• 제목/요약/키워드: InGaAs/InAlAs

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InAlAs/InGaAs/GaAs 100 nm-게이트 MHEMT 소자의 에피 구조 최적화 설계에 관한 연구 (Optimization Study on the Epitaxial Structure for 100nm-Gate MHEMTs with InAlAs/InGaAs/GaAs Heterostructure)

  • 손명식
    • 반도체디스플레이기술학회지
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    • 제10권4호
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    • pp.107-112
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    • 2011
  • This paper is for improving the RF frequency performance of a fabricated 100nm ${\Gamma}$-gate MHEMT, scaling down vertically for the epitaxy-structure layers of the device. Hydrodynamic simulation parameters are calibrated for the fabricated MHEMT with the modulation-doped $In_{0.52}Al_{0.48}As/In_{0.53}Ga_{0.47}$As heterostructure grown on the GaAs substrate. With these calibrated parameters, simulations for the vertically-scaled epitaxial layers of the device are performed and analyzed for DC/RF characteristics, including the quantization effect due to the thickness reduction of InGaAs channel layer. A newly designed epitaxy-structure device shows higher extrinsic transconductance, $g_m$ of 1.556 S/mm, and higher frequency performance, $f_T$ of 222.5 GHz and $f_{max}$ of 849.6 GHz.

2차원 Poisson방정식 풀이에 의한 단 채널 InAlAs/InGaAs HEMT의 전류-전압 특성 도출에 관한 해석적 모델 (An Analytical Model for the Derivation of the Ⅰ-Ⅴ Characteristics of a Short Channel InAlAs/InGaAs HEMT by Solving Two-Dimensional Poisson's Equation)

  • 오영해;서정하
    • 대한전자공학회논문지SD
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    • 제44권5호
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    • pp.21-28
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    • 2007
  • 본 논문에서는 2차원 Poisson 방정식의 풀이에 의한 submicron 급 단 채널 n-InAlAs/InGaAs HEMT의 전류-전압 특성 도출에 관한 해석적 모델을 제안하였다. InAlAs 및 InGaAs층 내에서 2차원 Poisson 방정식의 해법으로 2차원적 전위 변화를 채널 전류의 연속조건과 consistent하게 도출하기 위해서 InGaAs 영역에 형성된 양자우물 형태의 채널을 통해 흐르는 전자에 대한 전계-의존 이동도를 고려하였다. 도출된 표현식은 동작 전압 전 구간의 영역과 장/단 채널 소자에 대하여 일괄적으로 적용될 수 있을 것으로 보이며, 본 논문에서 제안한 단 채널 n-InAlAs/InGaAs HEMT의 2차원 전계 효과에 대한 해석적 모델은 기존의 모델에서 submicron 대의 짧은 채널 길이일 때 정확도가 저하되거나 Early 효과에 대한 설명이 미흡한 것에 비해 드레인 전압의 증가에 따른 드레인 포화 전류의 증가 및 문턱전압의 감소 현상 등을 보다 물리적으로 적절히 설명할 수 있음을 보이고 있다.

DDH 구조를 갖는 고출력 AlGaAs/AlGaAs 적외선 LED소자의 특성 (The Characteristics of High Power AlGaAs/AlGaAs Infrared LED with DDH structure)

  • 이은철;라용춘;엄문종;이철진;성만영;성영권
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1996년도 하계학술대회 논문집 C
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    • pp.1459-1461
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    • 1996
  • The optical and electrical properties of High Power AlGaAs/AlGaAs Infrared LED with DDH( Double power Double Hetero Junction) structure are investigated. The high power LED is recently studied in order to apply to high speed communication devices. The power out of AlGaAs/AlGaAs with DDH structure is 13.0[mW], the forward voltage is 1.45[V], and the average decrease rate of power out is about 5[%] after aging test. The optical and electrical properties of DDH structure LED are superior than that of SH structured LED. The DDH structured LED is suitable to the high speed communication devices.

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InGaAs 위의 NH3 Plasma Passivation을 이용한 ALD HfAlO유전체 계면전하(Dit) 향상 (Improved Dit between ALD HfAlO Dielectric and InGaAs Substrate Using NH3 Plasma Passivation)

  • 최재성
    • 반도체디스플레이기술학회지
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    • 제17권4호
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    • pp.27-31
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    • 2018
  • The effect of $NH_3$ plasma passivation on the chemical and electrical characteristics of ALD HfAlO dielectric on the InGaAs substrate was investigated. The results show that $NH_3$ plasma passivation exhibit better electrical & chemical performance such as much lower leakage current, lower density of interface trap(Dit) level, and low unstable interfacial oxide. $NH_3$ plasma passivation can effectively enhance interfacial characteristics. Therefore $NH_3$ plasma passivation improved the HfAlO dielectric performance on the InGaAs substrate.

고온 특성을 위한 AlGaAs/GaAs HBT의 설계에 관한 연구 (Ohmic Resistance of AlGaAs/GaAs HBT at High Temperature)

  • 이준영;신훈법;안형근;한득영
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2002년도 하계학술대회 논문집
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    • pp.366-370
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    • 2002
  • GaAs has become a very popular material for the fabrication of high frequency, low noise and microwave power devices. GaAs devices are also well suited for high temperature operation because of the large band gap of this material. The standard GaAs technology and device structures have to be modified for stable operation at high temperature. In this paper, AlGaAs/GaAs HBT considering stable ohmic contact at high temperature as well as thermal effect such as self-heating effect are introduced. All the data obtained study will be used as input data for the simulator and the result will be compared with an analytical model available in this study,

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저강도 레이저가 흰쥐 창상 후 급성통증에 미치는 영향 (The Effect of Low Power Laser Irradiation on acute pain of Rats Induced by Wound)

  • 김동현;백수정;김석범;송주민;김진상
    • The Journal of Korean Physical Therapy
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    • 제14권2호
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    • pp.234-249
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    • 2002
  • This study was performed, using c-fos and Substance P, to investigate the effect of GaAlAs laser on acute pain model induced by wound in lumbar region's spinal level. The test group was divided into control and experimental group. Control group is shamed group(c-fos and substance P expression after non-irradiation by a GaAlAs laser), The experimental group was divided into two subgroups: one is experimental group I (c-fos expression after irradiation by a GaAlAs laser), and the other is experimental group II (substance P expression after irradiation by a GaAlAs laser). The results of this study were as following: 1. The numbers of c-fos immunoreactive neuron in spinal cord was increased markedly 1 day after wound, and decreased gradually from 1 day to 2 days in wound with GaAlAs laser irradiation. 2. The changes of the average percentages of substance P immunoreactive neurons in spinal cord was increased markedly 1 day after wound, and decreased gradually from 1 day to 2 days in wound with GaAlAs laser irradiation. Therefore, decreasing the changes of c-fos and substance P expression after irradiation by a GaAlAs laser indicates and GaAlAs laser have effect on pain control.

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BCl$_3$, BCl$_3$/Ar 고밀도 유도결합 플라즈마를 이용한 GaAs 와 AlGaAs 반도체 소자의 건식식각 (Dry Etching of GaAs and AlgaAs Semiconductor Materials in High Density BCl$_3$, BCl$_3$/Ar Inductively Coupled Plasmas)

  • 임완태;백인규;이제원;조관식;전민현
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.1
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    • pp.31-36
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    • 2003
  • We investigated dry etching of GaAs and AlGaAs in a high density planar inductively coupled plasma system with $BCl_3$ and $BCl_3/Ar$ gas chemistry. A detailed process study as a function of ICP source power, RIE chuck power and $BCl_3/Ar$ mixing ratio was performed. At this time, chamber pressure was fixed at 7.5 mTorr. The ICP source power and RIE chuck power were varied from 0 to 500 W and from 0 to 150 W, respectively. GaAs etch rate increased with the increase of ICP source power and RE chuck power. It was also found that etch rate of GaAs in $BCl_3$ gas with 25% Ar addition was superior to that of GaAs in a pure $BCl_3$ (20 sccm $BCl_3$) plasma. The result was same with AlGaAs. We expect that high ion-assisted effect in $BCl_3$/Ar plasma increased etch rates of both materials. The GaAs and AIGaAs features etched at 20 sccm $BCl_3$ and $15BCl_3/5Ar$ with 300 W ICP source power, 100 W RIE chuck power and 7.5 mTorr showed very smooth surfaces(RMS roughness < 2 nm) and excellent sidewall. XPS study on the surfaces of processed GaAs also proved extremely clean surfaces of the materials after dry etching.

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InAlGaAs/InGaAs HBT의 Monte carlo 해석 (Monte carlo analysis of InAlGaAs/InGaAs HBT)

  • 황성범;김용규;송정근
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 1998년도 하계종합학술대회논문집
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    • pp.405-408
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    • 1998
  • Due to the large conduction band discontinuity between emitter base, OmGaAs HBT has an advantge to enable the hot electrons to inject into the base. In this paper, InAlGaAs/InGaAs HBT with the various emitter junction gradings and the modified collectors are simulated and analyzed by HMC(hybrid monte carlo) simulator in order to find a optimal structure for the shortest transit time. A minium base transit time (.tau.$_{b}$ ) of 0.21 ps was obtained for HBT with the grading layer, which is parabolically graded from x=1.0 to x=0.5. The minimum collector transit time (.tau.$_{c}$ ) of 0.31ps was found when the collector was modified by inserting p$^{[-10]}$ and p$^{+}$ layers. Thus HBT in combination with the emitter grading and the modified collector layer showed the cut-off frequency (f$_{T}$) of 183GHz.z.z.

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GaAs/AlGaAs 양자세선의 전자기적 특성 (Electro-magnetic properties of GaAs/AlGaAs quantum wires)

  • 이주인;서정철;이창명;임재영
    • 한국진공학회지
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    • 제10권2호
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    • pp.262-266
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    • 2001
  • GaAS/AlGaAS 이종접합구조 위에 Split gate로 양자세선을 제작하여 Shubnikov de Haas 진동 및 양자 Hall 효과 측정으로 1DEG의 전기적 특성을 관측하였다. Gate 전압이 증가할수록 채널폭이 좁아짐에 따라 ID 특성이 나타났다. Edge state 수송 이론인 Landauer-Butikker formula로부터 QHE plateau와 SdH 진동의 최소값이 나타나는 자기장 영역이 일치하지 않고 있는 현상을 명확히 규명하였다.

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다층 성장한 InAs/InAlGaAs 양자점의 광학적 특성 (Optical Characteristics of Multi-Stacked InAs/InAlGaAs Quantum Dots)

  • 오재원;권세라;류미이;조병구;김진수
    • 한국진공학회지
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    • 제20권6호
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    • pp.442-448
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    • 2011
  • 자발형성법으로 InP (001) 기판에 성장한 InAs/InAlGaAs 양자점(QDs, quantum dots)의 광학적 특성을 PL (photoluminescence)과 TRPL (time-resolved PL)을 이용하여 분석하였다. InAs 양자점 시료는 single layer InAs/InAlGaAs QDs (QD1)과 7-stacked InAs/InAlGaAs QDs (QD2)를 사용하였다. 저온(10 K)에서 QD1과 QD2 모두 1,320 nm에서 PL 피크가 나타났으며, 온도를 300 K까지 증가하였을 때 각각 178 nm와 264 nm의 적색편이(red-shift)를 보였다. QD1의 PL 소멸시간은 PL 피크인 1,320 nm에서 1.49 ns이고, PL 피크를 중심으로 장파장과 단파장으로 이동하면서 점차 짧아졌다. 그러나 QD2의 PL 소멸시간은 발광파장이 1,130 nm에서 1,600 nm까지 증가할 때 1.83 ns에서 1.22 ns로 점진적으로 짧아졌다. 이러한 QD2의 PL과 TRPL 결과는 평균 양자점의 크기가 InAs/InAlGaAs 층이 증가함에 따라 점차 증가하기 때문으로 single layer인 QD1에 비해 양자점 크기의 변화가 더 크기 때문으로 설명된다.