• 한국콘텐츠학회논문지
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• 제11권5호
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• pp.205-215
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• 2011

분광특성의 차이로 필름은 자외선에 민감한데 반해 디지털 카메라의 센서는 적외선에 굉장히 민감하다. 이에 따라 CCD 또는 CMOS를 사용하는 모든 디지털 카메라에는 IR Cut-Off Filter가 센서전면에 장착되어 있다. 이상적으로 100% 적외선을 차단하여야 하지만 실험 결과 완전히 적외선을 차단하지 못하고 있었으며, 각 카메라마다 적외선 투과량 또한 달랐다. 따라서 본 연구는 디지털 카메라에 장착되어 있는 IR Cut-Off Filter의 기계적 특성에 의해 투과되는 미량의 적외선이 디지털 화상이미지에 끼치는 영향을 분석하는 데 그 목적이 있다. UV필터를 장착한 상태(적외선 투과상태)와 UV-IR필터를 장착한 상태(적외선미투과상태)를 비교분석한 결과, 잡음(Noise)과 색 재현력 평가에서는 그 차이가 미세하거나 거의 동등한 수준이지만, 동적 폭(Dynamic Range)과 해상도에는 IR Cut-Off Filter를 통해 투과되는 미량의 적외선이 어느 정도 영향이 있음을 확인할 수 있었다.

• 한국재료학회지
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• 제17권6호
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• pp.323-330
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• 2007

We fabricated thermaly evaporated 10 nmNi/(poly)Si films to investigate the energy saving property of silicides formed by rapid thermal annealing (RTA) at the temperature of $300{\sim}1200^{\circ}C$ for 40 seconds. Moreover, we fabricated $10{\sim}50$ nm-thick ITO/Si films with a rf-sputter as reference films. A four-point tester was used to investigate the sheet resistance. A transmission electron microscope (TEM) and an X-ray diffractometer were used for the determination of cross sectional microstructure and phase changes. A UV-VISNIR and FT-IR (Fourier transform infrared rays spectroscopy) were employed for near-IR and middle-IR absorbance. Through TEM analysis, we confirmed $20{\sim}70nm-thick$ silicide layers formed on the single and polycrystalline silicon substrates. Nickel silicides and ITO films on the single silicon substrates showed almost similar absorbance in near-IR region, while nickel silicides on polycrystalline silicon substrate showed superior absorbance above 850 nm near-IR region to ITO films. Nickel silicide on polycrystalline substrate also showed better absorbance in middle IR region than ITO. Our result implies that nano-thick nickel silicides may have exellent absorbing capacity in near-IR and middle-IR region.

• 센서학회지
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• 제24권4호
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• pp.264-269
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• 2015

An infrared (IR) bolometer measures the change of resistance by absorbing incident IR radiation and generates a signal as a function of the radiation intensity. Since a bolometer requires temperature stabilization and light filtering except for the infrared rays, it is essential for the device to be packaged meeting conditions that above mentioned. Minimization of heat loss is needed in order to stabilize temperature of bolometer. Heat loss by conduction or convection requires a medium, so the heat loss will be minimized if the medium is a vacuum. Therefore, vacuum packaging for bolometer is necessary. Another important element in bolometer packaging is germanium (Ge) window, which transmits IR radiation to heat the bolometer. To ensure a complete transmittance of IR light, anti-reflection (AR) coatings are deposited on both sides of the window. Although the transmittance of Ge window is high for IR rays, it is difficult to use frequently in low-price IR bolometer because of its high price. In this paper, we fabricated IR window by utilizing silicon (Si) substrate instead of Ge in order to reduce the cost of bolometer packaging. To enhance the IR transmittance through Si substrate, it is textured using Reactive Ion Etching (RIE). The texturing process of Si substrate is performed along with the change of experimental conditions such as gas ratio, pressure, etching time and RF power.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2001년도 하계학술대회 논문집
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• pp.215-218
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• 2001

A flame detector responds either to radiant energy visible to the human eye or outside the range of human vision. Such a detector is sensitive to glowing embers, coals, or flames which radiate energy of sufficient intensity and spectral quality to actuate the alarm. An infra-red detectors can respond to the total IR component of the flame alone or in combination with flame flicker in the frequency range of 5 to 30 Hz. A major problem in the use of infrared detectors receiving total IR radiation is the possible interference of solar radiation in the infrared region. When detectors are located in places shielded from the sun, such as vaults. filtering or shielding the unit from the sun's rays is unnecessary. In this study, we proposed method for redue a false alarm with using filtering & sensor technology for distinguish of causes of raise a false alarm and pure flame.

• Journal of the Optical Society of Korea
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• 제9권4호
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• pp.151-156
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• 2005

A spatial-domain Fourier Transform (FT) infrared (IR) spectrometer coupled with a PtSi Schottky­barrier IR detector plane was developed in the spectral range of $2.0-2.5{\mu}m$ for noninvasive measurement of analyte concentrations in cell culture media during cell culture processing. A key optical component of the spectrometer is a Savart plate which is a birefringent polarizer generating coherent two rays for interfering. The spectral resolution of the spectrometer was determined as $71cm^{-1}$ (${\~}0.05{\mu}m$ at $2.5{\mu}m$). Clear IR fringe patterns were imaged on the IR detector plane. The feasibility of the spectrometer for our application was investigated by measuring absorbance spectra of glucose and fetal bovine serum (FBS) which are important compounds in cell culture media. Experiment results show that the spectral quality of glucose and FBS was comparable with the standard spectra acquired with a commercial FT-IR spectrometer, presenting the feasibility of the spectrometer to perform analyte measurement in cell culture media.

• 대한금속재료학회지
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• 제46권11호
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• pp.755-761
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• 2008

We fabricated thermally evaporated 10 nm-Ni/1 nm-Ir/(poly)Si films to investigate the energy saving property of silicides formed by rapid thermal annealing (RTA) at the temperature range of $300{\sim}1200^{\circ}C$ for 40 seconds. Moreover, we fabricated 100 nm-thick ITO/(poly)Si films with an rf-sputter as references. A transmission electron microscope (TEM) and an X-ray diffractometer were used to determine cross-sectional microstructure and phase changes. A UV-VIS-NIR and FT-IR (Fourier transform infrared spectroscopy) were employed for near-IR and middle-IR absorbance. Through TEM analysis, we confirmed 20~65 nm-thick silicide layers formed on the single and polycrystalline silicon substrates. Ir-inserted nickel silicide on single crystalline substrate showed almost the same absorbance in near IR region as well as ITO, but Ir-inserted nickel silicide on polycrystalline substrate, which had the uniform absorbance in specific region, showed better absorbance in near IR region than ITO. The Ir-inserted nickel silicide on polycrystalline substrate particularly showed better absorbance in middle IR region than ITO. The results imply that nano-thick Ir-inserted nickel silicides may have excellent absorbing capacity in near-IR and middle-IR region.

• 한국표면공학회지
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• 제56권4호
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• pp.233-242
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• 2023

In recent years, energy-management studies in buildings have proven useful for energy savings. Typically, during heating and cooling, the energy from a given building is lost through its windows. Generally, to block the entry of ultraviolet (UV) and infrared (IR) rays, thin films of deposited metals or metal oxides are used, and the blocking of UV and IR rays by these thin films depends on the materials deposited on them. Therefore, by controlling the thicknesses and densities of the thin films, improving the transmittance of visible light and the blocking of heat rays such as UV and IR may be possible. Such improvements can be realized not only by changing the two-dimensional thin films but also by altering the zero-dimensional (0-D) nanostructures deposited on the films. In this study, 0-D nanoparticles were synthesized using a sol -gel procedure. The synthesized nanoparticles were deposited as deep coatings on polymer and glass substrates. Through spectral analysis in the UV-visible (vis) region, thin-film layers of deposited zinc oxide nanoparticles blocked >95 % of UV rays. For high transmittance in the visible-light region and low transmittance in the IR and UV regions, hybrid multiple layers of silica nanoparticles, zinc oxide particles, and fluorine-doped tin oxide nanoparticles were formed on glass and polymer substrates. Spectrophotometry in the UV-vis-near-IR regions revealed that the substrates prevented heat loss well. The glass and polymer substrates achieved transmittance values of 80 % in the visible-light region, 50 % to 60 % in the IR region, and 90 % in the UV region.

• 한국정밀공학회:학술대회논문집
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• 한국정밀공학회 2012년도 춘계학술대회 논문집
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• pp.33-34
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• 2012

• 대한금속재료학회지
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• 제46권2호
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• pp.88-96
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• 2008

Thermal evaporated 10 nm-$Ni_{50}Co_{50}$/(70 nm-poly)Si films were deposited to examine the energy saving properties of silicides formed by rapid thermal annealing at temperature ranging from 500 to $1,100^{\circ}C$ for 40 seconds. Thermal evaporated 10 nm-Ni/(70 nm-poly)Si films were also deposited as a reference using the same method for depositing the 10 nm-$Ni_{50}Co_{50}$/(70 nm-poly)Si films. A four-point probe was used to examine the sheet resistance. Transmission electron microscopy (TEM) and X-ray diffraction XRD were used to determine cross sectional microstructure and phase changes, respectively. UV-VIS-NIR and FT-IR (Fourier transform infrared spectroscopy) were used to examine the near-infrared (NIR) and middle-infrared (MIR) absorbance. TEM analysis confirmed that the uniform nickel-cobalt composite silicide layers approximately 21 to 55 nm in thickness had formed on the single and polycrystalline silicon substrates as well as on the 25 to 100 nm thick nickel silicide layers. In particular, nickel-cobalt composite silicides showed a low sheet resistance, even after rapid annealing at $1,100^{\circ}C$. Nickel-cobalt composite silicide and nickel silicide films on the single silicon substrates showed similar absorbance in the near-IR region, while those on the polycrystalline silicon substrates showed excellent absorbance until the 1,750 nm region. Silicides on polycrystalline substrates showed high absorbance in the middle IR region. Nickel-cobalt composite silicides on the poly-Si substrates annealed at $1,000^{\circ}C$ superior IR absorption on both NIR and MIR region. These results suggest that the newly proposed $Ni_{50}Co_{50}$ composite silicides may be suitable for applications of IR absorption coatings.

• Journal of Welding and Joining
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• 제23권4호
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• pp.53-58
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• 2005

We designed a weld monitoring system with UV and IR sensors using a embedded DSP controller for implementing a distribution system; running stand alone and communication with outside by industrial standard protocols. Also this system provided a USB port in order to be acquiring data in PC. The user interface program in PC visualized the IR and W data in time, frequency and state space. A correlation of IR and UV signals showed closely related to weld quality. A rapid change of geometry can be found through a moving average filter. And the average value of IR signal at an interval represented a welding width and depth. Through these results, we proposed a monitoring algorithm for a integer type DSP.