• 제목/요약/키워드: HF gas

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A Comparative Study of HfN Coatings Deposited by DC and Pulsed DC Asymmetric Bipolar Magnetron Sputtering (DC 스퍼터법과 비대칭 바이폴라 펄스 DC 스퍼터법으로 증착된 HfN 코팅막의 물성 비교연구)

  • Jeon, Seong-Yong;Jeong, Pyeong-Geun
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2017.05a
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    • pp.103.2-103.2
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    • 2017
  • Nanocrystalline HfN coatings were prepared by reactively sputtering Hf metal target with N2 gas using a magnetron sputtering system operated in DC and ABPP (asymmetric bipolar pulsed plasma) condition with various duties and frequencies. The effects of duty and frequency, ranging from 75 to 100 % and 5 to 50 kHz, on the coating microstructure, crystallographic and mechanical properties were systematically investigated with FE-SEM, AFM, XRD and nanoindentation. The results show that pulsed plasma has a significant influence on coating microstructure and mechanical properties of HfN coatings. Coating microstructure evolves from the columnar structure to a highly dense one as duty decreases. Average grain size and nano hardness of HfN coatings were also investigated with various pulsed conditions.

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A Comparative Study of Nanocrystalline HfN Coatings Fabricated by Direct Current and Inductively Coupled Plasma Assisted Magnetron Sputtering (DC 스퍼터법과 유도결합형 플라즈마 스퍼터법으로 증착된 HfN 코팅막의 물성 비교연구)

  • Jeon, Seong-Yong;Lee, So-Yeon
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2017.05a
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    • pp.103.1-103.1
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    • 2017
  • Nanocrystalline HfN coatings were prepared by reactively sputtering Hf metal target with N2 gas using a magnetron sputtering system operated in DC and ICP (inductively coupled plasma) condition with various powers. The effects of ICP power, ranging from 0 to 200 W, on the coating microstructure, corrosion and mechanical properties were systematically investigated with FE-SEM, AFM, potentiostat and nanoindentation. The results show that ICP power has a significant influence on coating microstructure and mechanical properties of HfN coatings. With the increasing of ICP power, coating microstructure evolves from the columnar structure of DC process to a highly dense one. Average grain size and nano hardness of HfN coatings were also investigated with increasing ICP powers.

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Removal Characteristics of Gaseous Contaminants by a Wet Scrubber with Different Packing Materials (충진제의 종류에 따른 습식 스크러버의 가스상 물질 제거특성)

  • Han, Bang-Woo;Kim, Hak-Joon;Kim, Yong-Jin;Han, Kyeong-Soo
    • Journal of Korean Society for Atmospheric Environment
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    • v.23 no.6
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    • pp.744-751
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    • 2007
  • Wet scrubber is widely used to remove toxic gaseous contaminants in various industries such as semi-conductor industry, display manufacturing industry and so on. In this study, to optimize a packed bed scrubber as one of typical wet scrubber size while keeping its performance, four different packing materials were investigated at different air flow rates, liquid-gas ratios and pH values. Ammonia, hydrochloric acid and hydrofluoric acid were used as test gases to characterize the scrubber performance. Gas removal efficiency increased as the packing size decreased, which resulted in the increase of specific surface area. The increase of air flow rate led to the decrease of gas removal efficiency, while the increase of liquid-gas ratio led to the increase of gas removal efficiency. For the case of $NH_3$ gas, lower pH, and for the cases of HCl and HF, higher pH contributed to higher gas removal efficiency. Gas removal efficiency of a wet scrubber increased in the order of HCl < $NH_3$ < HF according to its water solubility.

A Study on the Development of Vapor Phase Cleaning Equipment for Semiconductor Processing (반도체 공정에서의 기상 세정장비 개발에 관한 연구)

  • 박헌휘;이춘수;최승우;함승주
    • Proceedings of the KAIS Fall Conference
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    • 2001.05a
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    • pp.79-81
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    • 2001
  • 저압 기상 영역에서 Anhydrous HF 가스와 Methanol vapor를 사용하는 산화막 식각공정을 수행하기 위하여 (1) 반응기 부피의 최소화, (B) 공정압력의 최소화, (3) 고순도 알루미나 Reactor 적용, (4) Cluster화의 개념을 적용한 VPC 장치를 제작하였다. Wafer의 온도, HF의 분압 및 Working Pressure 등의 공정변수에 따른 Oxide Wafer의 식각특성의 변화를 확인하였다. 또한 Etch Uniformity를 향상시키기 위하여 Shower Head 구조를 변경시켜서 실험하였으며, CFD Simulation을 이용하여 Reactor내에서의 HF gas 및 Methanol vapor의 분율을 예측하였다.

A Study on MDA Analysis & blood chemical test for Mouse which were exposed HF Gases from Fire (화재로 인한 불화수소(HF)가스에 노출된 마우스의 혈액생화학분석 및 MDA분석을 통한 세포손상에 관한 연구)

  • Cho, Nam-Wook;Oh, Eun-Ha
    • Journal of the Korean Institute of Gas
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    • v.17 no.6
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    • pp.58-66
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    • 2013
  • Among the risks which can be faced with fire, combustion toxicity is a significant influence on the survival. Fire toxicity researches have been limited generally on the lethal aspects. In this study, HF gas which can be generated from fire, and also found in general industrial site was used for analysis. Blood analysis and biochemistry analysis performed to find internal demage of experimental animals which were used for measuring average activity stopping time from Animal test(KS F2271: Gas hazard test). In addition, Using the malondialdehyde analysis, indicators of oxidative damage, we had quantitative analysis to target lymphocyte for measuring the oxidative damage caused by toxic substances.

Nano-Mechanical Studies of HfOx Thin Film for Oxygen Outgasing Effect during the Annealing Process (고온 열처리 과정에서 산소 Outgasing 효과에 의한 HfOx 박막의 Nanomechanics 특성 연구)

  • Park, Myung Joon;Kim, Sung Joon;Lee, Si Hong;Kim, Soo In;Lee, Chang Woo
    • Journal of the Korean Vacuum Society
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    • v.22 no.5
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    • pp.245-249
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    • 2013
  • The $HfO_X$ thin film was deposited what it has been paid attention to the next generation oxide thin layer of MOSFET (metal-Oxide semiconductor field-effect-transistor) by rf magnetron sputter on Si (100) substrate. The $HfO_X$ thin film was deposited using a various oxygen gas flows (5, 10, 15 sccm). After deposition, $HfO_X$ thin films were annealed from 400 to $800^{\circ}C$ for 20 min in nitrogen ambient. The electrical characteristics of the $HfO_X$ thin film was improved by leakage current properties, depending on the increase of oxygen gas flow and annealing temperature. In particular, the properties of nano-mechanics of $HfO_X$ thin films were measured by AFM and Nano-indenter. From the results, the maximum indentation depth at the basis of maximum indentation force was increased from 24.9 to 38.8 nm according to increase the annealing temperature. Especially, the indentation depth was increased rapidly at $800^{\circ}C$. The rapid increasement of indentation depth was expected to be due to the change of residual stress in the $HfO_X$ thin film, and this result was caused by relative flux of oxygen outgasing during the annealing process.

Fabrication of Thermally-Driven Polysilicon Microactuator and Its Characterization (열구동형 폴리실리콘 마이크로 액츄에이터의 제작 및 특성분석)

  • Lee, J.H.;Lee, C.S.;Yoo, H.J.
    • Journal of the Korean Society for Precision Engineering
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    • v.14 no.12
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    • pp.153-159
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    • 1997
  • A thermally-driven polysilicon microactuator has been fabricated using surface micromachining techniques. It consists of P-doped polysilicon as a structural layer and TEOS(tetraethylorthosilicate) oxide as a sacrificial layer. The polysilicon was annealed for the relaxation of residual stress which is the main cause to its deformation such as bending and buckling. And newly developed HF GPE(gas-phase etching) process was also employed to eliminate the troublesome stiction problem using anhydrous HF gas and CH$_{3}$OH vapor, and successfully fabricated the microactuators. The actuation is incurred by the thermal expansion due to the current flow in the active polysilicon cantilever, which motion is amplified by lever mechanism. The moving distance of polysilicon microactuator was experimentally conformed as large as 21 .mu. m at the input voltage level of 10V and 50Hz square wave. The actuating characteris- tics are also compared with the simulalted results considering heat transfer and thermal expansion in the polysilicon layer. This microactuator technology can be utilized for the fabrication of MEMS (microelectromechanical system) such as microrelay, which requires large displacement or contact force but relatively slow response.

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Investigation on Fe-Hf-B-Nb-P-C Soft Magnetic Powders Prepared by High-Pressure Gas Atomization (고압 가스 분무법을 이용한 Fe-Hf-B-Nb-P-C 연자성 분말 제조 및 특성 평가)

  • Jeong, Jae Won;Yang, Dong-Yeol;Kim, Ki Bong;Lee, Junhong;Kim, Young Ja;Lim, Tae-Soo;Yang, Sangsun;Lee, Min Ha;Kim, Hwi Jun;Kim, Yong-Jin
    • Journal of Powder Materials
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    • v.23 no.5
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    • pp.391-396
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    • 2016
  • In this study, ultra-fine soft-magnetic micro-powders are prepared by high-pressure gas atomization of an Fe-based alloy, Fe-Hf-B-Nb-P-C. Spherical powders are successfully obtained by disintegration of the alloy melts under high-pressure He or $N_2$ gas. The mean particle diameter of the obtained powders is $25.7{\mu}m$ and $42.1{\mu}m$ for He and $N_2$ gas, respectively. Their crystallographic structure is confirmed to be amorphous throughout the interior when the particle diameter is less than $45{\mu}m$. The prepared powders show excellent soft magnetic properties with a saturation magnetization of 164.5 emu/g and a coercivity of 9.0 Oe. Finally, a toroidal core is fabricated for measuring the magnetic permeability, and a ${\mu}_r$ of up to 78.5 is obtained. It is strongly believed that soft magnetic powders prepared by gas atomization will be beneficial in the fabrication of high-performance devices, including inductors and motors.

Etching Characteristics of HfAlO3 Thin Films Using an Cl2/BCl3/Ar Inductively Coupled Plasma

  • Ha, Tae-Kyung;Woo, Jong-Chang;Kim, Chang-Il
    • Transactions on Electrical and Electronic Materials
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    • v.11 no.4
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    • pp.166-169
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    • 2010
  • In this study, we changed the etch parameters (gas mixing ratio, radio frequency [RF] power, direct current [DC]-bias voltage, and process pressure) and then monitored the effect on the $HfAlO_3$ thin film etch rate and the selectivity with $SiO_2$. A maximum etch rate of 108.7 nm/min was obtained in $Cl_2$ (3 sccm)/$BCl_3$ (4 sccm)/Ar (16 sccm) plasma. The etch selectivity of $HfAlO_3$ to $SiO_2$ reached 1.11. As the RF power and the DC-bias voltage increased, the etch rate of the $HfAlO_3$ thin film increased. As the process pressure increased, the etch rate of the $HfAlO_3$ thin films increased. The chemical state of the etched surfaces was investigated with X-ray photoelectron spectroscopy. According to the results, the etching of $HfAlO_3$ thin film follows the ion-assisted chemical etching.

Effects of Composition on Soft Magnetic Properties and Microstructures of Fe-Hf-O Thin Films (Fe - Hf - O계 박막에서 조성이 미세구조 및 연자기 특성에 미치는 효과)

  • 박진영;김종열;김광윤;한석희;김희중
    • Journal of the Korean Magnetics Society
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    • v.7 no.5
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    • pp.237-242
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    • 1997
  • The microstructure and soft magnetic properties of as-deposited Fe-Hf-O thin film alloys, which are produced at $P_{O2}=10%$ by rf magnetron sputtering method in $Ar+O_2$ mixed gas atmosphere, is investigated. Newly developed $Fe_{82}Hf_{3.4}O_{14.6}$ film exhibits good soft magnetic properties with $4{\pi}M_s=17.7$ kG, $H_c=0.7$ Oe and ${\mu}_{eff}$(0.5~100MHz)=2,500, respectively. The Fe-Hf-O films are composed of $\alpha$-Fe nanograins and amorphous phase with larger amounts of Hf and O elements which chemically combine each other. With increasing Hf area fraction, Hf and O contents increased proportionally. It was considered that O content in films was determined by Hf contents, because O was chemically combined with Hf. It results from decreasing the $\alpha$-Fe grain size by precipitates (Hf and O), high electrical resistivity. The $Fe_{82}Hf_{3.4}O_{14.6}$ film exhibits the quality factor (Q=$\mu$'/$\mu$") of 25 at 20 MHz. These good frequency characteristics are considered to be superior to other films already reported.o other films already reported.

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