• 제목/요약/키워드: Interdigitated Structure

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고성능 평면 슈퍼커패시터를 위한 얇고 유연한 폴리아닐린 전극 제작 (Fabrication of a Thin and Flexible Polyaniline Electrode for High-performance Planar Supercapacitors)

  • 손선규;김서진;신준호;류태공;정재민;최봉길
    • 공업화학
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    • 제32권4호
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    • pp.403-408
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    • 2021
  • 본 논문에서는 얇고 유연한 평면 슈퍼 커패시터(PSC)를 스크린 인쇄된 탄소 전극에 폴리아닐린(PANI)을 코팅하여 제작하였습니다. 스크린 프린팅 방법을 사용하여 유연한 폴리에틸렌 테레프탈레이트에 탄소 잉크를 코팅한 후 희석 중합 법을 사용하여 탄소 표면에 PANI 박막을 코팅하였습니다. 서로 맞물린 구조의 얇은 유연한 PANI 전극을 폴리머겔 전해질로 조립하여 평면 모양의 슈퍼 커패시터(PSC) 장치를 만들었습니다. 상기 제조된 PANI/PSC는 매우 얇고 유연 하였으며, 10 mV/s에서 409 µF/cm2의 높은 면적 정전용량을 나타내었습니다. 이 값은 500 mV/s에서 원래 값의 46%로 유지되었습니다. 유연한 PANI/PSC는 180°의 구부러진 상태와 100번째의 반복적인 피로도 테스트에서도 82%의 높은 정전 용량 유지를 보여주었습니다.

IBC형 태양전지를 위한 균일하게 증착된 비정질 실리콘 층의 광섬유 레이저를 이용한 붕소 도핑 방법 (Boron Doping Method Using Fiber Laser Annealing of Uniformly Deposited Amorphous Silicon Layer for IBC Solar Cells)

  • 김성철;윤기찬;경도현;이영석;권태영;정우원;이준신
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2009년도 하계학술대회 논문집
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    • pp.456-456
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    • 2009
  • Boron doping on an n-type Si wafer is requisite process for IBC (Interdigitated Back Contact) solar cells. Fiber laser annealing is one of boron doping methods. For the boron doping, uniformly coated or deposited film is highly required. Plasma enhanced chemical vapor deposition (PECVD) method provides a uniform dopant film or layer which can facilitate doping. Because amorphous silicon layer absorption range for the wavelength of fiber laser does not match well for the direct annealing. In this study, to enhance thermal affection on the existing p-a-Si:H layer, a ${\mu}c$-Si:H intrinsic layer was deposited on the p-a-Si:H layer additionally by PECVD. To improve heat transfer rate to the amorphous silicon layer, and as heating both sides and protecting boron eliminating from the amorphous silicon layer. For p-a-Si:H layer with the ratio of $SiH_4$ : $B_2H_6$ : $H_2$ = 30 : 30 : 120, at $200^{\circ}C$, 50 W, 0.2 Torr for 30 minutes, and for ${\mu}c$-Si:H intrinsic layer, $SiH_4$ : $H_2$ = 10 : 300, at $200^{\circ}C$, 30 W, 0.5 Torr for 60 minutes, 2 cm $\times$ 2 cm size wafers were used. In consequence of comparing the results of lifetime measurement and sheet resistance relation, the laser condition set of 20 ~ 27 % of power, 150 ~ 160 kHz, 20 ~ 50 mm/s of marking speed, and $10\;{\sim}\;50 {\mu}m$ spacing with continuous wave mode of scanner lens showed the correlation between lifetime and sheet resistance as $100\;{\Omega}/sq$ and $11.8\;{\mu}s$ vs. $17\;{\Omega}/sq$ and $8.2\;{\mu}s$. Comparing to the singly deposited p-a-Si:H layer case, the additional ${\mu}c$-Si:H layer for doping resulted in no trade-offs, but showed slight improvement of both lifetime and sheet resistance, however sheet resistance might be confined by the additional intrinsic layer. This might come from the ineffective crystallization of amorphous silicon layer. For the additional layer case, lifetime and sheet resistance were measured as $84.8\;{\Omega}/sq$ and $11.09\;{\mu}s$ vs. $79.8\;{\Omega}/sq$ and $11.93\;{\mu}s$. The co-existence of $n^+$layeronthesamesurfaceandeliminating the laser damage should be taken into account for an IBC solar cell structure. Heavily doped uniform boron layer by fiber laser brings not only basic and essential conditions for the beginning step of IBC solar cell fabrication processes, but also the controllable doping concentration and depth that can be established according to the deposition conditions of layers.

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