• Title/Summary/Keyword: Field Emission

Search Result 2,718, Processing Time 0.03 seconds

Effects of Transverse Magnetic Field on Laser-produced Carbon Plasma Plume in Nitrogen Atmosphere

  • Nam, Sang-Hwan;Ko, Min-Jung;Lee, Mi-Ae;Park, Hye-Sun;Song, Jae-Kyu;Park, Seung-Min
    • Bulletin of the Korean Chemical Society
    • /
    • v.28 no.5
    • /
    • pp.767-771
    • /
    • 2007
  • By adopting a time-resolved optical emission spectrometry, we have investigated the effects of transverse magnetic field on C2 and CN molecules produced by laser ablation of a graphite target in nitrogen atmosphere. We found that the spectroscopic temperatures of both species, obtained via simulation of the optical emission spectra, as well as their emission intensities from the electronically excited states increased significantly in the presence of a magnetic field. The cyclotron radii and frequencies for electrons and ions were estimated to explain the increase in the number of collisions in the laser-produced carbon plasma plume under a magnetic field.

A Study on Field Electron Emission Characteristics of Diamond-Like Carbon (다이아몬드성 탄소 박막의 전계 전자 방출 특성에 관한 연구)

  • Yeo, Seon-Young;Pyo, Jae-Hwack;Kim, Joong-Kyun;Whang, Ki-Woong
    • Proceedings of the KIEE Conference
    • /
    • 1996.11a
    • /
    • pp.203-205
    • /
    • 1996
  • DLC(Diamond-Like Carbon) films were prepared by Inductively Coupled Plasma(ICP) CVD system. It was confirmed that the field emission characteristics are closely related to the richness of C-H bonding incorporated in the DLC. According to Fowler-Nordheim equation, it is thought that the ability of DLC to emit electron at relatively low voltage is due to the field enhancement caused by the nodules of ${\sim}100nm$ size on the surface of DLC. The electric field to start field emission was about $1.4{\times}10^9V/m$ in case of DLC film deposited at input power of 400W and substrate bias of -100V.

  • PDF

Improved Surface Morphologies of Printed Carbon Nanotubes by Heat Treatment and Their Field Emission Properties

  • Lee, Hyeon-Jae;Lee, Yang-Doo;Cho, Woo-Sung;Kim, Jai-Kyeong;Lee, Yun-Hi;Hwang, Sung-Woo;Ju, Byeong-Kwon
    • Journal of Information Display
    • /
    • v.7 no.2
    • /
    • pp.22-25
    • /
    • 2006
  • This paper presents heating process for obtaining standing carbon nanotube emitters to improve field-emission properties from the screen-printed multiwalled carbon nanotube (MWCNT) films. In an atmosphere with optimum combination of nitrogen and air for heat treatment of CNT films, the CNT emitters can be made to protrude from the surface. This allows for high emission current and the formation of very uniform emission sites without special surface treatment. The morphological change of the CNT film by this technique has eliminated additional processing steps, such as surface treatment which may result in secondary contamination and damage to the film. Despite its simplicity the process provides high reproducibility in emission current density which makes the films suitable for practical applications.

Study on Vacuum Packaging of Field Emission Display (Field Emission Display의 고진공 실장에 관한 연구)

  • Lee, Duck-Jung;Ju, Byeong-Kwon;Jang, Jin;Oh, Myong-Hwan
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 1999.05a
    • /
    • pp.103-106
    • /
    • 1999
  • In this paper, we suggest the FED packaging technology that have 4mm thickness, using sodalime glass-to-sodalime glass electrostatic bonding. It based on conventional silicon-glass bonding. The silicon film was deposited an around the exhausting hole on FED backside panel. And then, the silicon film of panel was successfully bonded with capping(bare) glass in vacuum environment and the FED panel was vacuum-sealed. In this method, we could achieve more 153 times increased conductance and 200 times increased vacuum efficiency than conventional tube packaging method. The vacuum level in panel, by SRG test, was maintained about low 10$_{-4}$ Torr during above two months And, the light emission was observed to 0.7-inch tubeless packaged FED. Then anode current was 34 $\mu$ A. Emission stability was constantly measured for 10 days.

  • PDF

다공질 실리콘을 이용한 전계 방출 소자

  • 주병권
    • Proceedings of the International Microelectronics And Packaging Society Conference
    • /
    • 2002.05a
    • /
    • pp.92-97
    • /
    • 2002
  • We establish a visible light emission from porous polycrystalline silicon nano structure(PPNS). The PPNS layer are formed on heavily doped n-type Si substrate. 2um thickness of undoped polycrystalline silicon deposited using LPCVD (Low Pressure Chemical Vapor Deposition) anodized in a HF: ethanol(=1:1) as functions of anodizing conditions. And then a PPNS layer thermally oxidized for 1 hr at $900 ^{\circ}C$. Subsequently, thin metal Au as a top electrode deposited onto the PPNS surface by E-beam evaporator and, in order to establish ohmic contact, an thermally evaporated Al was deposited on the back side of a Si-substrate. When the top electrode biased at +6V, the electron emission observed in a PPNS which caused by field-induces electron emission through the top metal. Among the PPNSs as functions of anodization conditions, the PPNS anodized at a current density of $10mA/cm^2$ for 20 sec has a lower turn-on voltage and a higher emission current. Furthermore, the behavior of electron emission is uniformly maintained.

  • PDF

Fabrication of Vertically Aligned GaN Nanostructures and Their Field Emission Property

  • Jo, Jong-Hoe;Kim, Je-Hyeong;Jo, Yong-Hun
    • Proceedings of the Korean Vacuum Society Conference
    • /
    • 2014.02a
    • /
    • pp.281-281
    • /
    • 2014
  • The field emission properties of GaN are reported in the present study. To be a good field emitter, it requires a low work function, high aspect ratio, and strong mechanical stability. In the case of GaN, it has a quite low work function (4.1eV) and strong chemical/mechanical/thermal stabilities. However, so far, it was difficult to fabricate vertical GaN nanostructures with a high aspect ratio. In this study, we successfully achieved vertically well aligned GaN nanostructures with chemical vapor-phase etching methods [1] (Fig. 1). In this method, we chemically etched the GaN film using hydrogen chloride and ammonia gases at high temperature around $900^{\circ}C$. This process effectively forms vertical nanostructures without patterning procedure. This favorable shape of GaN nanostructures for electron emitting results in excellent field emission properties such as a low turn-on field and long term stability. In addition, we observed a uniform fluorescence image from a phosphor film attached at the anode part. The turn-on field for the GaN nanostructures is found to be about $0.8V/{\mu}m$ at current density of $20{\mu}A$/cm^2. This value is even lower than that of typical carbon nanotubes ($1V/{\mu}m$). Moreover, threshold field is $1.8V/{\mu}m$ at current density of $1mA$/cm^2. The GaN nanostructures achieved a high current density within a small applied field range. We believe that our chemically etched vertical nanostructures are the promising structures for various field emitting devices.

  • PDF

Fabrication of Triode Type Field Emission Device Using Carbon Nanotubes Synthesized by Thermal Chemical Vapor Deposition (열 화학 기상 증착법을 이용한 삼극관 구조의 탄소 나노 튜브 전계 방출 소자의 제조)

  • Yu W. J.;Cho Y. S.;Choi G. S.;Kim D. J.
    • Korean Journal of Materials Research
    • /
    • v.14 no.8
    • /
    • pp.542-546
    • /
    • 2004
  • We report a new fabrication process for high performance triode type CNT field emitters and their superior electrical properties. The CNT-based triode-type field emitter structure was fabricated by the conventional semiconductor processes. The keys of the fabrication process are spin-on-glass coating and trim-and-leveling of the carbon nanotubes grown in trench structures by employing a chemical mechanical polishing process. They lead to strong adhesion and a uniform distance from the carbon nanotube tips to the electrode. The measured emission property of the arrays showed a remarkably uniform and high current density. The gate leakage current could be remarkably reduced by coating of thin $SiO_{2}$ insulating layer over the gate metal. The field enhancement factor(${\beta}$) and emission area(${\alpha}$) were calculated from the F-N plot. This process can be applicable to fabrication of high power CNT vacuum transistors with good electrical performance.

Optical Properties and Field Emission of ZnO Nanorods Grown on p-Type Porous Si

  • Park, Taehee;Park, Eunkyung;Ahn, Juwon;Lee, Jungwoo;Lee, Jongtaek;Lee, Sang-Hwa;Kim, Jae-Yong;Yi, Whikun
    • Bulletin of the Korean Chemical Society
    • /
    • v.34 no.6
    • /
    • pp.1779-1782
    • /
    • 2013
  • N-type ZnO nanorods were grown on p-type porous silicon using a chemical bath deposition (CBD) method (p-n diode). The structure and geometry of the device were examined by field-emission scanning electron microscopy (FE-SEM) and X-ray diffraction (XRD) while the optoelectronic properties were investigated by UV/Vis absorption spectrometry as well as photoluminescence and electroluminescence measurements. The field emission (FE) properties of the device were also measured and its turn-on field and current at 6 $V/{\mu}m$ were determined. In principle, the growth of ZnO nanorods on porous siicon for optoelectronic applications is possible.

Field Emission Characteristics and Growth Analysis of Carbon Nanotubes by Plasma-enhanced Chemical Vapor Deposition (플라즈마 화학 기상 증착법을 이용한 탄소나노튜브의 성장 분석 및 전계방출 특성)

  • 오정근;주병권;김남수
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.16 no.12S
    • /
    • pp.1248-1254
    • /
    • 2003
  • Carbon nanotubes(CNTs) are grown by using Co catalyst metal. CNTs fabricated by PECVD(plasma enhanced chemical vapor deposition) method are studied in terms of surface reaction and surface structure by TEM and Raman analysing method and ate analysed in its electrical field emission characteristics with variation of space between anode and cathode. Acetylene(C$_2$H$_2$) gas is used as the carbon source, while ammonia and hydrogen gas are used as catalyst and dilution gas. The CNTs grown by hydrogen(H$_2$) gas plasma indicates better vortical alignment, lower temperature process, and longer tip, compared to that grown by ammonia(NH$_3$) gas plasma. The CNTs fabricated with Co(cobalt) catalyst metal and PECVD method show the multiwall structure in mid-circle type in tip-end and the inner vacancy of 10nm. Emission properties of CNTs indicate the turn-on field to be 2.6 V/${\mu}{\textrm}{m}$ We suggest that CNTs can be possibly applied to the emitter tip of FEDs and high brightness flat lamp because of low temperature CNTs growth, low turn-on field.

Effect of Nano Buffer Layer on Property and Growth of Carbon Thin Film (탄소계 박막의 성장과 특성에 대한 나노 Buffer Layer의 영향)

  • ;Takashi lkuno;Kenjirou Oura
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.16 no.1
    • /
    • pp.53-59
    • /
    • 2003
  • Using Platinum-silicide (PtSi) formed between silicon substrate and carbon film, we have improved the field emission of electrons from carbon films. Pt films were deposited on n-Si(100) substrates at room temperature by DC sputter technique. After deposition, these PtSi thin films were annealed at 400 ~ $600^{\circ}C$ in a vacuum chamber, and the carbon films were deposited on those Pt/Si substrates by laser ablation at room temperature. The field emission property of C/Pt/Si system is found to be better than that of C/Si system and it is showed that property was improved with increasing annealing temperature. The reasons why the field emission from carbon film was improved can be considered as follows, (1)the resistance of carbon films was decreased due to graphitization, (2)electric field concentration effectively occurred because the surface morphology of carbon film deposited on Pt/si substrates with rough surface, (3)it is showed that annealing induced reaction between Pt film and Si substrate, as a consequence that the interfacial resistance between Pt film and Si substrate was decreased.