• Current Optics and Photonics
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• 제7권1호
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• pp.65-72
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• 2023

The motion of organelles inside a cell is an important intrinsic indicator for assessing cell physiology and tissue viability. Dynamic contrast full-field optical coherence tomography (D-FFOCT) is a promising imaging technology that can visualize intracellular movements using the variance of temporal interference signals caused by biological motions. However, double-path interferometry in D-FFOCT can be highly vulnerable to surrounding noise, which may cause turbulence in the interference signals, contaminating the sample dynamics. Therefore, we propose a method for stabilized D-FFOCT imaging in noisy environments by using common-path interferometry in D-FFOCT. A comparative study shows that D-FFOCT with the proposed method achieves stable dynamic contrast imaging of a scattering phantom in motion that is over tenfold more noise-insensitive compared to the conventional one, and thus this imaging capability can provide cleaner motion contrast images. With the proposed approach, the intracellular dynamics of biological samples are imaged and monitored.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2007년도 추계학술대회 논문집
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• pp.43-44
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• 2007

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2007년도 춘계학술대회 논문집
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• pp.63-64
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• 2007

• 한국광학회:학술대회논문집
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• 한국광학회 2004년도 제15회 정기총회 및 동계학술발표회
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• pp.358-359
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• 2004

• 한국고분자학회지:고분자과학과기술
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• 제9권4호
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• pp.307-314
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• 1998

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2011년도 춘계학술대회 논문집
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• pp.863-864
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• 2011

• 한국전자파학회논문지
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• 제24권4호
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• pp.459-465
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• 2013

본 논문에서는 차분 간섭 기법(differential interferometry)을 이용하여 지표면의 높이 변화를 탐지하고, 이를 이용하여 지표면 수분함유량의 변화를 알아낸다. 본 연구에서는 COSMO-SkyMed SAR 영상을 이용하여 DInSAR(DiFferential Interferometric SAR) 기법을 확인한다. 침투 깊이는 지표면 수분함유량에 따라 달라지며, 그에 따라 수신하는 신호의 위상이 변하게 된다. 지표면의 높이와 그 변위는 두 수신 신호의 위상차를 이용하는 레이더 간섭 기법(radar inteferometry)을 통하여 탐지할 수 있다. 변위 변화를 분석하기 위해 동일 지역의 영상 3장 중 한 장을 기준 영상(reference image)으로 사용한다. 동일 지역의 기준 영상과 나머지 두 영상은 각각 차분 간섭 기법으로 처리한다. 이 차분 간섭 기법을 검증하기 위해 실제 영상 획득 지역의 수분함유량을 측정하였다. 측정한 수분함유량을 이용하여 지표면의 침투 깊이를 계산하고, 차분 간섭 기법을 통하여 얻은 지표면 변위 정보와 비교 분석한다.

• Journal of the Optical Society of Korea
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• 제18권3호
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• pp.236-243
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• 2014

Surface profiling and film thickness measurement play an important role for inspection. White light interferometry is widely used for engineering surfaces profiling, but its applications are limited primarily to opaque surfaces with relatively simple optical reflection behavior. The conventional bucket algorithm had given inaccurate surface profiles because of the phase error that occurs when a thin-film exists on the top of the surface. Recently, reflectometry and white light scanning interferometry were combined to measure the film thickness and surface profile. These techniques, however, have found that many local minima exist, so it is necessary to make proper initial guesses to reach the global minimum quickly. In this paper we propose combing reflectometry and white light scanning interferometry to measure the thin-film thickness and surface profile. The key idea is to divide the measurement into two states; reflectometry mode and interferometry mode to obtain the thickness and profile separately. Interferogram modeling, which considers transparent thin-film, was proposed to determine parameters such as height and thickness. With the proposed method, the ambiguity in determining the thickness and the surface has been eliminated. Standard thickness specimens were measured using the proposed method. Multi-layered film measurement results were compared with AFM measurement results. The comparison showed that surface profile and thin-film thickness can be measured successfully through the proposed method.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2007년도 추계학술대회 논문집
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• pp.37-38
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• 2007

• 한국정밀공학회지
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• 제24권11호
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• pp.37-43
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• 2007