• Title/Summary/Keyword: Fault Redundancy

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A Study on Effective Satellite Selection Method for Multi-Constellation GNSS

  • Taek Geun, Lee;Yu Dam, Lee;Hyung Keun, Lee
    • Journal of Positioning, Navigation, and Timing
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    • v.12 no.1
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    • pp.11-22
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    • 2023
  • In this paper, we propose an efficient satellite selection method for multi-constellation GNSS. The number of visible satellites has increased dramatically recently due to multi-constellation GNSS. By the increased availability, the overall GNSS performance can be improved. Whereas, due to the increase of the number of visible satellites, the computational burden in implementing advanced processing such as integer ambiguity resolution and fault detection can be increased considerably. As widely known, the optimal satellite selection method requires very large computational burden and its real-time implementation is practically impossible. To reduce computational burden, several sub-optimal but efficient satellite selection methods have been proposed recently. However, these methods are prone to the local optimum problem and do not fully utilize the information redundancy between different constellation systems. To solve this problem, the proposed method utilizes the inter-system biases and geometric assignments. As a result, the proposed method can be implemented in real-time, avoids the local optimum problem, and does not exclude any single-satellite constellation. The performance of the proposed method is compared with the optimal method and two popular sub-optimal methods by a simulation and an experiment.

Pattern Testable NAND-type Flash Memory Built-In Self Test (패턴 테스트 가능한 NAND-형 플래시 메모리 내장 자체 테스트)

  • Hwang, Phil-Joo;Kim, Tae-Hwan;Kim, Jin-Wan;Chang, Hoon
    • Journal of the Institute of Electronics and Information Engineers
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    • v.50 no.6
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    • pp.122-130
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    • 2013
  • The demand and the supply are increasing sharply in accordance with the growth of the Memory Semiconductor Industry. The Flash Memory above all is being utilized substantially in the Industry of smart phone, the tablet PC and the System on Chip (SoC). The Flash Memory is divided into the NOR-type Flash Memory and the NAND-type Flash Memory. A lot of study such as the Built-In Self Test (BIST), the Built-In Self Repair (BISR) and the Built-In Redundancy Analysis (BIRA), etc. has been progressed in the NOR-type fash Memory, the study for the Built-In Self Test of the NAND-type Flash Memory has not been progressed. At present, the pattern test of the NAND-type Flash Memory is being carried out using the outside test equipment of high price. The NAND-type Flash Memory is being depended on the outside equipment as there is no Built-In Self Test since the erasure of block unit, the reading and writing of page unit are possible in the NAND-type Flash Memory. The Built-In Self Test equipped with 2 kinds of finite state machine based structure is proposed, so as to carry out the pattern test without the outside pattern test equipment from the NAND-type Flash Memory which carried out the test dependant on the outside pattern test equipment of high price.

MLC NAND-type Flash Memory Built-In Self Test for research (MLC NAND-형 Flash Memory 내장 자체 테스트에 대한 연구)

  • Kim, Jin-Wan;Kim, Tae-Hwan;Chang, Hoon
    • Journal of the Institute of Electronics and Information Engineers
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    • v.51 no.3
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    • pp.61-71
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    • 2014
  • As the occupancy rate of the flash memory increases in the storage media market for the embedded system and the semi-conductor industry grows, the demand and supply of flash memory is increasing by a big margin. They are especially used in large quantity in the smart phones, tablets, PC, SSD and Soc(System on Chip) etc. The flash memory is divided into the NOR type and NAND type according to the cell arrangement structure and the NAND type is divided into the SLC(Single Level Cell) and MLC(Multi Level Cell) according to the number of bits that can be stored in each cell. Many tests have been performed on NOR type such as BIST(Bulit-In Self Test) and BIRA(Bulit-In Redundancy Analysis) etc, but there is little study on the NAND type. For the case of the existing BIST, the test can be proceeded using external equipments like ATE of high price. However, this paper is an attempt for the improvement of credibility and harvest rate of the system by proposing the BIST for the MLC NAND type flash memory of Finite State Machine structure on which the pattern test can be performed without external equipment since the necessary patterns are embedded in the interior and which uses the MLC NAND March(x) algorithm and pattern which had been proposed for the MLC NAND type flash memory.

Cable Functional Failure Temperature Evaluation of Cable Exposed to the Fire of Nuclear Power Plant (원자력발전소 케이블 노출 화재 시 기능상실온도 분석)

  • Lim, Hyuk-Soon;Bae, Yeon-Kyoung;Chi, Moon-Goo
    • Fire Science and Engineering
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    • v.26 no.1
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    • pp.10-15
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    • 2012
  • The fire event occurred in fire proof zone often causes serious electrical problems such as shorts, ground faults, or open circuits in nuclear power plants. These would be directed to the loss of safe shutdown capabilities performed by safety related systems and equipments. The fire event can treat the basic design principle that safety systems should keep their functions with redundancy and independency. In case of a cable fire, operators can not perform their mission properly and can misjudge the situation because of spurious operation, wrong indication or instrument. These would deteriorate the plant capabilities of safety shutdown and make disastrous conditions. In this paper, investigation and cause analysis of cable fire in Nuclear Power Plant, we described the cable fire temperature and functional failure criteria and the cable functional failure temperature evaluation by exposed fire is studied.

A Novel Redundant Data Storage Algorithm Based on Minimum Spanning Tree and Quasi-randomized Matrix

  • Wang, Jun;Yi, Qiong;Chen, Yunfei;Wang, Yue
    • KSII Transactions on Internet and Information Systems (TIIS)
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    • v.12 no.1
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    • pp.227-247
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    • 2018
  • For intermittently connected wireless sensor networks deployed in hash environments, sensor nodes may fail due to internal or external reasons at any time. In the process of data collection and recovery, we need to speed up as much as possible so that all the sensory data can be restored by accessing as few survivors as possible. In this paper a novel redundant data storage algorithm based on minimum spanning tree and quasi-randomized matrix-QRNCDS is proposed. QRNCDS disseminates k source data packets to n sensor nodes in the network (n>k) according to the minimum spanning tree traversal mechanism. Every node stores only one encoded data packet in its storage which is the XOR result of the received source data packets in accordance with the quasi-randomized matrix theory. The algorithm adopts the minimum spanning tree traversal rule to reduce the complexity of the traversal message of the source packets. In order to solve the problem that some source packets cannot be restored if the random matrix is not full column rank, the semi-randomized network coding method is used in QRNCDS. Each source node only needs to store its own source data packet, and the storage nodes choose to receive or not. In the decoding phase, Gaussian Elimination and Belief Propagation are combined to improve the probability and efficiency of data decoding. As a result, part of the source data can be recovered in the case of semi-random matrix without full column rank. The simulation results show that QRNCDS has lower energy consumption, higher data collection efficiency, higher decoding efficiency, smaller data storage redundancy and larger network fault tolerance.

Development of Operational Flight Program for Smart UAV (스마트무인기 비행운용프로그램 개발)

  • Park, Bum-Jin;Kang, Young-Shin;Yoo, Chang-Sun;Cho, Am
    • Journal of the Korean Society for Aeronautical & Space Sciences
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    • v.41 no.10
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    • pp.805-812
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    • 2013
  • The operational flight program(OFP) which has the functions of I/O processing with avionics, flight control logic calculation, fault diagnosis and redundancy mode is embedded in the flight control computer of Smart UAV. The OFP was developed in the environment of PowerPC 755 processor and VxWorks 5.5 real-time operating system. The OFP consists of memory access module, device I/O signal processing module and flight control logic module, and each module was designed to hierarchical structure. Memory access and signal processing modules were verified from bench test, and flight control logic module was verified from hardware-in-the-loop simulation(HILS) test, ground integration test, tethered test and flight test. This paper describes development environment, software structure, verification and management method of the OFP.