• 디지털산업정보학회논문지
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• 제10권3호
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• pp.1-9
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• 2014

The inverse Rayleigh model distribution and Rayleigh distribution model were widely used in the field of reliability station. In this paper applied using the finite failure NHPP models in order to growth model. In other words, a large change in the course of the software is modified, and the occurrence of defects is almost inevitable reality. Finite failure NHPP software reliability models can have, in the literature, exhibit either constant, monotonic increasing or monotonic decreasing failure occurrence rates per fault. In this paper, proposes the inverse Rayleigh and Rayleigh software reliability growth model, which made out efficiency application for software reliability. Algorithm to estimate the parameters used to maximum likelihood estimator and bisection method, model selection based on mean square error (MSE) and coefficient of determination($R^2$), for the sake of efficient model, were employed. In order to insurance for the reliability of data, Laplace trend test was employed. In many aspects, Rayleigh distribution model is more efficient than the reverse-Rayleigh distribution model was proved. From this paper, software developers have to consider the growth model by prior knowledge of the software to identify failure modes which can helped.

• 산업공학
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• 제19권1호
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• pp.19-25
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• 2006

In the development process, the objective of a reliability growth program is to track the increase in system reliability, and determine as early as possible whether or not the system reliability is growing at a sufficient rate to meet the required goal and allocate available resources accordingly. Implementation of this kind of program will provide very useful information on concept selection, product/process reliability, and cost effectiveness without too much time, money and engineering effort being spent on the development of failure suspect parts. The purpose of this research is to present a practical method for efficiently monitoring a reliability growth test process using AMSAA(Army Materiel Systems Analysis Activity) reliability growth model. The presented growth management is a viable method for identifying failure modes, incorporating design changes and monitoring reliability progress on an on-going basis during the early stages of a product development program.

• 정보처리학회논문지:소프트웨어 및 데이터공학
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• 제4권1호
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• pp.9-18
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• 2015

소프트웨어 신뢰도 성장 모델은 고장 데이터를 사용해서 소프트웨어 출시일 또는 추가 테스트 노력을 결정하는 데 사용된다. 소프트웨어 신뢰도 성장 모델을 사용할 때 특정 소프트웨어 신뢰도 성장 모델을 모든 소프트웨어에 사용할 수 없는 문제가 있다. 또한 신뢰도를 평가하기 위해 이미 많은 수의 소프트웨어 신뢰도 성장 모델이 제안되었다. 따라서 특정 조건에 맞는 최적의 소프트웨어 신뢰도 성장 모델을 선택하는 것은 중요한 이슈가 되었다. 기존 소프트웨어 신뢰도 성장 모델 선택 방법에서는 수집된 고장 데이터 전체를 사용하고 있다. 그런데 초기에 수집된 고장 데이터는 미래 고장 예측에 영향을 주지 않을 수도 있고 경우에 따라서는 미래 고장 예측 과정에서 왜곡된 결과를 초래할 수도 있다. 이를 해결하기 위해서 이 논문에서는 부분 고장 데이터를 이용하여 적합도 평가를 수행하는 방법에 기반을 둔 소프트웨어 신뢰도 성장 모델 선택 방법을 제안한다. 이 논문에서는 고장 데이터에서 과도하게 불안정한 데이터를 제외한 부분 데이터를 사용한다. 소프트웨어 신뢰도 성장 모델 선택에 사용될 부분 데이터는 전체 고장 데이터와 고장 데이터의 일부를 제외한 부분 고장 데이터의 미래 고장 예측 능력의 비교를 통해서 찾는다. 연구의 타당성을 보이기 위하여 실제 수집된 고장 데이터를 사용해서 전체 데이터를 적용한 경우보다 부분 데이터를 사용한 경우의 미래 고장 예측 능력이 더 정확함을 보인다.

• 터널과지하공간
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• 제19권2호
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• pp.86-94
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• 2009

암석파괴역학과 파괴인성(rock fracture toughness) 이하의 응력확대계수(stress intensity factor)에서 균열이 성장하는 현상을 이용하여 암석 절리면의 비선형 강도특성과, 시간의 경과에 따라 파괴가 진행되는 특성을 고려한 수치해석용 3차원 절리면 요소를 개발하였다. 이 절리면 요소를 사용하여 암석 절리면 전단시험을 수치해석으로 모사한 결과, 전단응력이 증가하고 시간이 경과함에 따라 절리면 사이에 연결된 절리면 내 접점(asperity in joint)에서 암석의 파괴인성보다 응력확대계수가 작음에도 불구하고 균열이 발생하였고 시간이 경과하면서 균열이 성장, 절리면 내 접점이 파괴되었다. 이와 같이 각각의 절리면 내 접점의 파괴에 따라 절리면의 강도는 감소하고, 절리면의 전단응력은 응력경화와 응력연화 후 잔류응력에 도달하는 비선형거동을 보이면서 시간의 경과에 따라 점진적으로 파괴되었다.

• Journal of Interdisciplinary Genomics
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• 제5권2호
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• pp.18-23
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• 2023

Conventional evaluation method for identifying the organic cause of short stature has a low detection rate. If an infant who is small for gestational age manifests postnatal growth deterioration, triangular face, relative macrocephaly, and protruding forehead, a genetic testing of IGF2, H19, GRB10, MEST, CDKN1, CUL7, OBSL1, and CCDC9 should be considered to determine the presence of Silver-Russell syndrome and 3-M syndrome. If a short patient with prenatal growth failure also exhibits postnatal growth failure, microcephaly, low IGF-1 levels, sensorineural deafness, or impaired intellectual development, genetic testing of IGF1 and IGFALS should be conducted. Furthermore, genetic testing of GH1, GHRHR, HESX1, SOX3, PROP1, POU1F1, and LHX3 should be considered if patients with isolated growth hormone deficiency have short stature below -3 standard deviation score, barely detectable serum growth hormone concentration, and other deficiencies of anterior pituitary hormone. In short patients with height SDS <-3 and high growth hormone levels, genetic testing should be considered to identify GHR mutations. Lastly, when severe short patients (height z score <-3) exhibit high levels of prolactin and recurrent pulmonary infection, genetic testing should be conducted to identify STAT5B mutations.

• Journal of applied mathematics & informatics
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• 제9권2호
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• pp.761-769
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• 2002

Due to the large scale application of software systems, software reliability plays an important role in software developments. In this paper, a software reliability growth model (SRGM) is proposed. The testing time on the right is truncated in this model. The instantaneous failure rate, mean-value function, error detection rate, reliability of the software, estimation of parameters and the simple applications of this model are discussed .

• 정보처리학회논문지D
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• 제13D권5호
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• pp.709-716
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• 2006

소프트웨어 복잡도가 증가할수록 소프트웨어 성공률은 기하급수적으로 감소하며, 반대로 실패율은 증가한다. 소프트웨어 규모 증가에 따른 실패율은 성장곡선으로 표현할 수 있다. 이 현상에 따라, 본 논문은 Gompertz 성장곡선으로 개발 성공률과 완료율을 추정하였다. 먼저, 수치적으로 제시된 $10^n$의 소프트웨어 규모를 로그값으로 변환시켜 데이터 간격을 일정하게 하였다 로그값의 소프트웨어 규모 변화에 따른 개발 성공률과 완료율의 함수관계를 유도하고자 하였다. 그러나 이 관계를 적절히 표현하는 함수를 찾지 못하였다. 따라서 본 논문에서는 개발 성공률의 역 개념인 실패율과 완료율의 역 개념인 취소율을 도입하였다. 로그값의 소프트웨어 규모 변화에 따른 개발 실패율과 취소율 관계는 성장곡선 형태를 나타내었다. 결론적으로, 개발 취소율과 실패율을 적절히 표현하는 함수로 Gompertz 성장곡선을 적용한 결과 실측 데이터를 적절히 표현할 수 있었다. 본 모델을 적용하면 특정 규모의 소프트웨어에 대한 개발 성공률과 완료율을 보다 정확히 얻을 수 있을 것이다.

• 한국마이크로전자및패키징학회:학술대회논문집
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• 한국마이크로전자및패키징학회 2003년도 기술심포지움 논문집
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• pp.195-202
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• 2003

In this study, failure mechanisms of Au stud bumps/ACF flip chip joints were investigated underhigh current stressing condition. For the determination of allowable currents, I-V tests were performed on flip chip joints, and applied currents were measured as high as almost 4.2Amps $(4.42\times10^4\;Amp/cm^2)$. Degradation of flip chip joints was observed by in-situ monitoring of Au stud bumps-Al pads contact resistance. All failures, defined at infinite resistance, occurred at upward electron flow (from PCB pads to chip pads) applied bumps (UEB). However, failure did not occur at downward electron flow applied bumps (DEB). Only several $m\Omega$ contact resistance increased because of Au-Al intermetallic compound (IMC) growth. This polarity effect of Au stud bumps was different from that of solder bumps, and the mechanism was investigated by the calculation of chemical and electrical atomic flux. According to SEM and EDS results, major IMC phase was $Au_5Al_2$, and crack propagated along the interface between Au stud bump and IMC resulting in electrical failures at UEB. Therefore. failure mechanisms at Au stud bump/ACF flip chip Joint undo high current density condition are: 1) crack propagation, accompanied with Au-Al IMC growth. reduces contact area resulting in contact resistance increase; and 2) the polarity effect, depending on the direction of electrons. induces and accelerates the interfacial failure at UEBs.

• 한국신뢰성학회지:신뢰성응용연구
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• 제16권4호
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• pp.305-312
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• 2016

Purpose: The purpose of this study is to provide a sensitivity analysis of system reliability for recognizing effectiveness of changing of BD mode failures using reliability growth projection model based on NHPP. Methods: Crow extended reliability projection model (CERPM) is used to analyze the changing of two factors 1) the number of BD mode failures, 2) fix effectiveness factor (FEF) values. Results: The system reliability has increased in accordance with the number of BD mode failures and FEF values have increased. Conclusion: It is necessary to design failure modes and FEF values to supervise the reliability.

• Pediatric Gastroenterology, Hepatology & Nutrition
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• 제22권4호
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• pp.303-329
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• 2019

Intestinal failure (IF) is the critical reduction of the gut mass or its function below the minimum needed to absorb nutrients and fluids required for adequate growth in children. Severe IF requires parenteral nutrition (PN). Pediatric IF is most commonly due to congenital or neonatal intestinal diseases or malformations divided into 3 groups: 1) reduced intestinal length and consequently reduced absorptive surface, such as in short bowel syndrome (SBS) or extensive aganglionosis; 2) abnormal development of the intestinal mucosa such as congenital diseases of enterocyte development; 3) extensive motility dysfunction such as chronic intestinal pseudo-obstruction syndromes. The leading cause of IF in childhood is the SBS. In clinical practice the degree of IF may be indirectly measured by the level of PN required for normal or catch up growth. Other indicators such as serum citrulline have not proven to be highly reliable prognostic factors in children. The last decades have allowed the development of highly sophisticated nutrient solutions consisting of optimal combinations of macronutrients and micronutrients as well as guidelines, promoting PN as a safe and efficient feeding technique. However, IF that requires long-term PN may be associated with various complications including infections, growth failure, metabolic disorders, and bone disease. IF Associated Liver Disease may be a limiting factor. However, changes in the global management of IF pediatric patients, especially since the setup of intestinal rehabilitation centres did change the prognosis thus limiting "nutritional failure" which is considered as a major indication for intestinal transplantation (ITx) or combined liver-ITx.