• 제목/요약/키워드: Forcal Plane

검색결과 5건 처리시간 0.023초

segmented Focal Plane Array를 이용한 개선된 레티클 탐색기 (An Improved Reticle Seeker Using the Segmented Forcal Plane Array)

  • 홍현기;한성현;최종수
    • 한국통신학회논문지
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    • 제21권10호
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    • pp.2670-2678
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    • 1996
  • Reticle seekers temporally modulate target location onto the incoming spatial signal. When large or multiple targets are present in the FOV, however, it is hard to precisely modulate the incoming target signal by the relicle. To solve this loss of modulatoin depth problem, we present an improved retical seeker using the segmented focal plane array(FPA). The new reticle system uses the normalized difference as well as the modulated signal of each detector output in the segmented FPA. In simulation, we have ascertained the proposed system can make an effective analysis and tracking for multiple or large targets.

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소형 위성 카메라의 영상안정화를 위한 초점면부 보정장치의 제어 (Control of Focal Plane Compensation Device for Image Stabilization of Small Satellite Camera)

  • 강명수;황재혁;배재성
    • 항공우주시스템공학회지
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    • 제10권1호
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    • pp.86-94
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    • 2016
  • In this paper, position control of focal plane compensation device using piezoelectric actuator is conducted. The forcal plane compensation device installed on earth observation satellite camera compensates micro-vibration from reaction wheels. In this study, four experimental models of the open-loop compensation device are derived using MATLAB system identification toolbox in the input range of 0~50Hz. Subsequently, the PID controller for each model is designed and the performance test of each controller is conducted through MATLAB/Simulink. According to frequency response analysis of the closed-loop compensation device system, the PID controller designed for 38~50Hz input range has enough tracking performance for the whole 0~50Hz input range. The maximum output error is about $1{\mu}m$ for the input range. The simulation results has been verified by the experimental method.

공초점 원리를 이용한 표면 현상 측정 (Surface measurement using Confocal principle)

  • 송대호;유원제;강영준;김경석
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2000년도 추계학술대회 논문집
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    • pp.51-54
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    • 2000
  • The traditional surface measuring method using confocal principle requires much time to measure an object surface since it is a scanning tool. In this paper, the upgraded confocal microscope is introduced. It is also a scanning tool but it requires 2D-scanning while the traditional one requires 3D-scanning. It means the time for measuring is considerably reduced. In addition, the measuring system is configured to increase the efficiency of beam. He-Ne laser whose frequency is 632.8nm is used for the laser source. An example of measuring result through the upgraded confocal microscope is showed.

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Hg1-xCdxTe를 이용한 64x1 선형 적외선 감지 소자 제작 (Fabrication of 64x1 linear array infrared detector using Hg1-xCdxTe)

  • 김진상;서상희
    • 센서학회지
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    • 제18권2호
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    • pp.135-138
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    • 2009
  • $64{\times}1$ forcal plane infrared detector has been fabricated by using HgCdTe epi layer. HgCdTe was grown on GaAs substrate by using metal organic chemical vapor deposition. This paper describes key developments in the epi layer growth and device fabrication process. The performance of IR imaging system is summarized.

MBE법으로 성장된 CdTe(211)/Si 기판을 이용한 MOVPE HgCdTe 박막의 특성 향상 (Improvement of HgCdTe Qualities grown by MOVPE using MBE grown CdTe/Si as Substrate)

  • 김진상;서상희
    • 센서학회지
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    • 제12권6호
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    • pp.282-288
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    • 2003
  • MBE 방법으로 Si 기판위에 성장된 CdTe(211) 박막위에 MOVPE 법으로 HgCdTe 박막을 성장하였다. 성장된 박막의 표면은 hillock 등의 결함이 없는 매우 균일한 형상을 보였다. HgCdTe 박막표면의 EPD(etch pit density) 및 (422) 결정면의 이중 결정 x-선 회절 피크의 반치폭으로 본 결정성은 GaAs 기판위에 성장된 HgCdTe 박막에 비하여 우수하였다. GaAs 기판 위에 MOVPE 법으로 성장된 HgCdTe는 기판처리 과정에서 유입된 p-형 불순물로 인해 p-형 전도성을 나타내었으나 (211)CdTe 기판 위에 성장된 박막은 77K에서 $8{\times}10^{14}/cm^3$의 운반자 농도를 갖는 n-형 전도성을 보였다. 본 연구의 결과는 최근 요구되고 있는 $1024{\times}1024$급 이상의 화소를 갖는 대면적 HgCdTe 적외선 소자 제작에 널리 적용될 것으로 판단된다.