• Corrosion Science and Technology
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• v.4 no.5
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• pp.201-206
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• 2005

Starting with the meaning of the word quality, diverse concepts connoted by the term are examined. Instead of a bathtub curve, the desirable shape of a failure rate covering the entire life of a good product, which might be called hockey-stick line, is introduced. From the hockey-stick line and the definition of reliability, two measurements are extracted. The terms r-reliability (failure rate) and durability (product life) are explained. The conceptual analysis of failure mechanics explains that reliability technology pertains to design area. The desirable shape of hazard rate curve of electronic items, hockey-stick line, clarifies that Mean-Time-to-failure (MTTF) as the inverse of failure rate can be regarded a nominal life. And Bx life, different from MTTF, is explained. Reliability relationships between components and set products are explained. Reshaped definitions of r-reliability and durability are recommended. The procedure to improve reliability and the reasons for failing to identify failure mode are clarified in order to search right solutions. And generalized Life-Stress failure model is recommended for the calculation of acceleration factor.

• Journal of Applied Reliability
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• v.17 no.4
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• pp.355-361
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• 2017

Purpose: The purpose of this research is to establish the life test method for ceramic heater and identify the failure mechanisms. Methods: We do accelerated life test in the condition of thermal shock and failure analysis for failed samples. Conclusion: The main failure mechanisms of ceramic heater are identified as overstress failure mechanisms as results of failure analysis and the shape parameters of weibull distribution by accelerated life test are identified as 0.8, 1.2 and 0.4 each at $400^{\circ}C$, $600^{\circ}C$ and $900^{\circ}C$. At $900^{\circ}C$, the shape parameter 0.4 means that It is exactly initial failure caused that the stress exceeds the strength of ceramic heater highly and the shape parameters 0.8, 1.2 at $400^{\circ}C$, $600^{\circ}C$ means that the shape parameters are around 1.0 so that the main failure mechanism is overstress failure which is same result as failure analysis. It means that the appropriate life test method for ceramic heater is reliability qualification test method rather than accelerated life test.

• Journal of Korean Institute of Industrial Engineers
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• v.20 no.1
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• pp.39-51
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• 1994

Almost all accelerated life tests assume that no basic failure mechanism changes within the test stresses. But accelerated life test, considering failure mechanism changes, is needed since failure mechanism changes when accelerating beyond the used stress. This paper studies the analysis when the failure mechanism changes within the test stresses. The piecewise linear regression, which the join point of two lines is estimated, is applied In particular, two accelerated life tests, with and without a change in failure mechanism are examined.

• Transactions of The Korea Fluid Power Systems Society
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• v.3 no.3
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• pp.8-13
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• 2006

It is very important for the manufacturers to predict the life of hydraulic system components according to the results of life tests. Since it takes too much time to test the hydraulic system components until failure, the no-failure test method is applied for the life test of them. If the shape parameter of Weibull distribution, the number of samples, the confidence level, and the assurance life are given, the no-failure test times of hydraulic system components can be calculated by given equation. Here, the procedures to obtain the no-failure test times of the hydraulic system components such as hydraulic motors and pumps, hydraulic cylinders, hydraulic valves, hydraulic accumulators, hydraulic hoses, and hydraulic filters are described briefly.

• Journal of Applied Reliability
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• v.13 no.1
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• pp.65-76
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• 2013

In order to assess the reliability of engine mount for a vehicles, life test model and procedure are developed. By using this method, failure mechanism and life distribution are analyzed. The main results are as follows; i) the main failure mechanism is degradation failure of engine mount rubber by fatigue failure at dynamic load. ii) temperature is a second factor to affect a failure. iii) the life distribution of engine mount module is fitted well to Weibull life distribution and the shape parameter is 18.4 and the accelerated life model of that is fitted well to Arrhenius model.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.12 no.2
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• pp.594-599
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• 2011

In this paper, the effect of the boundary conditions on the reliability and the cumulative distribution characteristics of the fatigue failure life is analyzed in a magnesium alloy AZ31. The boundary conditions are specimen thickness, stress ratio, and maximum fatigue load. The statistical data of the fatigue failure life are obtained by fatigue crack propagation tests under the detail conditions for each boundary condition. The 3-parameter Weibull distribution is used to analyze a statistical characteristics of the fatigue failure life in magnesium alloy AZ31. It is found that the statistical fatigue failure life is long in the case of a thicker specimen, a larger stress ratio, and a smaller maximum fatigue load. Under the opposite cases, the reliability on the fatigue failure life is rapidly dropped.

• Journal of Applied Reliability
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• v.18 no.3
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• pp.220-228
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• 2018

Purpose: The purpose of this study is to investigate the tail behavior of the life distribution which exhibits an increasing failure rate or other positive aging effects after a certain time point. Methods: We characterize the tail behavior of the life distribution with regard to certain reliability measures such as failure rate, mean residual life and reliability function and derive several stochastic properties regarding such life distributions. Also, utilizing an L-statistic and its asymptotic normality, we propose new nonparametric testing procedures which verify if the life distribution has an increasing tail failure rate. Results: We propose the IFR-Tail (Increasing Failure Rate in Tail), DMRL-Tail (Decreasing Mean Residual Life in Tail) and NBU-Tail (New Better than Used in Tail) classes, all of which represent the tail behavior of the life distribution. And we discuss some stochastic properties of these proposed classes. Also, we develop a new nonparametric test procedure for detecting the IFR-Tail class and discuss its relative efficiency to explore the power of the test. Conclusion: The results of our research could be utilized in the study of wide range of applications including the maintenance and warranty policy of the second-hand system.

• Journal of the Korean Society of Safety
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• v.19 no.4 s.68
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• pp.55-59
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• 2004

In this study, the required life cycle cost is evaluated in consideration of the equipment's availability during its lift cycle. In order to meet the maximum availability required by the process, the failure cost and life cycle cost is assessed The optimal equipment selection method is presented according to the analysis of the failure cost and life cycle cost. For the systems in which equipments are connected serially, the optimal equipments are selected by minimizing the life cycle cost and satisfying the required system availability goal. In addition, the selection methods and lift cycle cost are analyzed according to the cost variation of the equipment. By using the life cycle evaluation procedure, the failure cost and maintenance cost needed during the life cycle of the equipment can be presented.

• Journal of Applied Reliability
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• v.5 no.2
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• pp.221-239
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• 2005

General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide used electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mode caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.

• Proceedings of the Korean Reliability Society Conference
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• 2005.06a
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• pp.51-67
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• 2005

General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide sed electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mope caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.