• Proceeding of EDISON Challenge
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• 2014.03a
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• pp.454-456
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• 2014

ferroelectric perovskite의 ferroelectricity를 유지하기 위해서는 oxygen vacancy를 조절해야 한다. BTO의 경우 Ti-O(vacancy site)-Ti의 align 방향에 따라 두 종류의 vacancy가 존재하는데, Ti-O-Ti가 c-axis와 평행한 경우 BTO의 ferroelectricity가 약해진다. 본 연구에서는 BTO에 ab-biaxial strain을 가해 보고, 그 결과 두 종류의 vacancy formation energy가 어떻게 변화하는지 확인하였다. 그 결과 a, b-axis의 격자 상수가 증가하면 $V_b$가 $V_c$에 비해 안정해진다는 사실을 확인하였다. 이는 BTO의 oxygen vacancy의 vacancy site에 vacancy로 인해 남는 전자가 국지화되어 Ti-vacancy site 간 인력과 Ti-Ti간 반발력이 균형을 이룰 때 vacancy의 에너지가 낮아지기 때문이다.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.323-323
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• 2012

We present ferroelectricity of Bi-doped ZnO film probed by piezoresponse force microscopy (PFM), which is one of the Scanning Probe Microscopy techniques. Perovskite ferroelectrics are limited to integration of devices into semiconductor microcircuitry due to hard adjusting their lattice structure to the semiconductor materials. Transition metal doped ZnO film is one of the candidate materials for replacing the perovskite ferroelectrics. In this study, ferroelectric characteristics of the Bi-doped ZnO grown by pulsed laser deposition were probed by PFM. The polarization switching and patterning of the ZnO films were performed by applying DC bias voltage between the AFM tips and the films with varying voltages and polarity. The PFM contrast before and after patterning showed clearly polarization switching for a specific concentration of Bi atoms. In addition, the patterned regions with nanoscale show clearly the local piezoresponse hysteresis loop. The spontaneous polarization of the ZnO film is estimated from the local piezoresponse based on the comparison with LiNbO3 single crystals.

• Journal of the Korean Ceramic Society
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• v.34 no.8
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• pp.897-907
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• 1997

Thin films of Bi4-xSmxTi3O12(0$\leq$x$\leq$2) were prepared on Pt/Ti/SiO2/Si(100) at $700^{\circ}C$ using spin-coating with sols derived from Bi-Sm-Ti complex alkoxides. From X-ray diffraction analysis, it was observed that Sm-substituted phases resembled ferroelectric Bi4Ti3O12 in structure. Variations of their lattice parameters depending on the amount of Sm-substitution showed that an anomalous structural distortion might exist at x=1. The grain sizes of the thin films decreased from 0.115 ${\mu}{\textrm}{m}$ to 0.078${\mu}{\textrm}{m}$ with increasing the amount of Sm-substitution. The dielectric constants and the remanent polarizations of the thin films decreased with increasing the amount of the Sm-substitution, which were related to decrease of the stereo-active Bi3+ ion contributing to polarization. However, these values were exceptionally high at x=1, compared to those of the other substituted phases. Such an anomaly suggests that the phase of x=1 has 1:1 chemical ordering between Sm and Bi in structure. The thin films of all compositions except x=2 showed ferroelectricity. The thin film of x=2 was paraelectric, whose grains were too fine to exhibit ferroelectricity.

• Journal of the Korean institute of surface engineering
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• v.53 no.4
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• pp.169-181
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• 2020

The ferroelectricity in emerging fluorite-structure oxides such as HfO₂ and ZrO₂ has attracted increasing interest since 2011. Different from conventional ferroelectrics, the fluorite-structure ferroelectrics could be reliably scaled down below 10 nm thickness with established atomic layer deposition technique. However, defects such as carbon, hydrogen, and nitrogen atoms in fluorite-structure ferroelectrics are reported to strongly affect the nanoscale polymorphism and resulting ferroelectricity. The characteristic nanoscale polymorphism and resulting ferroelectricity in fluorite-structure oxides have been reported to be influenced by defect concentration. Moreover, the conduction of charge carriers through fluorite-structure ferroelectrics is affected by impurities. In this review, the origin and effects of various kinds of defects are reviewed based on existing literature.

• Proceedings of the Korean Magnestics Society Conference
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• 2007.05a
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• pp.109.1-109.1
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• 2007

• Proceedings of the Korean Magnestics Society Conference
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• 2002.12a
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• pp.40-41
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• 2002

Synthesis of the ferroelectromagnetic material exhibiting ferromagnetism and ferroelectricity simultaneously has been an interesting subject due to not only for a possible application in electronic devices but also from the view point of solid state physics. In this study bulk ceramics and thin films of xBiFeO$_3$-yPrFeO$_3$-zPbTiO$_3$(x+y+z=1) and (1-w)BiFeO$_3$-wPbTiO$_3$ have been explored for finding ferroelectromagnetic material, in which ferroelectricity and ferromagnetism coexist simultaneously. (omitted)

• Proceedings of the Korean Vacuum Society Conference
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• 1999.07a
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• pp.82-82
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• 1999

Ferroelectric materials are characterized by the existence of a spontaneous remnant polarization that can be switched between two stable states by an applied field. This phenomenon is known as ferroelectricity. The ferroelectricity can be utilized for nonvolatile memory application. Up to now 256K FRAM was successfully fabricated and sold in the memory market. This paper will briefly review the current statue of ferroelectric random access memory (FRAM) focusing on recent developments. In addition, the future prospects of FRAM will be addressed.

• Proceedings of the Korean Ceranic Society Conference
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• 2000.04a
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• pp.122.2-122.2
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• 2000

• Proceedings of the Korean Magnestics Society Conference
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• 2007.05a
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• pp.111.1-111.1
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• 2007

• The Transactions of The Korean Institute of Electrical Engineers
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• v.67 no.10
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• pp.1317-1321
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• 2018

PVDF as a semicrystal polymer, having a structure with C-F dipole moments, has been widely investigated because of its excellent chemical stability, mechanical strength, and ferroelectricity. In this study, ferroelectic ${\beta}$ type - PVDF layer was prepared by using an electrostatic spray deposition method and the effects of the addition of Ni-nitrate in precursor solution on the properties of PVDF layer were evaluated. Crystallinity and chemical structure of the PVDF layer were analyzed by a X-ray diffraction and Fourier Transform Infrared Spectrophotometer. Surface structure and fractured cross section of the layer were examined by a field emission-scanning electron microscope. LCR meter was used to obtain the dielectric properties of the layer. As the addition of an inorganic metal salt in PVDF sol, ${\beta}$ type - PVDF crystals were appeared in the hydrated metal salts doped-layer since the strong hydrogen bondings $(O-H{\cdots}F-C)_n$ due to high polarity of OH- were formed.