• Journal of Powder Materials
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• v.19 no.1
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• pp.67-71
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• 2012

The present paper gives an overview about the Atom Probe Tomography technique and its application to powder materials. The preparation of needle-shaped Atom Probe specimens from a single powder particle using focused-ion-beam milling is described. Selected experimental data on mechanically alloyed (and sintered) powder materials are presented, giving insight into the atomic-scale elemental redistribution occurring under powder metallurgical processing.

• Advances in materials Research
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• v.13 no.2
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• pp.87-102
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• 2024

This paper is focused on the delamination analysis of a multilayered beam structure loaded in torsion under strain-path control. The beam under consideration has a rectangular cross-section. The layers of the beam are made of different viscoelastic materials which exhibit continuous inhomogeneity in longitudinal direction. Since the delamination is located inside the beam structure, the torsion moments in the two crack arms are obtained by modeling the beam as an internally static undetermined structure. The strain energy stored in the beam is analyzed in order to derive the strain energy release rate (SERR). Since the delamination is located inside the beam, the delamination has two tips. Thus, solutions of the SERR are obtained for both tips. The solutions are verified by analyzing the beam compliance. Delamination analysis with bending-torsion coupling is also performed. The solutions derived are timedependent due to two factors. First, the beam has viscoelastic behavior and, second, the angle of twist of the beam-free end induced by the external torsion moment changes with time according to a law that is fixed in advance.

• The Journal of the Acoustical Society of Korea
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• v.27 no.7
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• pp.357-364
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• 2008

For the purpose of possibility study on development of an acoustic tweezer using standing waves and very high frequency ultrasound focused beams, a system which can manipulate the position of particles in water has been constructed. It can move the particles to near focal point of a focused beam by the radiation force of standing waves, and then the particles would be trapped by the radiating force of the focused beam. The results show that micro sphere particles were trapped well at nodes of the standing waves and their position can be easily manipulated by frequency control. And, even though the radiation force by single focused beam pushes a particle away from the transducer, two focused confronted beams can trap it at near center.

• Rapid Communication in Photoscience
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• v.4 no.4
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• pp.86-87
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• 2015

Substituted butadiyne cobalt complexes 1, 2 were prepared and placed on the e-beam to study the fragmentation focused on diyne generation, in MS spectrometer. Phenyl or methyl substituted cobalt complexes generated the corresponding diyne with 100, 30% relative intensities under e-beam irradiation in gas phase.

• Proceedings of the Korea Concrete Institute Conference
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• 2006.05b
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• pp.369-372
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• 2006

In this paper, analysis method of HPFRCC is proposed as predicting properties flexural behavior. For analyzing HPFRCC beam, properties of strain-hardening, multiple cracking, and crack spacing control are considered as non-homogeneous material properties of the beam. This paper focused on the deflection, maximum moment of the flexural beam, distribution of crack width with the monte carlo simulation.

• Proceedings of the Korean Vacuum Society Conference
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• 2008.08a
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• pp.295-295
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• 2008

• Journal of the Korean Institute of Telematics and Electronics D
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• v.35D no.9
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• pp.42-47
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• 1998

We have fabricated electron-optical lens for micro E-beam system that can overcome the limitation of current E-beam lithography. Our electron-optical lens consists of multiple silicon electrodes which were fabricated by micromachining technology and assembled by anodic bonding. The assembled system was installed in UHV chamber to observe the emission characteristics of focused electrons by the electro-optical lens. We used STM(Scanning Tunneling Microscope) tip for electron source. By performing lithography with the focused electrons with PMMA(poly-methylmethacrylate) as E-beam resist. We could draw 0.13${\mu}{\textrm}{m}$ nano-scale lines.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2005.10a
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• pp.322-325
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• 2005

The shrinking critical dimensions of modern technology place a heavy requirement on optimizing feature shapes at the micro- and nano scale. In addition, the use of ion beams in the nano-scale world is greatly increased by technology development. Especially, Focused ion Beam (FIB) has a great potential to fabricate the device in nano-scale. Nevertheless, FIB has several limitations, surface swelling in low ion dose regime, precipitation of incident ions, and the re-deposition effect due to the sputtered atoms. In recent years, many approaches and research results show that the re-deposition effect is the most outstanding effect to overcome or reduce in fabrication of micro and nano devices. A 2D string based simulation software AMADEUS-2D $(\underline{A}dvanced\;\underline{M}odeling\;and\;\underline{D}esign\;\underline{E}nvironment\;for\;\underline{S}putter\;Processes)$ for ion milling and FIB direct fabrication has been developed. It is capable of simulating ion beam sputtering and re-deposition. In this paper, the 2D FIB simulation is demonstrated and the characteristics of ion beam induced direct fabrication is analyzed according to various parameters. Several examples, single pixel, multi scan box region, and re-deposited sidewall formation, are given.

• Transactions of the Korean Society of Machine Tool Engineers
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• v.15 no.6
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• pp.71-75
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• 2006

The application of focused ion beam (FIB) technology in micro/nano machining has become increasingly popular. Its usage in micro/nano machining has advantages over contemporary photolithography or other micro/nano machining technologies such as small feature resolution, the ability to process without masks and being accommodating for a variety of materials and geometries. The target of this paper is the analysis of FIB sputtering process according to tilt angle, dwell time and overlap for application of 3D micro and pattern fabrication and to find the effective beam scanning conditions using Taguchi method. Therefore we make the conclusions that tilt angle is dominant parameter for sputtering yield. Burr size is reduced as tilt angle is higher.

• Laser Solutions
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• v.5 no.3
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• pp.15-20
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• 2002

The principal obstacle to selection of a laser processing method in production is its relatively high equipment cost and the natural unwillingness of production supervision to try something new until it is thoroughly proven. The major objective of this work is focused on the combined features of gas tungsten arc and a low-power cold laser beam. In this work, the laser beam from a 7 watts carbon monoxide laser was combined with electrical discharges from a short-pulsed capacitive discharge GTA welding power supply. When the low power CO laser beam passes through a special composition shielding gas, the CO molecules in the gas absorbs the radiation, and ionizes through a process blown as non-equilibrium, vibration-vibration pumping. The resulting laser-induced plasma(LIP) was positioned between various configurations of electrodes. The high-voltage impulse applied to the electrodes forced rapid electrical breakdown between the electrodes. Electrical discharges between tungsten electrodes and aluminum sheet specimens followed the ionized path provided by LIP. The result was well-focused melted spots.