• Journal of the Korean Applied Science and Technology
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• v.19 no.2
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• pp.97-102
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• 2002

Recently, the phosphorescent organic light-emitting devices (OLEDs) have been extensively studied for their high internal quantum efficiency. In this study, we synthesised several phosphorescent metal complexes, and certified their composition using NMR. We also investigated the characteristics of the phosphorescent OLEDs with the green emitting phosphor, $Ir(ppy)_{3}$. The devices with a structure of indium-tin-oxide(ITO)/N,N'-diphenyl-N,N'-(3-methylphenyI}-1,1'-biphenyl-4,4'-diamine (TPD)/metal complex doped in host materials/2,9-dimethyl-4,7-diphenyl-l,10-phenanthroline(BCP)/tris (8-hydroxyquinolinato) Aluminum($Alq_{3}$)/Li:Al/Al was fabricated, and its electrical and optical characteristics were studied. By changing the doping concentration of tris(2-phenylpyridine)iridium ($Ir(ppy)_{3}$), we fabricated several devices and investigated their characteristics.

• Journal of Sensor Science and Technology
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• v.30 no.1
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• pp.51-55
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• 2021

We demonstrated a polymer dielectric with low leakage characteristics through an optimal blade coating method for low-cost and large-scale fabrication of metal-insulator-metal (MIM) capacitors. Cross-linked poly(4-vinylphenol) (C-PVP), which is a typically used polymer dielectric, was coated on a 10 × 10 cm indium-tin-oxide (ITO) deposited glass substrate by changing the deposition temperature (TD) and coating velocity (VC) in the blade coating. During the blade coating, the thickness of the thin c-PVP varied depending on TD and VC owing to the 'Landau-Levich (LL) regime'. The c-PVP-dielectric-based MIM capacitor fabricated in this study showed the lowest leakage current characteristics (10-6 A/㎠ at 1.2 MV/㎠, annealing at 200 ℃) and uniform electrical characteristics when TD was 30 ℃ and VC was 5 mm/s. In addition, at TD = 30 ℃, stable leakage characteristics were confirmed when a different electric field was applied. These results are expected to positively contribute to applications with next-generation electronic devices.

• Journal of the Semiconductor & Display Technology
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• v.22 no.3
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• pp.101-105
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• 2023

Organic photo Diodes (OPDi) give multiple advantages in the growing interest of the flexible optoelectronic devices. Organic semiconductors are freeform as they can deposit on any substrate, so it could be flexible. But the inorganic material photodiodes (PDs) are usually fabricated on silicon wafers which are solid. So, normally PDs are inflexible. By those reasons, we decided to make the vacuum deposited small molecule OPDi. We have investigated the OPDi's J-V characteristic by changing the thickness of p-type layer of OPDi. This device consists of indium-tin-oxide (ITO) / 2,3:6,7-dibenzanthracene (pentacene) / buckminsterfullerene (C60) / aluminum (Al). Its J-V characteristics were measured in the probe station(4156C) that can give dark condition while measuring. And for the luminance characteristics, the photocurrent was measured with the bright halogen lamp and a probe station.

• Journal of the Microelectronics and Packaging Society
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• v.25 no.1
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• pp.29-33
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• 2018

Flexible electronics must be stable under various deformations such as bending, folding, and rolling. The reliability of ITO (Indium Tin Oxide) film used widely as a transparent electrode for flexible electronics has been studied using rolling fatigue test and bending test. During repeated rolling deformations, the electrical resistance was in-situ measured with different number of rotation. During rolling fatigue test, the electrical resistance of ITO film was significantly increased with increasing the number of rotation. As the stress state of ITO film is different according to the relative position of ITO and substrate, the rolling fatigue test was investigated under both outer and inner bending conditions. Inner rolling fatigue test showed superior electrical stability because the crack nucleation and propagation were retarded under compressive stress state.

• Proceedings of the Korean Vacuum Society Conference
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• 2000.02a
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• pp.72-72
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• 2000

ITO(Indium-Tin-Oxide)는 n-type 전도 특성을 갖는 산화물 반도체로서 가시광 영역에서의 높은 광투과율 및 낮은 전기 비저항을 나타내기 때문에 태양전지, 액정디스플레이(liquid crystal display), 터치스크린(touch screen) 등의 투명전극 재료, 전계 발광(electroluminescent) 소자, 표면발열체, 열반사 재료 등 다양한 분야에 응용되고 있다. 본 연구에서는 타겟 제작에 드는 비용을 줄이고, 타겟 이용의 효율성을 높이기 위해 기존의 세라믹 타겟 대신 분말 타겟을 사용하여 유리 기판 상에 ITO 박막을 DC magnetron sputtering법에 의해 제조하고, 열처리 온도 및 열처리 분위기에 따른 ITO 박막의 전기적 광학적 특성을 조사하였다. 열처리 온도가 10$0^{\circ}C$이하인 경우 열처리하지 않은 시편과 동일하게 In2O3의 (411)면에 해당하는 peak가 관찰되었다. 그러나 20$0^{\circ}C$의 온도로 열처리 할 경우 (411)면 peak의 세기는 상대적으로 감소하고 대신 이전에 나타나지 않았던 (222)면에 대응하는 peak 세기가 현저하게 증가함을 알 수 잇다. 이것은 ITO 박막의 경정성장이 열처리 전 (411)면 방향으로 이루어지나 20$0^{\circ}C$의 온도로 열처리 후 재결정화에 의해 (222)면 방향으로의 우선방위를 갖고 성장함을 의미한다. 또한 주로 높은 기판온도에서 관찰되었던 (211), (400), (411), (440), (622)면 등에 해당하는 peak가 나타남을 볼 수 있었다. 열처리 온도를 더욱 증가시킴에 따라 결정구조에는 큰 변화 없이 (222)면 peak 세기가 증가하였다. 한편 열처리 온도를 더욱 증가시킴에 따라 (222)면 peak 세기가 상대적으로 조금 감소할뿐 XRD회절 결과에는 큰 변화를 관찰할 수 없었다. 이러한 결과로부터 기판을 가열하지 않고 증착한 ITO 박막의 재결정화에 필요한 최소의 열처리 온도는 20$0^{\circ}C$이며, 그 이상의 열처리 온도는 ITO박막의 결정구조에 큰 영향을 미치지 않음을 알 수 있었다. 열처리 전 비저항은 1.1$\times$10-1 $\Omega$-cm 의 값을 가지거나 10$0^{\circ}C$의 온도로 열처리함에 따라 9.8$\times$102$\Omega$-cm 로 약간 감소하였다. 열처리 온도를 20$0^{\circ}C$로 높임에 따라 비저항은 급격히 감소하여 1.7$\times$10-3$\Omega$-cm의 최소값을 나타내었다. 열처리 온도가 10$0^{\circ}C$인 경우 가시광 영역에서의 광투과율은 열처리하지 않은 시편과 비교해 볼 때 약간 증가하였다. 열처리 온도는 20$0^{\circ}C$로 증가시킴에 따라 투과율은 크게 향상되어 흡수단 이상의 파장영역에서 90% 이상의 투과율을 나타내었다. 이러한 광투과율의 향상은 앞서 증착된 ITO 박막이 열처리 중 재결합에 의해 우선 성장 방위가 (411)면 방향에서 (222)면 방향으로 변화되었기 때문으로 생각된다. 그러나 열처리 온도를 20$0^{\circ}C$이상으로 증가시켜도 광투과율은 큰 변화를 나타내지 않았다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.06a
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• pp.331-331
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• 2009

Hafnium oxide ($HfO_2$) attracted by one of the potential candidates for the replacement of si-based oxides. For applications of the high-k gate dielectric material, high thermodynamic stability and low interface-trap density are required. Furthermore, the amorphous film structure would be more effective to reduce the leakage current. To search the gate oxide materials, metal-insulator-metal (MIM) capacitors was fabricated by pulsed laser deposition (PLD) on indium tin oxide (ITO) coated glass with different oxygen pressures (30 and 50 mTorr) at room temperature, and they were deposited by Au/Ti metal as the top electrode patterned by conventional photolithography with an area of $3.14\times10^{-4}\;cm^2$. The results of XRD patterns indicate that all films have amorphous phase. Field emission scanning electron microscopy (FE-SEM) images show that the thickness of the $HfO_2$ films is typical 50 nm, and the grain size of the $HfO_2$ films increases as the oxygen pressure increases. The capacitance and leakage current of films were measured by a Agilent 4284A LCR meter and Keithley 4200 semiconductor parameter analyzer, respectively. Capacitance-voltage characteristics show that the capacitance at 1 MHz are 150 and 58 nF, and leakage current density of films indicate $7.8\times10^{-4}$ and $1.6\times10^{-3}\;A/cm^2$ grown at 30 and 50 mTorr, respectively. The optical properties of the $HfO_2$ films were demonstrated by UV-VIS spectrophotometer (Scinco, S-3100) having the wavelength from 190 to 900 nm. Because films show high transmittance (around 85 %), they are suitable as transparent devices.

• Journal of Digital Convergence
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• v.12 no.7
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• pp.291-296
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• 2014

Inserting a $SiO_2$ layer underneath the p-pad electrode as the current blocking layer (CBL) structure and extending p-metal finger patterns, the GaN LEDs using an indium-tin-oxide (ITO) layer show the improved light output intensity, resulting from better current spreading and reduced light loss on the surface of p-pad metal. The LEDs with an oxide layer of $100{\mu}m$-pad-width and $6{\mu}m$-finger-width have better light output intensities than those with an oxide layer of $105{\mu}m$-pad-width and $12{\mu}m$-finger-width. Using the ATLAS device simulator from Silvaco Corporation, the current density distributions on the active layer in CBL LEDs have been investigated.

• Composites Research
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• v.24 no.1
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• pp.45-50
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• 2011

Transparent and conductive carbon nanotube on polyethylene terephthalate (PET) were prepared by dip-coating method for self-sensing multi-functional nanocomposites. The changes in the electrical and optical properties of CNT coating mainly depended on the number of dip-coating, concentration of CNT solution. Consequently, the surface resistance and transmittance of CNT coating were sensitively controlled by the processing parameters. Surface resistance of CNT coating was measured using four-point method, and surface resistance of coated CNT could be better calculated by using the dual configuration method. Optical transmittance of PET film with CNT coating was evaluated using UV spectrum. Surface properties of coated CNT investigated by wettability test via static and dynamic contact angle measurement were consistent with each other. As dip-coating number increased, surface resistance of coated CNT decreased seriously, whereas the transmittance exhibited little lower due to the thicker CNT networks layer. Interfacial microfailure properties were investigated for CNT and indium tin oxide (ITO) coatings on PET substrates by electrical resistance measurement under cyclic loading fatigue test. CNT with high aspect ratio exhibited no change in surface resistance up to 2000 cyclic loading, whereas ITO with brittle nature showed a linear increase of surface resistance up to 1000 cyclic loading and then exhibited the level-off due to reduced electrical contact points based on occurrence of many micro-cracks.

• Korean Journal of Materials Research
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• v.11 no.4
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• pp.305-311
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• 2001

$PbO-B_2O_3-SiO_2-Al_2O_3$, system was investigated for optical, thermal and electrical properties of transparent dielectric. We also studied the reaction between transparent dielectric and transparent electrode(Indium Tin Oxide, ITO) during firing. For the evaluation of properties, dielectrics were prepared under the conditions fired at 520~58$0^{\circ}C$ with 12$\mu\textrm{m}$ thickness. In the reaction between dielectrics and electrode(ITO), In ions diffused into dielectric layer, while Sn ion diffusion was not observed. The coefficient of thermal expansion, the dielectric constant, the glass transition temperature and the transmittance of the dielectric were greatly dependent on PbO content. The increase of the coefficient of thermal expansion and the dielectric constant were monitored by increasing PbO, while the glass transition temperature and the transmittance were decreased. With the increased $Al_2O_3/B_2O_3$ ratio, the coefficient of thermal expansion and the transmittance were decreased, while the dielectric constant was increased. The glass transition temperature did not change significantly.

• Proceedings of the Korean Vacuum Society Conference
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• 2015.08a
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• pp.162.2-162.2
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• 2015

플렉서블 디스플레이에 사용되는 투명전극은 벤딩에 의한 인장(tensile) 및 압축(compressive) 스트레스 하에서도 전극의 특성이 지속적으로 유지되어야 한다. 기존 OLED소자의 투명전극으로 사용되던 인듐산화물(ITO, Indium Tin Oxide)는 인듐(Indium)의 희소성 문제뿐만 아니라 벤딩에 대한 복원력이 나쁜 것으로 알려져 플렉서블 디스플레이에는 적합하지 않은 것으로 알려져 있다. 벤딩에 강하고 복원력이 우수한 투명전극 재료가 필요하게 되었다. 본 연구에서는 PEN (Polyethylene Naphthalate) 유연기판 상에 그래핀(Graphene)전극을 구현하여 벤딩에 대한 저항특성을 관찰하였고 일반적으로 많이 사용하는 Aluminum 전극과의 비교를 통해 광효율을 지속적으로 유지할 수 있는 플렉서블 OLED용 전극구현 가능성을 연구하였다. 일반적으로 Al금속은 인장 스트레스를 받음에 따라 저항이 증가하고 다시 복원되면 저항이 감소하는 특성을 갖고 있는데 인장 스트레스에 따라 저항과 늘어난 길이와의 관계는 다음과 같다. $R/R0=(L/L0)^2$ ----------------------------------------- (1) 그러나 반복된 스트레스가 가해질 경우 Al 금속 전극은 복원력을 잃고 저항이 원래대로 돌아가지 않는 문제가 발생하는데 반해 그래핀은 벌집모양의 구조를 갖고 있어 벤딩에 대한 강도가 셀 뿐만 아니라 고탄력으로 인해 복원력이 우수하여 여러 싸이클(cycle)의 벤딩 실험에 의해서도 복원력이 지속적으로 유지되었다. Al 금속 전극의 경우 벤딩 각도 또는 정도에 따라 복원력이 유지되는 구간이 있으나 반복적인 벤딩 싸이클에 의해 복원력이 감소하여 인장 스트레스에 의한 저항 증가 후 스트레스 제거 시 저항 감소가 되지 않는데 24시간 동안 전기 저항 변화를 관찰하면 수시간 후에나 저항이 어느 수준까지만 복원되는 것을 확인할 수 있었으나 복원에 오랜 시간이 소요된다는 점에서 그래핀과 비교가 된다. SEM(Scanning electron microscopy) 분석을 통해 인장 스트레스 인가/제거를 반복함에 따라 Al 금속표면이 표면에 열화되는 것을 확인하였으나 그래핀에서는 나타나지 않았다. 본 연구에서는 높은 투과도와 우수한 전기적 특성을 가지는 그래핀 투명 전도성 전극이 다양한벤딩 조건에서도 뛰어난 복원 특성을 보이는 것을 밝혀내어 차세대 투명 전극 물질로 개발하고자 하였다.