A Prediction of Chip Quality using OPTICS (Ordering Points to Identify the Clustering Structure)-based Feature Extraction at the Cell Level (셀 레벨에서의 OPTICS 기반 특질 추출을 이용한 칩 품질 예측)
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- Journal of Korean Institute of Industrial Engineers
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- v.40 no.3
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- pp.257-266
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- 2014