• Title/Summary/Keyword: I-V 곡선

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Maximum Power Point Tracking Method Without Input side Voltage and current Sensor of DC-DC Converter for Thermoelectric Generation (열전발전을 위한 DC-DC Converter의 입력측 전압·전류 센서없는 최대전력점 추적방식)

  • Kim, Tae-Kyung;Park, Dae-Su;Oh, Sung-Chul
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.21 no.3
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    • pp.569-575
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    • 2020
  • Recently, research on renewable energy technologies has come into the spotlight due to rising concerns over the depletion of fossil fuels and greenhouse gas emissions. Demand for portable electronic and wearable devices is increasing, and electronic devices are becoming smaller. Energy harvesting is a technology for overcoming limitations such as battery size and usage time. In this paper, the V-I characteristic curve and internal resistance of thermal electric devices were analyzed, and MPPT control methods were compared. The Perturbation and Observation (P&O) control method is economically inefficient because two sensors are required to measure the voltage and current of a Thermoelectric Generator(TEG). Therefore, this paper proposes a new MPPT control method that tracks MPP using only one sensor for the regulation of the output voltage. The proposed MPPT control method uses the relationship between the output voltage of the load and the duty ratio. Control is done by periodically sampling the output voltage of the DC-DC converter to increase or decrease the duty ratio to find the optimal duty ratio and maintain the MPP. A DC-DC converter was designed using a cascaded boost-buck converter, which has a two-switch topology. The proposed MPPT control method was verified by simulations using PSIM, and the results show that a voltage, current, and power of V=4.2 V, I=2.5 A, and P=10.5 W were obtained at the MPP from the V-I characteristic curve of the TEG.

CIGS 박막 태양전지에서의 온도 스트레스에 의한 전기적 특성 및 효율 변화 분석

  • Kim, Sun-Gon;Choe, Byeong-Deok
    • Proceedings of the Korean Vacuum Society Conference
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    • 2014.02a
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    • pp.327.2-327.2
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    • 2014
  • CIGS박막 태양전지의 온도에 의한 효율과 전기적 특성 변화를 알아보기 위해 $25^{\circ}C$, $50^{\circ}C$, $100^{\circ}C$, $150^{\circ}C$, $200^{\circ}C$에서 각각 100시간을 노출시킨 후 전기적인 특성들을 측정하여 초기 값들과 비교하였다. 태양전지의 온도 스트레스에 의한 특성 및 파라미터들의 변화들을 확인하기 위해 Light I-V와 Minority Carrier의 Lifetime을 측정하여 비교 분석하였다. 실험에 사용한 소자의 초기 파라미터들은 $25^{\circ}C$에서 측정하였고, 단락전류 11mA, 개방전압 0.64V, 곡선인자 60.49%, Lifetime 10.7s 효율 9.17%이다. 각 온도별 노출에 대해 CIGS박막 태양전지의 효율은 $50^{\circ}C$, $100^{\circ}C$에서는 초기 값과 비슷하였고, $150^{\circ}C$, $200^{\circ}C$에서 초기 값 대비 54%, 84% 감소 특성을 보였다. 단락전류는 $50^{\circ}C$, $100^{\circ}C$, $150^{\circ}C$에서는 크게 변화하는 모습이 나타나지 않았고 $200^{\circ}C$에서 63% 감소하였다. 개방전압, 곡선인자, Lifetime은 효율과 마찬가지로 $150^{\circ}C$, $200^{\circ}C$에서 감소하는 모습이 나타났다. $150^{\circ}C$, $200^{\circ}C$에서 개방전압이 9.3%, 18.7%, 곡선인자는 45.8%, 56.3%정도 감소하였다. Lifetime은 64.4%, 80.1%정도 감소하였다. 이 실험을 통해 개방전압과 곡선인자, Minority Carrier의 Lifetime이 일정 온도부터 온도의 영향을 받아 감소하고, 그 영향으로 효율이 감소하게 되는 것을 확인하였다.

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온도 스트레스에 의한 CIGS 박막 태양전지의 효율 변화 분석

  • Kim, Sun-Gon;Kim, Sang-Seop;Choe, Byeong-Deok
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.08a
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    • pp.224.1-224.1
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    • 2013
  • CIGS박막 태양전지의 온도에 의한 효율변화를 알아보기 위해 $25^{\circ}C$, $50^{\circ}C$, $100^{\circ}C$, $150^{\circ}C$, $200^{\circ}C$에서 각각 10시간을 노출시킨 후 전기적인 특성들을 측정하여 초기 값들과 비교해 보았다. 태양전지의 온도 스트레스에 의한 특성 및 파라미터들의 변화들을 확인하기 위해 Light I-V를 측정하여 비교 분석하였다. 실험에 사용한 소자의 초기 파라미터들은 $25^{\circ}C$에서 측정하였고, 개방전압 0.66V, 곡선인자 67.99%, 효율 10.49%이다. 각 온도별 노출에 대해 CIGS박막 태양전지의 효율은 $50^{\circ}C$, $100^{\circ}C$에서는 초기 값과 비슷하였고, $150^{\circ}C$, $200^{\circ}C$에서 초기 값 대비 22.8%, 57.5% 감소 특성을 보였다. 단락전류는 온도별 노출에 대해서 크게 변화하는 모습이 나타나지 않았고, 개방전압과 곡선인자는 효율과 마찬가지로 $150^{\circ}C$, $200^{\circ}C$에서 감소하는 모습이 나타났다. $150^{\circ}C$, $200^{\circ}C$에서 개방전압이 3.4%, 8.3%, 곡선인자는 19.9%, 53.7%정도 감소하였다. 이 실험을 통해 개방전압과 곡선인자가 일정 온도부터 온도의 영향을 받아 감소하고, 그 영향으로 효율이 감소하게 되는 것을 확인하였다.

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The annealing effects of Au/Te/Au n-GaAs structure (Au/Te/Au/ n-GaAs구조의 열처리 효과)

  • 정성훈;송복식;문동찬;김선태
    • Electrical & Electronic Materials
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    • v.9 no.10
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    • pp.1013-1018
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    • 1996
  • The annealing effects of Au/Te/Au/n-GaAs structure was investigated by using x-ray diffraction, scanning electron microscope, the specific contact resistance and I-V measurement. Increasing the annealing temperature, the intensity of Au-Ga peak by X-ray diffraction was increased. The Ga$\_$2/Te$\_$3/peak got evident for the samples annealed at 400.deg. C and GaAs peak by recrystallization appeared for the samples annealed at 500.deg. C. The variation from the schottky to low resistance contact was confirmed by I-V curve. The lowest value of the specific contact resistance of the samples annealed at 500.deg. C was 3.8*10$\^$-5/.ohm.-cm$\^$2/ but the value increased above 600.deg. C.

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PV Cell Modeling by Electrical Equivalent Circuit (전기적등가회로 해석에 의한 PV cell modeling)

  • Park, Hyeonah;Kim, Hyosung;Kim, Kwangseob
    • Proceedings of the KIPE Conference
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    • 2014.07a
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    • pp.361-362
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    • 2014
  • 본 논문은 PV cell의 전기적 등가회로에 대하여 테브난-노턴 분석방법을 통하여 3개의 대표적인 운전점에서 I-V 특성곡선의 접선의 기울기를 $R_s$$R_{sh}$$R_{MPP}$에 관련되는 값으로써 정량적으로 구하는 방법을 제시한다. 이 값들은 PV cell의 전류방정식에서 파생되는 4원 1차 연립방정식의 경계조건은 만족함으로써 전기적 등가회로의 4가지 요소에 대한 값을 구할 수 있는 길이 열린다. 제안된 방법은 제조사가 datasheet에서 특성을 보장하는 초기 PV cell 제품에 대한 I-V 특성뿐만 아니라, 열화가 진행된 PV cell의 실제적인 I-V 특성을 정확히 시뮬레이션 할 수 있다는 장점이 있다.

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Nondestructive Evaluation of Nanostructured Thin Film System Using Scanning Acoustic Microscopy (초음파현미경을 이용한 나노 구조 박막 시스템의 비파괴평가)

  • Miyasaka, Chiaki;Park, Ik-Keun;Park, Tae-Sung
    • Journal of the Korean Society for Nondestructive Testing
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    • v.30 no.5
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    • pp.437-443
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    • 2010
  • In recent years, as nano scale structured thin film technology has emerged in various fields such as the materials, biomedical and acoustic sciences, the quantitative nondestructive adhesion evaluation of thin film interfaces using ultra high frequency scanning acoustic microscopy(SAM) has become an important issue in terms of the longevity and durability of thin film devices. In this study, an effective technique for investigating the interfaces of nano scale structured thin film systems is described, based on the focusing of ultrasonic waves, the generation of leaky surface acoustic waves(LSAWs), V(z) curve simulation and ultra high frequency acoustical imaging_ Computer simulations of the V(z) curve were performed to estimate the sensitivity of detection of micro flaws(i.e., delamination) in a thin film system. Finally, experiments were conducted to confirm that a SAM system operating at a frequency of 1 GHz can be useful to visualize the micro flaws in nano structured thin film systems.

Use of a Transformed Diode Equation for Characterization of the Ideality Factor and Series Resistance of Crystalline Silicon Solar Cells Based on Light I-V Curves (Light I-V 곡선을 이용한 결정질 태양전지의 이상계수와 직렬 저항 특성 분석)

  • Jeong, Sujeong;Kim, Soo Min;Kang, Yoonmook;Lee, Hae-seok;Kim, Donghwan
    • Korean Journal of Materials Research
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    • v.26 no.8
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    • pp.422-426
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    • 2016
  • With the increase in installed solar energy capacity, comparison and analysis of the physical property values of solar cells are becoming increasingly important for production. Therefore, research on determining the physical characteristic values of solar cells is being actively pursued. In this study, a diode equation, which is commonly used to describe the I-V behavior and determine the electrical characteristic values of solar cells, was applied. Using this method, it is possible to determine the diode ideality factor (n) and series resistance ($R_s$) based on light I-V measurements. Thus, using a commercial screen-printed solar cell and an interdigitated back-contact solar cell, we determined the ideality factor (n) and series resistance ($R_s$) with a modified diode equation method for the light I-V curves. We also used the sun-shade method to determine the ideality factor (n) and series resistance ($R_s$) of the samples. The values determined using the two methods were similar. However, given the error in the sun-shade method, the diode equation is considered more useful than the sun-shade method for analyzing the electrical characteristics because it determines the ideality factor (n) and series resistance ($R_s$) based on the light I-V curves.

Fault Diagnosis of PV String Using Deep-Learning and I-V Curves (딥러닝과 I-V 곡선을 이용한 태양광 스트링 고장 진단)

  • Shin, Woo Gyun;Oh, Hyun Gyu;Bae, Soo Hyun;Ju, Young Chul;Hwang, Hye Mi;Ko, Suk Whan
    • Current Photovoltaic Research
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    • v.10 no.3
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    • pp.77-83
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    • 2022
  • Renewable energy is receiving attention again as a way to realize carbon neutrality to overcome the climate change crisis. Among renewable energy sources, the installation of Photovoltaic is continuously increasing, and as of 2020, the global cumulative installation amount is about 590 GW and the domestic cumulative installation amount is about 17 GW. Accordingly, O&M technology that can analyze the power generation and fault diagnose about PV plants the is required. In this paper, a study was conducted to diagnose fault using I-V curves of PV strings and deep learning. In order to collect the fault I-V curves for learning in the deep learning, faults were simulated. It is partial shade and voltage mismatch, and I-V curves were measured on a sunny day. A two-step data pre-processing technique was applied to minimize variations depending on PV string capacity, irradiance, and PV module temperature, and this was used for learning and validation of deep learning. From the results of the study, it was confirmed that the PV fault diagnosis using I-V curves and deep learning is possible.

The Spin-Rotation Interaction of the Proton and the Fluorine Nucleus in the Tetrahedral Spherical Top Molecules

  • Lee, Sang-Soo;Ozier, Irving;Ramsey, N.F.
    • Nuclear Engineering and Technology
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    • v.5 no.1
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    • pp.38-43
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    • 1973
  • The spin-rotation constants of the proton and tile fluorine nucleus in C $H_4$, Si $H_4$, Ge $H_4$, C $F_4$, Si $F_4$ and Ge $F_4$ were determined experimentally by the molecular beam magnetic resonance method. From the Hamiltonian and the high field approximation, the quantized energy level is given by the following equation. W $m_{I}$ $m_{J}$=- $g_{I}$ $m_{I}$H- $g_{J}$ $m_{J}$H- $C_{av}$ $m_{I}$ $m_{J}$, where $c_{av}$ is one third of the trace of the C tensor. In the nuclear resonance experiment, the proton and the fluorine nuclear resonance curves consist of many unresolved lines given by v=- $g_{J}$H- $C_{av}$ $m_{I}$, and a Gaussian approximation is made to correlate $c_{av}$ to the experimentally obtained half-width of the resonance curve. In the rotational resonance experiment, the five resonance peaks as predicted by v=- $g_{I}$H- $c_{av}$ $m_{I}$, $m_{I}$=0, $\pm$1 and $\pm$2, were all observed. The magnitude of car was determined by measuring the frequency distance between two adjacent peaks. The sign of $c_{av}$ was determined by the side peak suppression technique. The technique is described, and the sign and magnitude of the spin-rotation constant cav are summarized as following: for C $H_4$ -10.3$\pm$0.4tHz(from the rotational resonance), for SiH +3.71$\pm$0.08kHz(from the nuclear resonance), for Ge $H_4$+3.79$\pm$0.13kHz(from the nuclear resonance), for C $F_4$, -6.81$\pm$0.08kHz(from the rotational resonance), for Si $F_4$, -2.46$\pm$0.06kHz(from the rotational resonance), and finally for Ge $F_4$-1.84$\pm$0.04kHz(from the rotational resonance).onal resonance).esonance).

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Tunneling Magnetoresistance of a Ramp-edge Type Junction With Si3N4 Barrier (Si3N4장벽층을 이용한 경사형 모서리 접합의 터널링 자기저항 특성)

  • Kim, Young-Ii;Hwang, Do-Guwn;Lee, Sang-Suk
    • Journal of the Korean Magnetics Society
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    • v.12 no.6
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    • pp.201-205
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    • 2002
  • The tunneling magnetoresistance (TMR) of a ramp-edge type junction has been studied. The samples with a structure of NiO(60)/Co(10)/NiO(60)/Si$_3$N$_4$(2-6)/NiFe(10) (nm) were prepared by the sputtering and etched by the electron cyclotron (ECR) argon ion milling. Nonlinear I-V characteristics was obtained from a ramp-type tunneling junctions having the dominant difference between zero and +90 Oe perpendicular to the junction edge line. The voltage dependence of TMR was stable up to a bias volt of $\pm$10 V with a TMR ratio of about -10%, which may be very peculiar magnetic tunneling properties with asymmetric tunneling process between wedge Co pinned layer and NiFe free layer.