• Title/Summary/Keyword: Fe-Pt

Search Result 442, Processing Time 0.027 seconds

An AC Voltammetric Instrumentation and Its Application in Iodine Analysis (교류 전압전류계의 제작과 요오드 정량에의 응용)

  • Kim, Moon-Soon;Jung, Eui-Han;Jeong, Gi-Ho;Shim, Yoon-Bo
    • Analytical Science and Technology
    • /
    • v.5 no.1
    • /
    • pp.91-96
    • /
    • 1992
  • A simple and cheap AC voltammeter was manufactured in our lab. This instrument consists of a DC function generator and a lock-in amplifier. We tested this instrument in some chemical systems. Our data, CV voltammogram and AC voltammogram, obtained form using a Pt working electrode in 1M $H_2SO_4$ and a reversible system of $1{\times}10^{-3}M$ ${Fe(CN)_6}^{3-}$ proved our system works well. The quantitative result of iodine is also obtained.

  • PDF

Possibility of Magnetocapacitor for Multilayered Thin Films

  • Hong, Jong-Soo;Yoon, Sung-Wook;Kim, Chul-Sung;Shim, In-Bo
    • Journal of Magnetics
    • /
    • v.17 no.2
    • /
    • pp.78-82
    • /
    • 2012
  • CoNiFe(CNF)/$BaTiO_3(BTO)$/CoNiFe(CNF) multilayered thin films were deposited on Pt/Ti/$SiO_2$/Si substrates by using pulsed laser deposition (PLD) system. We fabricated three different thin films of BTO, BTO/CNF and CNF/BTO/CNF for magneto-capacitor and studied their crystalline structure, surface and interface morphology, and magnetic and electrical properties. When three different structures of multilayered thin film were compared, magnetization of CNF/BTO/CNF thin films was decreased by magnetic and dielectric interaction. Also we confirmed that capacitance of CNF/BTO/CNF multilayered thin film was enhanced as being near tetragonal structure with increasing of c/a ratio because of atomic bonding at interface between BTO dielectric and CNF magnetic materials. Finally, we studied the change of the capacitance of CNF/BTO/CNF multilayered thin film with magnetic field for emergence of magnetocapacitance and suggested a possibility of enhanced capacitance.

Hydrogen Peroxide Generation of DSA for Electro-Fenton Reaction and Removal of Rhodamine B (Electro-Fenton 반응을 위한 불용성 전극의 과산화수소 생성과 Rhodamine B의 제거)

  • Kim, Dong-Seog;Park, Young-Seek
    • Journal of Environmental Health Sciences
    • /
    • v.34 no.2
    • /
    • pp.175-182
    • /
    • 2008
  • This study investigates the optimal conditions for electrogenerated hydrogen peroxide production and the application of the electro-Fenton process using DSA electrodes. The influences of parameters for the hydrogen peroxide generation such as electrode materials, electrolyte concentration, current, pH, air flow rate and electrode distance were investigated using a laboratory scale batch reactor. The relative performance for hydrogen peroxide generation of each of the six electrodes is : Ru-Sn-Ti > Ru-Sn-Sb > Ru > Ir > Pt > Sn-Sb. Optimum NaCl dosage, current and air flow rate were 2.0 g/l, 12.5 A and 2 l/min, respectively. When the pH is low, hydrogen peroxide concentration was high. Electrode distance dos not effect to a hydrogen peroxide generation. A complete color removal was obtained for RhB (200 mg/l) at the 8 min mark of the electro-Fenton process under optimum operation conditions of $Fe^{2+}$ 0.105 g/l and 5.0 A. The electro-Fenton process increased initial reaction and decreased final reaction time. However the effect was not high.

FE analyses and prediction of bursting forces in post-tensioned anchorage zone

  • Kim, Joung Rae;Kwak, Hyo-Gyoung
    • Computers and Concrete
    • /
    • v.21 no.1
    • /
    • pp.75-85
    • /
    • 2018
  • To improve the design equation for the evaluation of the bursting force in the post-tensioned anchorage zone, this paper presents the analyses and design of the post-tensioned (PT) anchorage zone on the basis of three dimensional (3D) finite element (FE) analyses. The structural behavior was investigated through linear elastic finite element analyses upon consideration of the change in design parameters such as the bearing plate size, the eccentricity, and the tendon inclination. Moreover, consideration of the duct hole, which causes an increase of the bursting stress with a change in its distribution along the anchorage zone as well, is emphasized. Since that an exact prediction of the bursting force is the primary interest in design practice, additional parametric analyses are carried out to evaluate the relative contribution of all design parameters in determining the bursting force, and a comparison with the design guidelines mentioned in AASHTO-LRFD has been provided. Finally, an improved design guideline that takes into account the influence by the duct hole is suggested.

Preparation and Field-Induced Electrical Properties of Perovskite Relaxor Ferroelectrics

  • Fan, Huiqing;Peng, Biaolin;Zhang, Qi
    • Transactions on Electrical and Electronic Materials
    • /
    • v.16 no.1
    • /
    • pp.1-4
    • /
    • 2015
  • (111)-oriented and random oriented $Pb_{0.8}Ba_{0.2}ZrO_3$ (PBZ) perovskite relaxor ferroelectric thin films were fabricated on Pt(111)/$TiO_x$/$SiO_2$/Si substrate by sol-gel method. Nano-scaled antiferroelectric and ferroelectric two-phase coexisted in both (111)-oriented and random oriented PBZ thin film. High dielectric tunability (${\eta}=75%$, E = 560 kV/cm) and figure-of-merit (FOM ~ 236) at room temperature was obtained in (111)-oriented thin film. Meanwhile, giant electrocaloric effect (ECE) (${\Delta}T=45.3K$ and ${\Delta}S=46.9JK^{-1}kg^{-1}$ at $598kVcm^{-1}$) at room temperature (290 K), rather than at its Curie temperature (408 K), was observed in random oriented $Pb_{0.8}Ba_{0.2}ZrO_3$ (PBZ) thin film, which makes it a promising material for the application to cooling systems near room temperature. The giant ECE as well as high dielectric tunability are attributed to the coexistence of AFE and FE phases and field-induced nano-scaled AFE to FE phase transition.

The Effects of Deposition Temperature on the Growth Behavior of the $BNdT(Bi_{3.25}Nd_{0.75}Ti_{3}O_{12})$ Ferroelectric Thin Films ($BNdT(Bi_{3.25}Nd_{0.75}Ti_{3}O_{12})$ 강유전 박막 성장거동에 미치는 증착온도의 영향)

  • Kwon, Hyun-Yul;Nam, Sung-Pill;Kim, Jung-Hun;Lee, Sung-Gap;Lee, Young-Hie
    • Proceedings of the KIEE Conference
    • /
    • 2005.11a
    • /
    • pp.176-178
    • /
    • 2005
  • Ferroelectric $Bi_{3.25}Nd_{0.75}Ti_{3}O_{12}(BNdT)$ thin films were proposed for capacitor of FeRAM. The BNdT thin films were grown on Pt/Ti $SiO_2/P-Si(100)$ substrates by the RF magnetron sputtering deposition. The dielectric properties of the BNdT were investigated by varying deposition temperatures. Increasing deposition temperature, the (117) peak was increased. An increase of columnar and recrystalline structure of BNdT films with increasing deposition temperature was observed by the Field Emission Scanning Electron Microscopy(FE-SEM). The dielectric constant and dielectric loss of the BNdT thin films with deposition temperature of $600^{\circ}C$ were 319 and 0.05, respectively.

  • PDF

Fabrication of Nd-Substituted Bi4Ti3O12 Thin Films by Metal Organic Chemical Vapor Deposition and Their Ferroelectrical Characterization

  • Kim, Hyoeng-Ki;Kang, Dong-Kyun;Kim, Byong-Ho
    • Journal of the Korean Ceramic Society
    • /
    • v.42 no.4
    • /
    • pp.219-223
    • /
    • 2005
  • A promising capacitor, which has conformable step coverage and good uniformity of thickness and composition, is needed to manufacture high-density non-volatile FeRAM capacitors with a stacked cell structure. In this study, ferroelectric $Bi_{3.61}Nd_{0.39}Ti_3O_{12}$ (BNdT) thin films were prepared on $Pt(111)/TiO_2/SiO_2/Si$ substrates by the liquid delivery system MOCVD method. In these experiments, $Bi(ph)_{3}$, $Nd(TMHD)\_{3}$ and $Ti(O^iPr)_{2}(TMHD)_{2}$ were used as the precursors and were dissolved in n-butyl acetate. The BNdT thin films were deposited at a substrate temperature and reactor pressure of approximately $600^{\circ}C$ and 4.8 Torr, respectively. The microstructure of the layered perovskite phase was observed by XRD and SEM. The remanent polarization value (2Pr) of the BNdT thin film was $31.67\;{\mu}C/cm^{2}$ at an applied voltage of 5 V.

Random-Oriented (Bi,La)4Ti3O12 Thin Film Deposited by Pulsed-DC Sputtering Method on Ferroelectric Random Access Memory Device

  • Lee, Youn-Ki;Ryu, Sung-Lim;Kweon, Soon-Yong;Yeom, Seung-Jin;Kang, Hee-Bok
    • Transactions on Electrical and Electronic Materials
    • /
    • v.12 no.6
    • /
    • pp.258-261
    • /
    • 2011
  • A ferroelectric $(Bi,La)_4Ti_3O_{12}$ (BLT) thin film fabricated by the pulsed-DC sputtering method was evaluated on a cell structure to check its compatibility to high density ferroelectric random access memory (FeRAM) devices. The BLT composition in the sputtering target was $Bi_{4.8}La_{1.0}Ti_{3.0}O_{12}$. Firstly, a BLT film was deposited on a buried Pt/$IrO_x$/Ir bottom electrode stack with W-plug connected to the transistor in a lower place. Then, the film was finally crystallized at $700^{\circ}C$ for 30 seconds in oxygen ambient. The annealed BLT layer was found to have randomly oriented and small ellipsoidal-shaped grains (long direction: ~100 nm, short direction: ~20 nm). The small and uniform-sized grains with random orientations were considered to be suitable for high density FeRAM devices.

Electrochemical Treatment of Dye Wastewater Using Fe, RuO2/Ti, PtO2/Ti, IrO2/Ti and Graphite Electrodes (RuO2/Ti, PtO2/Ti, IrO2/Ti 및 흑연전극을 이용한 염료폐수의 전기화학적 처리)

  • Kim, A Ram;Park, Hyun Jung;Won, Yong Sun;Lee, Tae Yoon;Lee, Jae Keun;Lim, Jun Heok
    • Clean Technology
    • /
    • v.22 no.1
    • /
    • pp.16-28
    • /
    • 2016
  • Textile industry is considered as one of the most polluting sectors in terms of effluent composition and volume of discharge. It is well known that the effluents from textile dying industry contain not only chromatic substances but also large amounts of organic compounds and insolubles. The azo dyes generate huge amount of pollutions among many types of pigments. In general, the electrochemical treatments, separating colors and organic materials by oxidation and reduction on electrode surfaces, are regarded as simpler and faster processes for removal of pollutants compared to other wastewater treatments. In this paper the electrochemical degradation characteristics of dye wastewater containing CI Direct Blue 15 were analyzed. The experiments were performed with various anode materials, such as RuO2/Ti, PtO2/Ti, IrO2/Ti and graphite, with stainless steel for cathode. The optimal anode material was located by changing operating conditions like electrolyte concentration, current density, reaction temperature and initial pH. The degradation efficiency of dye wastewater increased in proportion to the electrolyte concentration and the current density for all anode materials, while the temperature effect was dependent on the kind. The performance orders of anode materials were RuO2/Ti > PtO2/Ti > IrO2/Ti > graphite in acid condition and RuO2/Ti > IrO2/Ti > PtO2/Ti > graphite in neutral and basic conditions. As a result, RuO2/Ti demonstrated the best performance as an anode material for the electrochemical treatment of dye wastewater.

Preparation and Characterization of MFIS Using PT/BFO/$HFO_2$/Si Structures

  • Kim, Kwi-Junga;Jeong, Shin-Woo;Han, Hui-Seong;Han, Dae-Hee;Jeon, Ho-Seung;Im, Jong-Hyun;Park, Byung-Eun
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2009.06a
    • /
    • pp.80-80
    • /
    • 2009
  • Recently, multiferroics have attracted much attention due to their numorous potentials. In this work, we attemped to utilize the multiferroics as an alternative material for ferroelectrics. Ferroelectric materials have been stadied to ferroelectric random access memories, however, some inevitable problems prevent it from inplementation. multiferroics shows a ferroelectricity and has low process temperature $BiFeO_3$(BFO) films have good ferroelectric properties but poor leakage characterization. Thus we tried, in this work, to adopt $HfO_2$ insulating layer for metal-ferroelectric-insulator-semiconductor(MFMIS) structure to surpress to leakage current. $BiFeO_3$(BFO) thin films were fabricared by using a sol-gel method on $HfO_2/Si$ structure. Ferroelectric BFO films on a p-type Si(100)wafer with a $HfO_2$ buffer layer have been fabricated to form a metal-ferroelectric-insulator-semiconductor (MFIS) structure. The $HfO_2$ insulator were deposited by using a sol-gel method. Then, they were carried out a rapid thermal annealing(RTA) furnace at $750\;^{\circ}C$ for 10 min in $N_2$. BFO films on the $HfO_2/Si$ structures were deposited by sol-gel method and they were crystallized rapid thermal annealing in $N_2$ atomsphere at $550\;^{\circ}C$ for 5 min. They were characterized by atomic force microscopy(AFM) and Capacitance-voltage(C-V) curve.

  • PDF