• Title/Summary/Keyword: High-k

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Device and Circuit Performance Issues with Deeply Scaled High-K MOS Transistors

  • Rao, V. Ramgopal;Mohapatra, Nihar R.
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.4 no.1
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    • pp.52-62
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    • 2004
  • In this paper we look at the effect of Fringe-Enhanced-Barrier-lowering (FEBL) for high-K dielectric MOSFETs and the dependence of FEBL on various technological parameters (spacer dielectrics, overlap length, dielectric stack, S/D junction depth and dielectric thickness). We show that FEBL needs to be contained in order to maintain the performance advantage with scaled high-K dielectric MOSFETs. The degradation in high-K dielectric MOSFETs is also identified as due to the additional coupling between the drain-to-source that occurs through the gate insulator, when the gate dielectric constant is significantly higher than the silicon dielectric constant. The technology parameters required to minimize the coupling through the high-K dielectric are identified. It is also shown that gate dielectric stack with a low-K material as bottom layer (very thin $SiO_2$ or oxy-nitride) will be helpful in minimizing FEBL. The circuit performance issues with high-K MOS transistors are also analyzed in this paper. An optimum range of values for the dielectric constant has been identified from the delay and the energy dissipation point of view. The dependence of the optimum K for different technology generations has been discussed. Circuit models for the parasitic capacitances in high-K transistors, by incorporating the fringing effects, have been presented.

AN ACCURATE AND EFFICIENT CALCULATION OF HIGH ENTHALPY FLOWS USING A HIGH ORDER NEW LIMITING PROCESS

  • Noh, Sung-Jun;Lee, Kyung-Rock;Park, Jung-Ho;Kim, Kyu-Hong
    • Journal of the Korean Society for Industrial and Applied Mathematics
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    • v.15 no.1
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    • pp.67-82
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    • 2011
  • Calculation of accurate wall heat flux for high enthalpy flows requires a dense grid system, which leads to significantly large computational time. A high-order scheme can improve the efficiency of calculation because wall heat flux can be obtained accurately even with a relatively coarse grid system. However, conventional high order schemes have some drawbacks such as oscillations near a discontinuity and instability in multi-dimensional problem. To resolve these problems, enhanced Multi-dimensional Limiting Process(e-MLP) was applied as a high-order scheme. It could provide robust and accurate solutions with high order accuracy in calculation of high enthalpy flows within a short time. We could confirm the efficiency of the high order e-MLP scheme through grid convergence tests with different grid densities in a hypersonic blunt nose problem.

A REMARK ON IFP RINGS

  • Lee, Chang Hyeok;Lim, Hyo Jin;Park, Jae Hyoung;Kim, Jung Hyun;Kim, Jung Soo;Jeong, Min Joon;Song, Min Kyung;Kim, Si Hwan;Hwang, Su Min;Eom, Tae Kang;Lee, Min Jung;Lee, Yang;Ryu, Sung Ju
    • Korean Journal of Mathematics
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    • v.21 no.3
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    • pp.311-318
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    • 2013
  • We continue the study of power-Armendariz rings over IFP rings, introducing $k$-power Armendariz rings as a generalization of power-Armendariz rings. Han et al. showed that IFP rings are 1-power Armendariz. We prove that IFP rings are 2-power Armendariz. We moreover study a relationship between IFP rings and $k$-power Armendariz rings under a condition related to nilpotency of coefficients.

Partial Discharge Characteristics in LLDPE-Natural Rubber Blends: Correlating Electrical Quantities with Surface Degradation

  • Aulia, Aulia;Ahmad, Mohd Hafizi;Abdul-Malek, Zulkurnain;Arief, Yanuar Z.;Lau, KwanYiew;Novizon, Novizon
    • Journal of Electrical Engineering and Technology
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    • v.11 no.3
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    • pp.699-706
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    • 2016
  • Partial discharges (PD) lead to the degradation of high voltage cables and accessories. PD activities occur due to the existence of impurities, voids, contaminants, defects and protrusions during the manufacture and installation of power cables. Commonly, insulation failures occur at cable joints and terminations, caused by inhomogeneous electric field distributions. In this work, a blend of natural rubber (NR) and linear low density polyethylene (LLDPE) was investigated, and the optimal formulation of the blend that could resist PD was discussed. The experiments were conducted under a constant high voltage stress test of 6.5 kV AC and the magnitude of partial discharge activities was recorded using the CIGRE method II. Pattern analysis of PD signals was performed along with the interpretation of morphological changes. The results showed that the addition of 10 wt% of NR and 5 wt% of Alumina Trihydrate (ATH) provided promising results in resisting PD activities. However, as the NR content increased, more micropores existed, thus resulting in increased PD activities within the samples.

Development of PC based High Voltage Generator for Dental CT (PC기반 치과 CT용 고전압 펄스 발생장치 개발)

  • Kim, Hack-Seong;Oh, Jun-Yong;Song, Sang-Hoon;Won, Choong-Yeon
    • Proceedings of the KIPE Conference
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    • 2008.06a
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    • pp.580-582
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    • 2008
  • The object of this paper is develope the PC based controlled high voltage power supply and studies 1.2kW(120kV, 10mA) pulse power X-ray generator possible to adapt fluoroscopy of Dental CT X-ray generator and industrial X-ray pulse power equipment. The developed pulse power X-ray generator consisted of mono-block tank include X-ray tube and high voltage X-ray power supply circuit and high voltage control unit with RS232C/422 communication port. The PC control program of pulse power X-ray generator uses LabVIEW, and the size of high voltage transformer and high voltage generator is minimized by high voltage high frequency inverter has 100kHz switching frequency. Also this paper shows result of X-ray tube voltage and tube current correspond to variable load.

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A Study on the development of optical fiber incorporated high-voltage underground power cable (광복합 고압지중전력케이블의 개발에 관한 연구)

  • Ryu, Jae-Kyu;Yoo, Sung-Jong;Jeon, Seung-Ik;Choi, Bong-Nam;Lee, Young-Ik
    • Proceedings of the KIEE Conference
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    • 1996.07c
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    • pp.1828-1830
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    • 1996
  • In this study, We developed the optical fiber incorporated high-voltage underground power cable which is combined optical fibers with conventional high-voltage underground power cable. Optical-Unit that optical fiber is inserted in stainless tube is tested, and we got good results enough to safe optical fibers. Also we put the optical fiber incorporated high-voltage underground power cable to the test of electrical characteristics and optical characteristics, we knew that the electrical characteristics were the same characteristics as conventional high-voltage underground power cable and the transmission loss change was almost zero.

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Electrical Characteristics and Thermal Reliability of Stacked-SCRs ESD Protection Device for High Voltage Applications

  • Koo, Yong Seo;Kim, Dong Su;Eo, Jin Woo
    • Journal of Power Electronics
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    • v.12 no.6
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    • pp.947-953
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    • 2012
  • The latch-up immunity of the high voltage power clamps used in high voltage ESD protection devices is very becoming important in high-voltage applications. In this paper, a stacking structure with a high holding voltage and a high failure current is proposed and successfully verified in 0.18um CMOS and 0.35um BCD technology to achieve the desired holding voltage and the acceptable failure current. The experimental results show that the holding voltage of the stacking structure can be larger than the operation voltage of high-voltage applications. Changes in the characteristics of the stacking structure under high temperature conditions (300K-500K) are also investigated.