• Title/Summary/Keyword: Fresnel reflection

Search Result 51, Processing Time 0.032 seconds

Fiber-optic Temperature Sensor Using a Silicone Oil and an OTDR (OTDR을 이용한 실리콘 오일 기반의 광섬유 온도 센서)

  • Jang, Jae Seok;Yoo, Wook Jae;Shin, Sang Hun;Lee, Dong Eun;Kim, Mingeon;Kim, Hye Jin;Song, Young Beom;Jang, Kyoung Won;Cho, Seunghyun;Lee, Bongsoo
    • The Transactions of The Korean Institute of Electrical Engineers
    • /
    • v.64 no.11
    • /
    • pp.1592-1597
    • /
    • 2015
  • In this study, we developed a fiber-optic temperature sensor (FOTS) based on a silicone oil and an optical time domain reflectometer (OTDR) to apply the measurement of a coolant leakage in the nuclear power plant. The sensing probe of the FOTS consists of a silicone oil, a stainless steel cap, a FC terminator, and a single mode optical fiber. Fresnel reflection arising at the interface between the silicone oil and the single mode optical fiber in the sensing probe is changed by varying the refractive index of the silicone oil according to the temperature. Therefore, we measured the optical power of the light signals reflected from the sensing probe. The measurable temperature range of the FOTS using a Cu-coated silica fiber is from $70^{\circ}C$ to $340^{\circ}C$ and the maximum operation temperature of the FOTS is sufficient for usage at the secondary system in the nuclear power plant.

Image Tracking Interference Minimize of Electro Optical Tracking System by MgF2 Nano Structure Antireflective Coating Films (MgF2 나노구조 반사방지막을 통한 함정용 전자광학추적장비 영상추적간섭 최소화)

  • Shim, Bo-Hyun;Jo, Hee-Jin
    • Journal of the Institute of Electronics and Information Engineers
    • /
    • v.52 no.5
    • /
    • pp.206-213
    • /
    • 2015
  • An omni-directional, graded-index and textured ZnO nanorods with $MgF_2$ anti-reflective(AR) coating films for the electro optical tracking system(EOTS) by e-beam evaporation method are presented. we achieved that the graded index structure can minimize image tracking interference of EOTS which is comparable to a general AR coating films. Optimized ZnO nanorods with $MgF_2$ AR coating films lead to decreasing Fresnel reflection by gradient refractive index. According to our experiment results, ZnO nanorods with $MgF_2$ AR coating films can be used for various electro optical system to improve the optical performance.

A Simulation of Photocurrent Loss by Reflectance of the Front Glass and EVA in the Photovoltaic Module (전면 유리와 EVA의 광 반사에 의한 PV모듈의 광전류 손실 예측 시뮬레이션)

  • Lee, Sang-Hun;Song, Hee-Eun;Kang, Gi-Hwan;Ahn, Hyung-Keun;Han, Deuk-Young
    • The Transactions of The Korean Institute of Electrical Engineers
    • /
    • v.62 no.1
    • /
    • pp.76-82
    • /
    • 2013
  • The solar cell is a device to convert light energy into electric, which supplies power to the external load when exposed to the incident light. The photocurrent and voltage occurred in the device are significant factors to decide the output power of solar cells. The crystalline silicon solar cell module has photocurrent loss due to light reflections on the glass and EVA(Ethylene Vinyl Acetate). These photocurrent loss would be a hinderance for high-efficiency solar cell module. In this paper, the quantitative analysis for the photocurrent losses in the 300-1200 wavelength region was performed. The simulation method with MATLAB was used to analyze the reflection on a front glass and EVA layer. To investigate the intensity of light that reached solar cells in PV(Photovoltaic) module, the reflectance and transmittance of PV modules was calculated using the Fresnel equations. The simulated photocurrent in each wavelength was compared with the output of real solar cells and the manufactured PV module to evaluate the reliability of simulation. As a result of the simulation, We proved that the optical loss largely occurred in wavelengths between 300 and 400 nm.

Method for Measuring Dielectric Constant of Planar Dielectric Substrate (판형 유전체의 유전율 측정 방법)

  • Lee, Chang-Hyun;Kwon, Taek-Sun;Lee, Jeong-Hae
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
    • /
    • v.29 no.10
    • /
    • pp.799-804
    • /
    • 2018
  • In this paper, a method for measuring the dielectric constant of a planar dielectric substrate using the free space material constant measurement method in a general measurement environment is proposed. Two horn antennas and a network analyzer were used for S-parameter measurement and the transmission and reflection coefficients of a planar dielectric substrate were calculated from the measurement results. To obtain a reliable dielectric constant in a low-precision-measurement environment, only the magnitude of the transmission coefficient, which has a small error due to the measurement environment, is used for dielectric constant estimation. Finally, the dielectric constant is determined by comparing the measured results at different frequencies.

CPV module characteristics using the secondary reflect mirror (2차 집광부에 반사형 구조를 적용한 CPV모듈)

  • Jeong, Byeong-Ho;Mustafizu, Mustafizul;Lee, Kang-Yeon;Kim, Nam-Oh;Choi, Nak-Il
    • Proceedings of the KIEE Conference
    • /
    • 2015.07a
    • /
    • pp.1080-1081
    • /
    • 2015
  • CPV system in the desert areas or areas near the equator, as is suitable for high-temperature region. As compared to silicon solar cells, CPV system have a high proportion of a BOS (balance of system). Solar cells because of its low proportion when designing a module technology is applied in a variety of ways. Applied to the CPV system is classified into two kinds of optical technology. One of those using fresnel lens uses refraction of light energy. The other is a mirror reflection of the structure using sprays. Both of these two ways to condense the sun to collect solar cell is a form of light. And goals by using a small solar cell materials is to produce more energy. This research proposes rational design approach to calculate proper system capacity in consideration of the aforementioned factors in CPV system.

  • PDF

Optical Cap Sensor for Magneto-Optic Near-Field Recording (MO 근접장 기록을 위한 광학 갭 센서)

  • Yoon, Yong-Joong;Park, Jae-Hyuk;Park, No-Cheol;Park, Young-Pil
    • Transactions of the Korean Society of Mechanical Engineers A
    • /
    • v.28 no.3
    • /
    • pp.245-250
    • /
    • 2004
  • This paper proposes a new method of measuring an air interface distance between a solid immersion lens(SIL) applied magneto-optic technology and the disk surface. For applying near-field recording (NFR) technology to the magneto-optic storage devices for the next generation, it is positively necessary to maintain the small air gap under about 100㎚. We design an apparatus that consists of some optical components such as a prism, a polarizer and an analyzer. By using the Fresnel reflection coefficient equation, Jones matrices calculation and Malus's law, we establish a mathematical model for understanding the characteristics of the system. The simulations are based on the mathematical model and through the simulation results which is made with various cases we can estimate the performance of the new optical gap sensor system. Experimental results, which are also based on the mathematical model for specific cases, are in good agreement with simulated ones and demonstrate the possibility as the new optical gap sensor.

Application of Polystyrene/SiO2 Core-shell Nanospheres to Improve the Light Extraction of GaN LEDs

  • Yeon, Seung Hwan;Kim, Kiyong;Park, Jinsub
    • Proceedings of the Korean Vacuum Society Conference
    • /
    • 2014.02a
    • /
    • pp.314.2-314.2
    • /
    • 2014
  • To improve the optical and electrical properties of commercialized GaN-based light-emitting diodes (LEDs), many methods are suggested. In recent years, great efforts have been made to improve the internal quantum efficiency and light extraction efficiency (LEE) and promising approaches are suggested using a patterned sapphire substrate (PSS), V-pit embedded LED structures, and silica nanostructures. In this study, we report on the enhancement of photoluminescence (PL) intensity in GaN-based LED structures by using the combination of SiO2 (silica) nanospheres and polystyrene/SiO2 core-shell nanospheres. The SiO2 nanospheres-coated LED structure shows the slightly increased PL intensity. Moreover the polystyrene/SiO2 core-shell nanospheres-coated structure shows the more increase of PL intensity comparing to that of only SiO2 spheres-coated structure and the conventional structure without coating of nanospheres. The Finite-difference time-domain (FDTD) simulation results show corresponding result with experimentally observed results. The mechanism of enhancement of PL intensity using the coating of polystyrene/SiO2 core-shell nanospheres on LED surface can be explained by the improvement in extraction efficiency by both increasing the probability of light escape by reducing Fresnel reflection and by multiple scattering within the core-shell nanospheres.

  • PDF

Enhancement of the Localized Surface Plasmon by Evanescent coupling (에바네슨트 결합에 의한 국소 표면 플라즈몬 증대 효과)

  • Lee, Taek-Sung;Kim, Won-Mok;Byun, Seok-Joo;Lee, Django;Lee, Kyeong-Seok
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2008.06a
    • /
    • pp.80-80
    • /
    • 2008
  • 바이오 센서 응용 연구에 많이 사용되는 금(Au) 나노 입자를 이용한 국소 표면 플라즈몬 공명(Localized Surface Plasmon Resonance, LSPR)에 의한 산란광을 검출하는데 주로 이용되는 암시야(dark field) 현미경 검출 방식에 관한 전산모사를 통하여 입사광의 입사 방식에 따른 산란광 세기를 정량적으로 분석하였다. 전산모사 기법으로는 국소 표면 플라즈몬 공명의 동역학적인 현상을 모사할 수 있는 유한차분시간영역(Finite Difference Time Domain, FDTD) 기법을 이용하였는데, 이러한 기법이 암시야 현미경 전산 모사에 유효함을 우선적으로 검증하였다. 암시야 현미경 검출 방식의 모사에서 입사 광원의 반사 입사 방식과 투과 입사 방식을 비교하였고, 각각의 방식에 서 입사광의 입사각에 따른 산랑광 세기를 계산하였다. 이러한 전산모사를 통하여 프리즘을 통한 내부 전반사(Total Internal Reflection, TIR) 방식에서 입사 광원의 임계각 근처에서 많이 발생하는 에바네슨트 장(evanescent field)을 결합하는 경우 산란광 세기가 증가함을 관찰하였고, 이러한 세기의 변화를 프레넬(Fresnel) 방정식에 의해 계산된 에바네슨트 장의 세기 분포와 비교 분석하였다.

  • PDF

Analysis of Surface and Thin Films Using Spectroscopic Ellipsometry (Spectroscopic Ellipsometry를 이용한 표면 및 박막의 분석)

  • 김상열
    • Korean Journal of Optics and Photonics
    • /
    • v.1 no.1
    • /
    • pp.73-86
    • /
    • 1990
  • The technique of Spectroscopic Ellipsometry (SE) has been examined with emphasis on its inherent sensitivity to the existence of thin films or surface equivalents. A brief review of related theories like the Fresnel reflection coefficients, the effect of a multilayer upon reflectivities, together with the validity of the effective medium theory and the modelling procedure, is followed by a short description of the experimental setup of a rotating polarizer type SE as well as the necessful expressions which lead to tan and cos. Out of its numerous, successful applications, a few are exampled to convince a reader that SE can be applied to a variety of research fields related to surface, interface and thin films. Specifically, those are adsorption and/or desorption on metals or semiconductors, oxidation process, formation of passivation layers on an electrode, thickness determination, interface between semiconductor and its oxide, semiconductor heterojunctions, surface microroughness, void distribution of dielectric, optical thin films, depth profile of multilayered samples, in-situ or in-vitro characterization of a solid surface immersed in electrolyte during electrochemical, chemical, or biological treatments, and so on. It is expected that the potential capability of SE will be widely utilized in a very near future, taking advantage of its sensitivity to thin films or surface equivalents, and its nondestructive, nonperturbing characteristics.

  • PDF

Development of the Real-time Concentration Measurement Method for Evaporating Binary Mixture Droplet using Surface Plasmon Resonance Imaging (표면플라즈몬공명 가시화 장치를 이용한 증발하는 이종혼합물 액적의 실시간 농도 가시화 기법 개발)

  • Jeong, Chan Ho;Lee, Hyung Ju;Choi, Chang Kyoung;Lee, Hyoungsoon;Lee, Seong Hyuk
    • Journal of ILASS-Korea
    • /
    • v.26 no.4
    • /
    • pp.212-218
    • /
    • 2021
  • The present study aims to develop the Surface Plasmon Resonance (SPR) imaging system facilitating the real-time measurement of the concentration of evaporating binary mixture droplet (BMD). We introduce the theoretical background of the SPR imaging technique and its methodology for concentration measurement. The SPR imaging system established in the present study consists of a LED light source, a polarizer, a lens, and a band pass filter for the collimated light of a 589 nm wavelength, and a CCD camera. Based on the Fresnel multiple-layer reflection theory, SPR imaging can capture the change of refractive index of evaporating BMD. For example, the present study exhibits the visualization process of ethylene glycol (EG)-water (W) BMD and measures real-time concentration change. Since the water component is more volatile than the ethylene glycol component, the refractive index of EG-W BMD varies with its mixture composition during BMD evaporation. We successfully measured the ethylene glycol concentration within the evaporating BMD by using SPR imaging.