to estimate life time of halogen lamps and acceleration factors using accelerated life test. Methods: Voltage was selected as an accelerating variable through the technical review about failure mechanism. The test was performed at 14.5V, 15.5V and 16.5 for 4,471 hours. It was assumed that the lifetime of Halogen lamps follow Weibull distribution and the inverse power life-stress relationship models. Results: Mean lifetimes of pin and screw types were 19,477 hours and 6,056 hours, respectively. In addition, acceleration factor of two items are calculated as 4.8 and 2.2 based on 15.5V, respectively. Conclusion: The life-stress relationship, acceleration factor, and MTTF at design condition are estimated by analyzing the accelerated life test data. These results suggest that voltage was very important factor to accelerate life time in the case of halogen lamps and the life time of pin type is three times longer than screw type lamps.